Patents by Inventor Shigeki MAKISE

Shigeki MAKISE has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Probe card and contact inspection device
    Patent number: 10775411
    Abstract: A probe card includes a probe having a spring property and a probe head that holds the probe. The probe head includes a guide portion that holds the probe such that the probe can move in an axis direction Z. The guide portion includes a heat radiation structure that absorbs heat of the probe generated by energization and emits the heat to the outside of the probe.
    Type: Grant
    Filed: October 13, 2016
    Date of Patent: September 15, 2020
    Assignee: Kabushiki Kaisha Nihon Micronics
    Inventors: Tetsuya Yoshioka, Takashi Kawano, Shigeki Makise, Mika Nasu
  • PROBE CARD AND CONTACT INSPECTION DEVICE
    Publication number: 20180299489
    Abstract: A probe card includes a probe having a spring property and a probe head that holds the probe. The probe head includes a guide portion that holds the probe such that the probe can move in an axis direction Z. The guide portion includes a heat radiation structure that absorbs heat of the probe generated by energization and emits the heat to the outside of the probe.
    Type: Application
    Filed: October 13, 2016
    Publication date: October 18, 2018
    Applicant: Kabushiki Kaisha Nihon Micronics
    Inventors: Tetsuya YOSHIOKA, Takashi KAWANO, Shigeki MAKISE, Mika NASU