Abstract: OBJECT To make an object to be observed observable with high resolution and to make an inclination angle of a surface of the object to be observed recognizable over a wide range. SOLUTION An image observation system 100 provided with a lighting optical system 116 irradiating an object to be observed W with an illumination light and an observation optical system 122 collecting object light from the object to be observed W to guide to a detector 126, the image observation system 100 comprising an objective lens 122A opposed to the object to be observed W, a beam splitter 116B disposed on an opposite side to the object to be observed W with respect to the objective lens 122A, and a relay image RI of the illumination light splitting member 114 for dividing wavelength regions R, G and B of the illumination light into a plurality of different solid angle regions IS1, IS2 and IS3, being disposed in front of the objective lens 122A.

Abstract: To make an object to be observed observable with high resolution and to make an inclination angle of a surface of the object to be observed recognizable over a wide range. An image observation system 100 provided with a lighting optical system 116 irradiating an object to be observed W with an illumination light and an observation optical system 122 collecting object light from the object to be observed W to guide to a detector 126, the image observation system 100 comprising an objective lens 122A opposed to the object to be observed W, a beam splitter 116B disposed on an opposite side to the object to be observed W with respect to the objective lens 122A, and a relay image RI of the illumination light splitting member 114 for dividing wavelength regions R, G and B of the illumination light into a plurality of different solid angle regions IS1, IS2 and IS3, being disposed in front of the objective lens 122A.

Abstract: [Problem] When the inclination of an object surface reaches or exceeds a certain level, direct light consisting of a specularly reflected light component leaves the range of the solid observation angle formed by the observation optical system, and it becomes difficult to continuously and quantitatively obtain the surface shape of the object surface.

Abstract: An illumination device has a light source unit, a lens unit, and a filter unit An imaging device receives object light, generated by the illumination light, from the measurement object at a predetermined observation solid angle, and pixels of the imaging device can each identify the different light wavelength ranges. A processing device includes an arithmetic unit configured to obtain a normal vector at each point of the measurement object corresponding to each pixel from inclusion relation between the plurality of solid angle regions, constituting the object light, and the predetermined observation solid angle, and a shape reconstruction unit configured to reconstruct the shape of the measurement object.

Abstract: [Problem] When the inclination of an object surface reaches or exceeds a certain level, direct light consisting of a specularly reflected light component leaves the range of the solid observation angle formed by the observation optical system, and it becomes difficult to continuously and quantitatively obtain the surface shape of the object surface.

Abstract: Provided is an inspection lighting device with which, even when changes in light that occur at respective feature points on an object to be inspected are small, the amounts of those changes in light can be determined across the entire field-of-view range, and the feature points can be detected under exactly the same conditions.

Abstract: Provided is an inspection lighting device with which, even when changes in light that occur at respective feature points on an object to be inspected are small, the amounts of those changes in light can be determined across the entire field-of-view range, and the feature points can be detected under exactly the same conditions. The inspection lighting device 100 includes a surface light source 1 and a lens 2 that is disposed between the surface light source 1 and an inspection object W, the lens 2 being disposed nearer to the inspection object W such that at least one of a shielding mask M1 and a filtering means F1 is located centered around a focus position of the lens. An irradiation solid angle of light emitted from the surface light source 1 and irradiated onto the inspection object W by the lens 2 is configured to have solid angle regions that have specific optical attributes and that are radially arranged around an optical axis of the irradiation solid angle.

Abstract: Provided is an inspection lighting device with which, even when changes in light that occur at respective feature points on an object to be inspected are small, the amounts of those changes in light can be determined across the entire field-of-view range, and the feature points can be detected under exactly the same conditions. An inspection lighting device 100 includes a surface light source 1 and a lens 2 that is disposed between the surface light source 1 and an inspection object W, the lens 2 being disposed nearer to the inspection object W such that at least one of a shielding mask M1 and a filtering means F1 is located centered around a focal distance position of the lens. An irradiation solid angle of light emitted from the surface light source 1 and irradiated onto the inspection object W by the lens 2 is configured to have solid angle regions as desired, the solid angle regions having specific optical attributes.

Abstract: Provided is an inspection lighting device with which, even when changes in light that occur at respective feature points on an object to be inspected are small, the amounts of those changes in light can be determined across the entire field-of-view range, and the feature points can be detected under exactly the same conditions. An inspection lighting device 100 includes a surface light source 1 and a lens 2 that is disposed between the surface light source 1 and an inspection object W, the lens 2 being disposed nearer to the inspection object W such that at least one of a shielding mask M1 and a filtering means F1 is located centered around a focal distance position of the lens. An irradiation solid angle of light emitted from the surface light source 1 and irradiated onto the inspection object W by the lens 2 is configured to have solid angle regions as desired, the solid angle regions having specific optical attributes.

Abstract: In the inspection lighting device, between a surface light source for emitting an inspection light and the inspection object, at least one shielding mask is disposed, and a lens is disposed on a side closer to the inspection object than the shielding mask such that the shielding mask is positioned across the focus position of this lens as a center. In an irradiation solid angle of the inspection light for the inspection object formed when the light emitted from the surface light source is irradiated on to the inspection object by the lens the shielding mask forms a dark area. So that, in accordance with a change in reflection, transmission, scattering occurring at a feature point on the inspection object, a shape, a size, a tilt of the irradiation solid angle of the inspection light can be changed.

Abstract: In order to provide an inspection illumination device that makes it possible to greatly change a light amount within an observation solid angle of an imaging device even in a case where a change in reflection or scattering taking place at a feature point is subtle, and thus detect such a minute feature point, the inspection illumination device includes: a surface light source that emits inspection light; a lens that is arranged between the surface light source and an inspection object, and provides an image of the surface light source near the inspection object; and a first light shielding mask that is arranged between the surface light source and the inspection object, and forms a dark domain within an illumination solid angle of the inspection light applied to each point on the inspection object.

Abstract: In the inspection lighting device, between a surface light source for emitting an inspection light and the inspection object, at least one shielding mask is disposed, and a lens is disposed on a side closer to the inspection object than the shielding mask such that the shielding mask is positioned across the focus position of this lens as a center. In an irradiation solid angle of the inspection light for the inspection object formed when the light emitted from the surface light source is irradiated on to the inspection object by the lens the shielding mask forms a dark area. So that, in accordance with a change in reflection, transmission, scattering occurring at a feature point on the inspection object, a shape, a size, a tilt of the irradiation solid angle of the inspection light can be changed.

Abstract: In order to make it possible for a difference between a defect and a normal part, such as contrast, to appear, a lighting device for inspection is provided with: a surface light source that emits inspection light; a lens that is provided on a light axis of the inspection light emitted from the surface light source, and between an inspection object and the surface light source; and a first diaphragm that is provided between the lens and the surface light source or the inspection object, wherein: the surface light source and the lens are set such that an image plane on which the surface light source is imaged is present near the inspection object; and the first diaphragm is set such that the central axis of an irradiation solid angle determined by a part of the inspection light is parallel to the light axis.

Abstract: In order to provide an inspection illumination device that makes it possible to greatly change a light amount within an observation solid angle of an imaging device even in a case where a change in reflection or scattering taking place at a feature point is subtle, and thus detect such a minute feature point, the inspection illumination device includes: a surface light source that emits inspection light; a lens that is arranged between the surface light source and an inspection object, and provides an image of the surface light source near the inspection object; and a first light shielding mask that is arranged between the surface light source and the inspection object, and forms a dark domain within an illumination solid angle of the inspection light applied to each point on the inspection object.

Abstract: In order to make it possible for a difference between a defect and a normal part, such as contrast, to appear, a lighting device for inspection is provided with: a surface light source that emits inspection light; a lens that is provided on a light axis of the inspection light emitted from the surface light source, and between an inspection object and the surface light source; and a first diaphragm that is provided between the lens and the surface light source or the inspection object, wherein: the surface light source and the lens are set such that an image plane on which the surface light source is imaged is present near the inspection object; and the first diaphragm is set such that the central axis of an irradiation solid angle determined by a part of the inspection light is parallel to the light axis.

Abstract: In order to commonly perform image processing at an image processing device, even if inspection contents or valid inspection regions are changed for every image or if an illumination/image-pickup system for surface inspection per se is changed, a data structure for image processing is constructed in a manner that valid image-pickup region data indicative of a valid image-pickup region that is valid for inspection in the captured image, and image processing specifying data for specifying contents of the image processing performed on the valid image-pickup region are associated with the captured image data indicative of the image captured by the image-pickup device.

Abstract: Herein disclosed is a microcomputer MCU adopting the general purpose register method. The microcomputer is enabled to have a small program capacity or a high program memory using efficiency and a low system cost, while enjoying the advantage of simplification of the instruction decoding as in the RISC machine having a fixed length instruction format of the prior art, by adopting a fixed length instruction format having a power of 2 but a smaller bit number than that of the maximum data word length fed to instruction execution means. And, the control of the coded division is executed by noting the code bits.

Abstract: An LED that can effectively prevent heat accumulation while preventing short-circuiting, discharge, fire and the like, even in the case where LEDs are relatively densely placed, is provided. In a can type LED 3 where an anode A, a cathode K and an LED pedestal 31p are provided within a housing 31, and pins a1 and k1 of anode A and cathode K lead out at least to the outside of housing 31 so that a voltage can be applied between anode A and cathode K via these pins a1 and k1, a condition of isolation is maintained between pin a1 of anode A and housing 31, as well as between pin k1 of cathode K and housing 31, and pin r1 which is thermally connected to LED pedestal 31p is provided outside of housing 31.

Abstract: Herein disclosed is a microcomputer MCU adopting the general purpose register method. The microcomputer is enabled to have a small program capacity or a high program memory using efficiency and a low system cost, while enjoying the advantage of simplification of the instruction decoding as in the RISC machine having a fixed length instruction format of the prior art, by adopting a fixed length instruction format having a power of 2 but a smaller bit number than that of the maximum data word length fed to instruction execution means. And, the control of the coded division is executed by noting the code bits.

Abstract: An LED that can effectively prevent heat accumulation while preventing short-circuiting, discharge, fire and the like, even in the case where LEDs are relatively densely placed, is provided. In a can type LED 3 where an anode A, a cathode K and an LED pedestal 31p are provided within a housing 31, and pins a1 and k1 of anode A and cathode K lead out at least to the outside of housing 31 so that a voltage can be applied between anode A and cathode K via these pins a1 and k1, a condition of isolation is maintained between pin a1 of anode A and housing 31, as well as between pin k1 of cathode K and housing 31, and pin r1 which is thermally connected to LED pedestal 31p is provided outside of housing 31.