Patents by Inventor Shigemi Fukuda

Shigemi Fukuda has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7599052
    Abstract: A defect marking device includes a flaw inspection device which has a plurality of light-receiving parts that identify reflected lights coming from an inspection plane of a metal strip under two or more of optical conditions different from each other; a signal processing section that judges the presence/absence of surface flaw on the inspection plane based on a combination of reflected light components identified under these optical conditions different from each other; and a marking device which applies marking that indicates information relating to the flaw on the surface of the metal strip.
    Type: Grant
    Filed: August 13, 2008
    Date of Patent: October 6, 2009
    Assignee: NKK Corporation
    Inventors: Mitsuaki Uesugi, Shoji Yoshikawa, Masaichi Inomata, Tsutomu Kawamura, Takahiko Oshige, Hiroyuki Sugiura, Akira Kazama, Tsuneo Suyama, Yasuo Kushida, Shuichi Harada, Hajime Tanaka, Osamu Uehara, Shuji Kaneto, Masahiro Iwabuchi, Kozo Harada, Shinichi Tomonaga, Shigemi Fukuda
  • Publication number: 20090086209
    Abstract: A defect marking device includes a flaw inspection device which has a plurality of light-receiving parts that identify reflected lights coming from an inspection plane of a metal strip under two or more of optical conditions different from each other; a signal processing section that judges the presence/absence of surface flaw on the inspection plane based on a combination of reflected light components identified under these optical conditions different from each other; and a marking device which applies marking that indicates information relating to the flaw on the surface of the metal strip.
    Type: Application
    Filed: August 13, 2008
    Publication date: April 2, 2009
    Applicant: NKK Corporation
    Inventors: Mitsuaki Uesugi, Shoji Yoshikawa, Masaichi Inomata, Tsutomu Kawamura, Takahiko Oshige, Hiroyuki Sugiura, Akira Kazama, Tsuneo Suyama, Yasuo Kushida, Shuichi Harada, Hajime Tanaka, Osamu Uehara, Shuji Kaneto, Masahiro Iwabuchi, Kozo Harada, Shinichi Tomonaga, Shigemi Fukuda
  • Patent number: 7423744
    Abstract: A defect marking device includes a flaw inspection device which has a plurality of light-receiving parts that identify reflected lights coming from an inspection plane of a metal strip under two or more of optical conditions different from each other; a signal processing section that judges the presence/absence of surface flaw on the inspection plane based on a combination of reflected light components identified under these optical conditions different from each other; and a marking device which applies marking that indicates information relating to the flaw on the surface of the metal strip.
    Type: Grant
    Filed: October 24, 2006
    Date of Patent: September 9, 2008
    Assignee: NKK Corporation
    Inventors: Mitsuaki Uesugi, Shoji Yoshikawa, Masaichi Inomata, Tsutomu Kawamura, Takahiko Oshige, Hiroyuki Sugiura, Akira Kazama, Tsuneo Suyama, Yasuo Kushida, Shuichi Harada, Hajime Tanaka, Osamu Uehara, Shuji Kaneto, Masahiro Iwabuchi, Kozo Harada, Shinichi Tomonaga, Shigemi Fukuda
  • Patent number: 7248366
    Abstract: The defect marking method comprises the steps of: installing a surface defect tester to detect surface flaw and a marker device to apply marking at defect position, in a continuous processing line of steel sheet; detecting the surface flaw on the steel sheet using the surface defect tester; determining defect name, defect grade, defect length, and defect position in the width direction of the steel sheet, on the basis of thus detected flaw information, further identifying the defect in terms of harmful defect, injudgicable defect, and harmless defect; applying tracking of the defect position for each of the harmful defect and the injudgicable defect; and applying marking to the defect position. The defect marking device comprises a defect inspection means having plurality of light-receiving parts and a signal processing section, and a marking means.
    Type: Grant
    Filed: September 17, 2001
    Date of Patent: July 24, 2007
    Assignee: NKK Corporation
    Inventors: Mitsuaki Uesugi, Shoji Yoshikawa, Masaichi Inomata, Tsutomu Kawamura, Takahiko Oshige, Hiroyuki Sugiura, Akira Kazama, Tsuneo Suyama, Yasuo Kushida, Shuichi Harada, Hajime Tanaka, Osamu Uehara, Shuji Kaneto, Masahiro Iwabuchi, Kozo Harada, Shinichi Tomonaga, Shigemi Fukuda
  • Publication number: 20070052964
    Abstract: A defect marking device includes a flaw inspection device which has a plurality of light-receiving parts that identify reflected lights coming from an inspection plane of a metal strip under two or more of optical conditions different from each other; a signal processing section that judges the presence/absence of surface flaw on the inspection plane based on a combination of reflected light components identified under these optical conditions different from each other; and a marking device which applies marking that indicates information relating to the flaw on the surface of the metal strip.
    Type: Application
    Filed: October 24, 2006
    Publication date: March 8, 2007
    Applicant: NKK Corporation
    Inventors: Mitsuaki Uesugi, Shoji Yoshikawa, Masaichi Inomata, Tsutomu Kawamura, Takahiko Oshige, Hiroyuki Sugiura, Akira Kazama, Tsuneo Suyama, Yasuo Kushida, Shuichi Harada, Hajime Tanaka, Osamu Uehara, Shuji Kaneto, Masahiro Iwabuchi, Kozo Harada, Shinichi Tomonaga, Shigemi Fukuda
  • Publication number: 20020154308
    Abstract: The defect marking method comprises the steps of: installing a surface defect tester to detect surface flaw and a marker device to apply marking at defect position, in a continuous processing line of steel sheet; detecting the surface flaw on the steel sheet using the surface defect tester; determining defect name, defect grade, defect length, and defect position in the width direction of the steel sheet, on the basis of thus detected flaw information, further identifying the defect in terms of harmful defect, injudgicable defect, and harmless defect; applying tracking of the defect position for each of the harmful defect and the injudgicable defect; and applying marking to the defect position. The defect marking device comprises a defect inspection means having plurality of light-receiving parts and a signal processing section, and a marking means.
    Type: Application
    Filed: September 17, 2001
    Publication date: October 24, 2002
    Applicant: NKK Corporation, a Japanese Corporation
    Inventors: Mitsuaki Uesugi, Shoji Yoshikawa, Masaichi Inomata, Tsutomu Kawamura, Takahiko Oshige, Hiroyuki Sugiura, Akira Kazama, Tsuneo Suyama, Yasuo Kushida, Shuichi Harada, Hajime Tanaka, Osamu Uehara, Shuji Kaneto, Masahiro Iwabuchi, Kozo Harada, Shinichi Tomonaga, Shigemi Fukuda