Abstract: In an analyzer, an image processing unit performs processing of: dividing a measurement image into a plurality of partial measurement images, and dividing a reference image into a plurality of partial reference images; calculating a positional deviation amount of each of the partial measurement images relative to a corresponding partial reference image among the partial reference images; determining whether the positional deviation amount is a threshold or less; and correcting positional deviation of the measurement image based on the positional deviation amounts of the plurality of partial measurement images when the image processing unit has determined that the positional deviation amount is not the threshold or less.

Abstract: An analyzer includes a wavelength-dispersive X-ray spectrometer and a control unit that controls the wavelength-dispersive X-ray spectrometer, the control unit performing: processing of acquiring an analysis result of preparatory analysis performed on a specimen to be analyzed; processing of setting spectroscopic conditions for WDS analysis using the wavelength-dispersive X-ray spectrometer based on the analysis result of the preparatory analysis; and processing of performing the WDS analysis on the specimen to be analyzed under the set spectroscopic conditions.

Abstract: An X-ray analyzer includes: a specimen stage; a spectrometer having a spectroscopic element and an X-ray detector; a temperature measuring unit including at least one of a first temperature sensor for measuring a temperature of the specimen stage and a second temperature sensor for measuring a temperature of the spectrometer; a storage unit which stores calibration data of the spectrometer, and a previous measurement result by the temperature measuring unit at the time of execution of the calibration of the spectrometer; and a notifying unit which acquires a measurement result by the temperature measuring unit, calculates a temperature variation amount of the acquired measurement result with respect to the previous measurement result stored in the storage unit, and notifies that calibration is needed, based on the temperature variation amount.

Abstract: In an analyzer, an image processing unit performs processing of: dividing a measurement image into a plurality of partial measurement images, and dividing a reference image into a plurality of partial reference images; calculating a positional deviation amount of each of the partial measurement images relative to a corresponding partial reference image among the partial reference images; determining whether the positional deviation amount is a threshold or less; and correcting positional deviation of the measurement image based on the positional deviation amounts of the plurality of partial measurement images when the image processing unit has determined that the positional deviation amount is not the threshold or less.

Abstract: A vehicle travel assistance apparatus includes a traveling environment information acquiring unit, a preceding vehicle recognizing unit, a vehicle shadow detector, a front vehicle shadow determining unit, and a second preceding vehicle estimating unit. The vehicle shadow detector detects a vehicle shadow of a train of vehicles including a first vehicle shadow of a first preceding vehicle recognized by the preceding vehicle recognizing unit and a front vehicle shadow of a front vehicle traveling in front of the first preceding vehicle based on a brightness difference from a road surface. When the front vehicle shadow determining unit determines that the front vehicle shadow separating from the first vehicle shadow is identified from the vehicle shadow, the second preceding vehicle estimating unit estimates a position of a second preceding vehicle belonging to the train of the vehicles including the first preceding vehicle based on the front vehicle shadow.

Abstract: An analyzer includes a wavelength-dispersive X-ray spectrometer and a control unit that controls the wavelength-dispersive X-ray spectrometer, the control unit performing: processing of acquiring an analysis result of preparatory analysis performed on a specimen to be analyzed; processing of setting spectroscopic conditions for WDS analysis using the wavelength-dispersive X-ray spectrometer based on the analysis result of the preparatory analysis; and processing of performing the WDS analysis on the specimen to be analyzed under the set spectroscopic conditions.

Abstract: An X-ray analyzer includes: a specimen stage; a spectrometer having a spectroscopic element and an X-ray detector; a temperature measuring unit including at least one of a first temperature sensor for measuring a temperature of the specimen stage and a second temperature sensor for measuring a temperature of the spectrometer; a storage unit which stores calibration data of the spectrometer, and a previous measurement result by the temperature measuring unit at the time of execution of the calibration of the spectrometer; and a notifying unit which acquires a measurement result by the temperature measuring unit, calculates a temperature variation amount of the acquired measurement result with respect to the previous measurement result stored in the storage unit, and notifies that calibration is needed, based on the temperature variation amount.

Abstract: Provided is a substrate processing apparatus capable of improving the workability of measuring a temperature-flat zone in a process furnace and the reliability of a temperature-flat length of a heater. The substrate processing apparatus includes a process chamber configured to process a substrate retained in a retainer loaded therein; a temperature measuring device configured to measure an inside temperature of the process chamber; a transfer device configured to transfer the substrate at least to the retainer; and a controller configured to control the transfer device and the temperature measuring device to move the transfer device to a predetermined position before the inside temperature of the process chamber is measured and to obtain the inside temperature by the temperature measuring device while vertically moving the transfer device with the temperature measuring device attached to the transfer device when the inside temperature of the process chamber is measured.

Abstract: A scatter diagram display device includes a principal component analysis section that performs principal component analysis on intensity or concentration map data that represents each element, a priority level setting section that sets a priority level to each element based on the results of the principal component analysis performed by the principal component analysis section, and a display control section that performs a control process that arranges a plurality of scatter diagrams generated by combining each element based on the priority level that has been set to each element by the priority level setting section, and displays the plurality of scatter diagrams on a display section.

Abstract: A phase analyzer includes a principal component analysis section that performs principal component analysis on elemental map data that represents an intensity or concentration distribution corresponding to each element to calculate a principal component score corresponding to each unit area of the elemental map data, a scatter diagram generation section that plots the calculated principal component score to generate a scatter diagram of the principal component score, a peak position detection section that detects a peak position from the scatter diagram, a clustering section that calculates a distance between each point and each peak position within the scatter diagram, and classifies each point within the scatter diagram into a plurality of groups based on the distance, and a phase map generation section that generates a phase map based on classification results of the clustering section.

Abstract: A scatter diagram display device includes a principal component analysis section that performs principal component analysis on intensity or concentration map data that represents each element, a priority level setting section that sets a priority level to each element based on the results of the principal component analysis performed by the principal component analysis section, and a display control section that performs a control process that arranges a plurality of scatter diagrams generated by combining each element based on the priority level that has been set to each element by the priority level setting section, and displays the plurality of scatter diagrams on a display section.

Abstract: A phase analyzer includes a principal component analysis section that performs principal component analysis on elemental map data that represents an intensity or concentration distribution corresponding to each element to calculate a principal component score corresponding to each unit area of the elemental map data, a scatter diagram generation section that plots the calculated principal component score to generate a scatter diagram of the principal component score, a peak position detection section that detects a peak position from the scatter diagram, a clustering section that calculates a distance between each point and each peak position within the scatter diagram, and classifies each point within the scatter diagram into a plurality of groups based on the distance, and a phase map generation section that generates a phase map based on classification results of the clustering section.

Abstract: This interface system comprises a processing program computer (11) for inputting default values in advance as parameters pertaining to an industrial machine (21) and creating a program that describes the movement of the industrial machine (21), the industrial machine (21) for moving a tool according to the program to process a workpiece into a predetermined shape, a detection means (40) for automatically detecting correction values of the parameters pertaining to the industrial machine (21) in the processing program on the basis of the actual condition of the industrial machine (21), and an interface part (50) for delivering to the computer (11) corrective information detected by the detection means (40) in a format that can be understood by the computer (11); therefore, parameters that reflect the actual condition of the industrial machine can be inputted into the program.

Abstract: Provided is a substrate processing apparatus capable of improving the workability of measuring a temperature-flat zone in a process furnace and the reliability of a temperature-flat length of a heater. The substrate processing apparatus includes a process chamber configured to process a substrate retained in a retainer loaded therein; a temperature measuring device configured to measure an inside temperature of the process chamber; a transfer device configured to transfer the substrate at least to the retainer; and a controller configured to control the transfer device and the temperature measuring device to move the transfer device to a predetermined position before the inside temperature of the process chamber is measured and to obtain the inside temperature by the temperature measuring device while vertically moving the transfer device with the temperature measuring device attached to the transfer device when the inside temperature of the process chamber is measured.

Abstract: In a method for processing a workpiece in a tool machine, a first step (Step S4) for continuously measuring a position of a tip portion of a tool attached to a main axis, a second step (Step S5) for computing a displacement amount of the position of the tip point of the tool based on a result of the measurement, a third step (Step S8) for observing a time period while the displace amount is belonged in arrange of allowable displace amount previously determined, a fourth step (Step S9) for keeping an idling operation in case that the time for which the displace amount is belonged in the range of the allowable displacement amount is shorter than a time period previously determined and intermitting the idling operation in the case that the time for which the displace amount is belonged in the range of the allowable displacement amount become the time period previously determined and a fifth step (Step S10) for starting a process with respect to the workpiece in the case that the idling operation is finished are

Abstract: In a method for processing a workpiece in a tool machine, a first step (Step S4) for continuously measuring a position of a tip portion of a tool attached to a main axis, a second step (Step S5) for computing a displacement amount of the position of the tip point of the tool based on a result of the measurement, a third step (Step S8) for observing a time period while the displace amount is belonged in arrange of allowable displace amount previously determined, a fourth step (Step S9) for keeping an idling operation in case that the time for which the displace amount is belonged in the range of the allowable displacement amount is shorter than a time period previously determined and intermitting the idling operation in the case that the time for which the displace amount is belonged in the range of the allowable displacement amount become the time period previously determined and a fifth step (Step S10) for starting a process with respect to the workpiece in the case that the idling operation is finished are

Abstract: A method for controlling axial length, comprising administering a pharmaceutically effective amount of a TGF-.beta. regulating substance. More particularly, a method for inhibiting axial elongation and a method for the prophylaxis and treatment of myopia, both comprising administering a TGF-.beta. activator, specifically a plasminogen activator. A method for elongation of axial length and a method for the prophylaxis and treatment of hyperopia, both comprising administering a TGF-.beta. activation inhibitor, particularly a plasminogen activator inhibitor. The method for controlling axial length of the present invention is extremely useful for the prophylaxis and treatment of myopia or hyperopia. It is also useful for preparing experimental model animals having eyes with complete axial myopia or hyperopia exclusive of refractive myopia or hyperopia.

Abstract: The present invention relates to a circuit mounting unit that can prevent a voltage drop and noise occurrence due to current inflow at the time of a hot insertion or withdrawal operation without mounting a capacitor with large capacitance on the side of a main unit. The circuit mounting unit includes a first voltage control unit that controls to increase gradually a voltage supplied to a load voltage converter from the main unit side to a predetermined voltage when the circuit mounting unit is exchangeably inserted into or pulled out of the main unit without halting electric power supplied from the main unit. The circuit mounting unit is mounted onto a printed wiring board on which various elements such as ICs and LSIs are previously mounted to form a predetermined circuit.

Abstract: A DC/DC converter includes a control unit for outputting a control signal on the basis of a voltage difference between a DC output voltage and a reference voltage; a switching element which is connected to a line of the DC input voltage, and which becomes ON-state or OFF-state in accordance with the control signal; and a minimum ON-state duration setting unit, e.g., a monostable multivibrator, which defines the minimum ON-state duration of the switching element, when a necessary output electric power is low. Preferably, the converter includes a charge-pumping circuit having two diodes and two capacitors, so as to obtain from one capacitor a driving voltage source for driving an N-channel type field-effect transistor as the switching element.

Abstract: The overcurrent protection circuit for a dc-to-dc converter which inputs an input voltage through a power input line, converts the voltage into another voltage to output as an output voltage to a load through a power output line. The overcurrent protection circuit outputs a first connection signal for a predetermined period from the time the input voltage is turned on; detects an overcurrent caused in the load and outputs a second connection signal from the time tile input voltage is turned on until the overcurrent is detected; and closes the power input line while receiving at least one of the first and second connection signals.