Abstract: A heat processing apparatus includes a heating plate configured to heat the substrate; a cover configured to surround a space above the heating plate; an exhaust gas flow forming mechanism configured to exhaust gas inside the cover to form exhaust gas flows within the space above the heating plate; a downflow forming mechanism configured to form downflows uniformly supplied onto an upper surface of the substrate placed on the heating plate; and a control mechanism configured to execute mode switching control between a mode arranged to heat the substrate while forming the downflows by the downflow forming mechanism and a mode arranged to heat the substrate while forming the exhaust gas flows by the exhaust gas flow forming mechanism.

Abstract: A heat processing apparatus includes a heating plate configured to heat the substrate; a cover configured to surround a space above the heating plate; an exhaust gas flow forming mechanism configured to exhaust gas inside the cover to form exhaust gas flows within the space above the heating plate; a downflow forming mechanism configured to form downflows uniformly supplied onto an upper surface of the substrate placed on the heating plate; and a control mechanism configured to execute mode switching control between a mode arranged to heat the substrate while forming the downflows by the downflow forming mechanism and a mode arranged to heat the substrate while forming the exhaust gas flows by the exhaust gas flow forming mechanism.

Abstract: A heat processing apparatus includes a heating plate configured to heat the substrate; a cover configured to surround a space above the heating plate; an exhaust gas flow forming mechanism configured to exhaust gas inside the cover to form exhaust gas flows within the space above the heating plate; a downflow forming mechanism configured to form downflows uniformly supplied onto an upper surface of the substrate placed on the heating plate; and a control mechanism configured to execute mode switching control between a mode arranged to heat the substrate while forming the downflows by the downflow forming mechanism and a mode arranged to heat the substrate while forming the exhaust gas flows by the exhaust gas flow forming mechanism.

Abstract: A gas sensor extending along an axial direction, the gas sensor including: a housing having a through hole, the through hole including an expanding portion at a leading end thereof; a gas sensing element inserted into the housing, having a closed leading end, and provided with a sensor electrode on an outer surface of the leading end side thereof; a heater inserted into the gas sensor, and including a contact portion where the heater contacts an inner surface; an protector fixed on the leading end side of the housing and having an outer protector including an outer air hole and an inner protector being positioned within the outer protector and spaced apart from the outer protector in the radial direction; and an inner air vent provided between the inner protector and the leading end of the housing.

Abstract: A thermal processing apparatus for thermally processing a substrate in a processing chamber includes a heating plate for mounting and thermally processing the substrate thereon, and a lid body covering the heating plate from above to constitute a portion of the processing chamber. The lid body has a ceiling plate and a peripheral side portion vertically provided at a peripheral end portion of the ceiling plate. The ceiling plate is provided with a supply port for supplying a gas into the processing chamber, and a side portion of the ceiling plate is provided with a plurality of exhaust ports for exhausting the gas in the processing chamber. An exhaust pipe communicating with the exhaust ports and having an outlet at a point at equal distances from the exhaust ports is provided to be attachable and detachable to/from the lid body.

Abstract: For the purpose of preventing a situation in which the fiber density looks as if it suddenly decreases in a specific view direction, a method comprises: specifying a region of interest R1 in MR image data collected by a diffusion tensor method; defining regular grid points in the region of interest R1; defining points obtained by randomly moving the grid points as tracking start points S1, S2, . . . ; performing diffusion tensor analysis on each tracking start point S1, S2, . . . in the image data to determine a direction of a principal axis vector; tracking a fiber by repeatedly selecting a neighbor point along the direction of the principal axis vector and performing diffusion tensor analysis on the neighbor point to determine the direction of the principal axis vector; and producing and displaying an image of the tracked fibers as viewed in a desired view direction.

Abstract: A heat processing apparatus includes a heating plate configured to heat the substrate; a cover configured to surround a space above the heating plate; an exhaust gas flow forming mechanism configured to exhaust gas inside the cover to form exhaust gas flows within the space above the heating plate; a downflow forming mechanism configured to form downflows uniformly supplied onto an upper surface of the substrate placed on the heating plate; and a control mechanism configured to execute mode switching control between a mode arranged to heat the substrate while forming the downflows by the downflow forming mechanism and a mode arranged to heat the substrate while forming the exhaust gas flows by the exhaust gas flow forming mechanism.

Abstract: A thermal processing apparatus for thermally processing a substrate in a processing chamber includes a heating plate for mounting and thermally processing the substrate thereon, and a lid body covering the heating plate from above to constitute a portion of the processing chamber. The lid body has a ceiling plate and a peripheral side portion vertically provided at a peripheral end portion of the ceiling plate. The ceiling plate is provided with a supply port for supplying a gas into the processing chamber, and a side portion of the ceiling plate is provided with a plurality of exhaust ports for exhausting the gas in the processing chamber. An exhaust pipe communicating with the exhaust ports and having an outlet at a point at equal distances from the exhaust ports is provided to be attachable and detachable to/from the lid body.

Abstract: A display unit of which inspection process to inspect a connector for faulty connection can be automated. The display unit comprises a display section, a display driver IC among a plurality of types of display driver ICs capable of driving and controlling the display section, and an MPU sending a command and display data to the display driver IC. The display driver IC comprises an ID setting circuit and a command decoder decoding the command from the MPU. The MPU reads an ID information so as to control the display driver IC among a plurality of types of display driver ICs according to the corresponding control contents in the storage section among the plurality of types of control contents for a plurality of types of display driver ICs.

Abstract: For the purpose of preventing a situation in which the fiber density looks as if it suddenly decreases in a specific view direction, a method comprises: specifying a region of interest R1 in MR image data collected by a diffusion tensor method; defining regular grid points in the region of interest R1; defining points obtained by randomly moving the grid points as tracking start points S1, S2, . . . ; performing diffusion tensor analysis on each tracking start point S1, S2, . . . in the image data to determine a direction of a principal axis vector; tracking a fiber by repeatedly selecting a neighbor point along the direction of the principal axis vector and performing diffusion tensor analysis on the neighbor point to determine the direction of the principal axis vector; and producing and displaying an image of the tracked fibers as viewed in a desired view direction.

Abstract: A piezoelectric drive body is secured to a shaft that is rotatably supported by a holder. A leaf spring is fastened to the upper end of the holder and is in resilient contact with the upper end of the shaft. Friction between the shaft and the leaf sprig acts as a rotation-suppressing force on the shaft. When a sawtooth-waveform voltage is applied to the drive body, the drive body vibrates to the right and left. The drive body rotates around the shaft in a specific direction, due to the difference in inertial force resulting from the difference in the deforming speed of the body. The voltage linearly rises and falls repeatedly or has a sinusoidal waveform. In either case, the voltage rises from a minimum to a maximum for time T1 and falls from the maximum to the minimum for time T2 that is different from time T1.

Abstract: A semiconductor device is equipped with a silicon substrate 3, a segment signal output section 4 formed along a central portion of one edge in a longitudinal direction of the silicon substrate 3, common signal output sections 5-6 formed along portions on both sides of the central portion, divided power supply sections 7-8 formed opposite to the common signal output sections 5-6 along the other edge in the longitudinal direction of the silicon substrate 3, RAMs 9-10 formed between the power supply sections 7-8, and a control section 11.

Abstract: A display unit of which inspection process to inspect a connector for faulty connection can be automated. The display unit comprises a display section, a display driver IC among a plurality of types of display driver ICs capable of driving and controlling the display section, and an MPU sending a command and display data to the display driver IC. The display driver IC comprises an ID setting circuit and a command decoder decoding the command from the MPU. The MPU reads an ID information so as to control the display driver IC among a plurality of types of display driver ICs according to the corresponding control contents in the storage section among the plurality of types of control contents for a plurality of types of display driver ICs.

Abstract: A semiconductor device is equipped with segment signal output terminals S1-S160 that output segment signals, common signal output terminals C1-C160 that output common signals, dummy terminals NC1-NC160, input terminals P1-P160, bi-directional shift registers 5-6 that operate to output common output signals from the common signal output terminals C1-C160, a shift direction signal output circuit 7 that controls the shift registers 5-6, a common direction scanning signal input control circuit 8, and a shift register connection control circuit 9.

Abstract: A display unit of which inspection process to inspect a connector for faulty connection can be automated. The display unit comprises a liquid crystal display section, a display driver IC driving the liquid crystal display section, a first board on which the display driver IC is mounted, an MPU sending a command and other information to the display driver IC, a second board on which the MPU is mounted, and a connector electrically connecting the first and second boards to each other. The MPU has a means for sending a test command in the test modes and reading the inspection result signal output from the display driver IC thereafter. The display driver IC comprises an interface circuit outputting and inputting a signal to and from the MPU, a command decoder decoding the test command input from the MPU via the interface circuit, and an inspection circuit outputting the inspection result signal in accordance with the signal from the command decoder.

Abstract: A drive body 1, which is a piezoelectric element of bimorph type, is secured to a shaft 2. The shaft 2 is rotatably supported by a holder 12. A leaf spring 13 is fastened to the upper end of the holder 12. The leaf spring 13 is set in resilient contact with the upper end of the shaft 2. The friction between the shaft 2 and the leaf spring 13 acts as a rotation-suppressing force on the shaft 2. A sawtooth-waveform voltage is applied to the drive body 1 through a wire extending through the shaft 2 that has a hollow. When applied with the sawtooth-waveform voltage, the drive body 1 vibrates to the right and the left. The drive body 1 rotates around the shaft 2 in a specific direction, due to the difference in inertial force resulting from the difference in the deforming speed of the body 1. The voltage applied to the drive body 1 may linearly rises and falls repeatedly or may have a sinusoidal waveform.

Abstract: A semiconductor device is equipped with segment signal output terminals S1-S160 that output segment signals, common signal output terminals C1-C160 that output common signals, dummy terminals NC1-NC160, input terminals P1-P160, bi-directional shift registers 5-6 that operate to output common output signals from the common signal output terminals C1-C160, a shift direction signal output circuit 7 that controls the shift registers 5-6, a common direction scanning signal input control circuit 8, and a shift register connection control circuit 9.

Abstract: A semiconductor device is equipped with a silicon substrate 3, a segment signal output section 4 formed along a central portion of one edge in a longitudinal direction of the silicon substrate 3, common signal output sections 5-6 formed along portions on both sides of the central portion, divided power supply sections 7-8 formed opposite to the common signal output sections 5-6 along the other edge in the longitudinal direction of the silicon substrate 3, RAMs 9-10 formed between the power supply sections 7-8, and a control section 11.

Abstract: A semiconductor integrated circuit has a reset signal generation circuit (10) that generates a reset signal (12) having a reset period based on a power-on reset signal (11), and a latch circuit (20) having an initialization circuit (23) that initializes a latch output (21) based on the reset signal (12). The reset signal generation circuit (10) has a delay circuit (14) that can variably set a pulse width corresponding to the reset period of the reset signal (12). An output line of the delay circuit (14) is connected to a first pad terminal (32). An output line of the initialization circuit (23) is connected to a second pad terminal (34). When the semiconductor integrated circuit is verified, the first and second pad terminals (32, 34) are brought in contact with a probe (40).

Abstract: A display unit of which inspection process to inspect a connector for faulty connection can be automated. The display unit comprises a display section, a display driver IC among a plurality of types of display driver ICs capable of driving and controlling the display section, and an MPU sending a command and display data to the display driver IC. The display driver IC comprises an ID setting circuit and a command decoder decoding the command from the MPU. The MPU reads an ID information so as to control the display driver IC among a plurality of types of display driver ICs according to the corresponding control contents in the storage section among the plurality of types of control contents for a plurality of types of display driver ICs.