Abstract: In a method of controlling a logical simulation of a logic circuit comprising a plurality of logic elements which can be simulated by forming a shift register string, the logical simulation is carried out without serial shift operation of the shift register string on setting shift-in signals into the shift register string and/or on extracting internal states from the shift register string. Setting of the shift-in signals and extraction of the internal states are possible by monitoring a simulation table which has a plurality of addresses for the logic elements.

Abstract: An electronic device, such as an LSI, comprising a logic circuit and an electronic circuit that comprises, in turn, a large-capacity memory circuit and/or at least one oscillator is provided with a holding circuit between the logic and the electronic circuits and between the electronic circuit and a device output terminal. The holding circuit merely delivers output signals of the logic circuit to the electronic circuit and feeds back output signals of the electronic circuit to the logic circuit in normal operation of the device. During test of the logic and the electronic circuits, the holding circuit selects and holds a test signal of a preselected time-sequential pattern and is switched to select the logic circuit output signals, which are produced by the device with a prescribed combination of logic levels when the device has no defects. Similarly, a holding circuit output signal is given a predetermined time-sequential pattern.