Abstract: A semiconductor integrated circuit has a sampling circuit which samples a potential of an input terminal, a dynamic comparator having a standby and a comparison mode which compares the potential of the input terminal and a reference potential, a switch for input signals connected between the input terminal and the dynamic comparator, a capacitor for comparator having one end connected between the switch for input signals and the dynamic comparator and another end connected to a fixed potential, and a timing control circuit which controls a timing to sample by sampling circuit, a timing to switch modes of dynamic comparator, and a timing to make switch for input signals conducting or blocking state. The timing control circuit makes the switch for input signals blocking state from conducting state before the dynamic comparator switches from standby mode to comparison mode, and terminates sampling by sampling circuit after switching modes.

Abstract: A semiconductor integrated circuit has a sampling circuit which samples a potential of an input terminal, a dynamic comparator having a standby and a comparison mode which compares the potential of the input terminal and a reference potential, a switch for input signals connected between the input terminal and the dynamic comparator, a capacitor for comparator having one end connected between the switch for input signals and the dynamic comparator and another end connected to a fixed potential, and a timing control circuit which controls a timing to sample by sampling circuit, a timing to switch modes of dynamic comparator, and a timing to make switch for input signals conducting or blocking state. The timing control circuit makes the switch for input signals blocking state from conducting state before the dynamic comparator switches from standby mode to comparison mode, and terminates sampling by sampling circuit after switching modes.