Patents by Inventor Shigehiro Kamimura

Shigehiro Kamimura has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • IC tester and IC test method
    Patent number: 6445207
    Abstract: A control processor 1 stores a power supply current acquisition start address in a storage circuit 21 and a power supply current acquisition end address in a storage circuit 22. When a pattern generation address signal input from a pattern generator 2 matches the power supply current acquisition start address, a match detection circuit 23, 24 sets a flip-flop 6; when the pattern generation address signal matches the power supply current acquisition end address, the match detection circuit 23, 24 resets the flip-flop 6. An AND gate 7 outputs a clock signal to an AD converter 8 only while the flip-flop is set, and the AD converter 8 converts a current signal into a digital signal and outputs the digital signal to a storage circuit 9.
    Type: Grant
    Filed: November 16, 2000
    Date of Patent: September 3, 2002
    Assignee: Ando Electric Co., Ltd.
    Inventor: Shigehiro Kamimura