Abstract: A nondestructive inspection system 1 is provided with: a neutron radiation unit 10 capable of radiating a first neutron dose of neutrons; a neutron detection unit 20 capable of detecting a second neutron dose of neutrons scattered inside an inspection object A upon radiation of neutrons from the neutron radiation unit 10; a gamma ray detection unit 30 capable of detecting a gamma ray dose released from the inspection object A upon radiation of neutrons from the neutron radiation unit 10; and an analysis unit 50 that calculates the contained amount of a predetermined substance on the basis of the gamma ray dose and corrects the contained amount of the predetermined substance on the basis of the first neutron dose and the second neutron dose.

Abstract: A nondestructive inspecting device 1 is provided with: a neutron beam emitting unit 10 capable of emitting a neutron beam in a prescribed emission direction D1; a gamma ray detecting unit 20 capable of detecting a gamma ray incident from a prescribed detection direction D2 intersecting the emission direction D1; a device housing 30 which covers the neutron beam emitting unit 10 and the gamma ray detecting unit 20, and in which an opening portion 30a is formed in the emission direction D1 and the detection direction D2; an outer shutter 31 for opening and closing the opening portion 30a of the device housing 30; an external dose monitor 41 for detecting a radiation dose inside the device housing 30; an internal dose monitor 42 for detecting a radiation dose outside the device housing 30; and a control unit 40 for prohibiting opening of the outer shutter 31 if the radiation dose detected by at least either of the dose monitors 41, 42 exceeds a predetermined threshold.

Abstract: A semiconductor integrated circuit has a semiconductor internal circuit having a first power supply line and a second power supply line, wiring layers connected to a plurality of terminals of a first power supply and each having a predetermined inductance, and wiring layers connected to a plurality of terminals of a second power supply and each having a smaller inductance. Each of the former wiring layers has an inductor making a loop around the internal circuit.

Abstract: A semiconductor integrated circuit has a semiconductor internal circuit having a first power supply line and a second power supply line, wiring layers connected to a plurality of terminals of a first power supply and each having a predetermined inductance, and wiring layers connected to a plurality of terminals of a second power supply and each having a smaller inductance. Each of the former wiring layers has an inductor making a loop around the internal circuit.