Patents by Inventor Shigekazu Takada

Shigekazu Takada has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Ophthalmic apparatus
    Patent number: 7771050
    Abstract: To provide an ophthalmic apparatus capable of performing efficient measurement of a plurality of eye characteristics of an examinee's eye, which comprises a first measurement unit comprising a first measurement system for performing measurement of a first characteristic of the eye, a second measurement unit comprising a second measurement system for performing measurement of a second characteristic of the eye, a measurement unit in which the measurement units are placed such that heights of first and second measurement axes of the respective systems are different from each other, a movement mechanism unit moving the measurement unit in a vertical direction, and a control unit controlling the mechanism unit such that the height of the first measurement axis at the time of first measurement by the first measurement unit becomes almost the same as that of the second measurement axis at the time of second measurement by the second measurement unit.
    Type: Grant
    Filed: April 2, 2007
    Date of Patent: August 10, 2010
    Assignee: Nidek Co., Ltd.
    Inventors: Naoto Honda, Shigekazu Takada, Kazuhiro Yoshimura, Naoki Isogai, Akihiro Hayashi
  • Ophthalmic Apparatus
    Publication number: 20090128778
    Abstract: To provide an ophthalmic apparatus capable of performing efficient measurement of a plurality of eye characteristics of an examinee's eye, which comprises a first measurement unit comprising a first measurement system for performing measurement of a first characteristic of the eye, a second measurement unit comprising a second measurement system for performing measurement of a second characteristic of the eye, a measurement unit in which the measurement units are placed such that heights of first and second measurement axes of the respective systems are different from each other, a movement mechanism unit moving the measurement unit in a vertical direction, and a control unit controlling the mechanism unit such that the height of the first measurement axis at the time of first measurement by the first measurement unit becomes almost the same as that of the second measurement axis at the time of second measurement by the second measurement unit.
    Type: Application
    Filed: April 2, 2007
    Publication date: May 21, 2009
    Applicant: NIDEK CO., LTD.
    Inventors: Naoto Honda, Shigekazu Takada, Kozuhiro Yoshimura, Naoki Isogai, Akihiro Hayashi