Patents by Inventor Shigekazu Isosaka

Shigekazu Isosaka has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method of inspecting semiconductor non-volatile memory devices
    Patent number: 4607219
    Abstract: Memorized data retention characteristics of a FAMOS transistor is tested by writing predetermined information into a semiconductor element while it is in a state of a wafer and the information is read out after the element has been mounted in a package. The written information and the read out information are checked to determine whether they coincide with each other or not.
    Type: Grant
    Filed: September 9, 1983
    Date of Patent: August 19, 1986
    Assignee: NEC Corporation
    Inventor: Shigekazu Isosaka