Patents by Inventor Shigeru Hosoda

Shigeru Hosoda has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11274655
    Abstract: One object is to promptly and accurately sense an abnormal state of a wind turbine driving device. The wind turbine driving device includes a driving device body and a sensor. The driving device body is installed in one structure at a movable section of a wind turbine. The driving device body includes a meshing portion meshing with a ring gear installed in the other structure at the movable section of the wind turbine. The sensor measures a change in installation state of the driving device body with respect to the one structure.
    Type: Grant
    Filed: December 5, 2017
    Date of Patent: March 15, 2022
    Assignee: NABTESCO CORPORATION
    Inventors: Osamu Nohara, Shigeru Hosoda, Yuichi Asakawa
  • Patent number: 11047366
    Abstract: Damage to a driving device or a ring gear or both due to an excessive force at a meshing portion therebetween is effectively prevented. In the embodiment described above, a driving device includes a driving device body that is provided in one structure at a movable section of a wind turbine and has a drive gear meshing with a ring gear provided in the other structure at the movable section, and an abnormality detection unit that monitors a force generated between the ring gear and the drive gear or the state of the driving device body or monitors both of the face and the state. Output from the drive gear of the driving device body to the ring gear is stopped when the abnormality detection unit detected an abnormality.
    Type: Grant
    Filed: November 30, 2017
    Date of Patent: June 29, 2021
    Assignee: NABTESCO CORPORATION
    Inventors: Osamu Nohara, Shigeru Hosoda, Kei Kato, Haruna Osako
  • Publication number: 20190390651
    Abstract: One object is to promptly and accurately sense an abnormal state of a wind turbine driving device. The wind turbine driving device includes a driving device body and a sensor. The driving device body is installed in one structure at a movable section of a wind turbine. The driving device body includes a meshing portion meshing with a ring gear installed in the other structure at the movable section of the wind turbine. The sensor measures a change in installation state of the driving device body with respect to the one structure.
    Type: Application
    Filed: December 5, 2017
    Publication date: December 26, 2019
    Inventors: Osamu NOHARA, Shigeru HOSODA, Yuichi ASAKAWA
  • Publication number: 20190293055
    Abstract: Damage to a driving device or a ring gear or both due to an excessive force at a meshing portion therebetween is effectively prevented. In the embodiment described above, a driving device includes a driving device body that is provided in one structure at a movable section of a wind turbine and has a drive gear meshing with a ring gear provided in the other structure at the movable section, and an abnormality detection unit that monitors a force generated between the ring gear and the drive gear or the state of the driving device body or monitors both of the face and the state. Output from the drive gear of the driving device body to the ring gear is stopped when the abnormality detection unit detected an abnormality.
    Type: Application
    Filed: November 30, 2017
    Publication date: September 26, 2019
    Inventors: Osamu NOHARA, Shigeru HOSODA, Kei KATO, Haruna OSAKO
  • Patent number: 7768286
    Abstract: An electronic device testing apparatus is described that includes a temperature measurement device for measuring a temperature of an IC device based on a voltage of a thermal diode provided inside the IC device, a temperature sensor and a temperature applying device provided to a pusher, and a temperature control portion for calculating a correction value from a difference of a measurement temperature of a predetermined IC device by the temperature measurement device and that by the temperature sensor. A temperature of the IC device to be tested is measured by the temperature measurement device at an actual operation, and the temperature applying device is controlled based on the obtained measurement temperature and the correction value calculated by the temperature control portion.
    Type: Grant
    Filed: August 25, 2005
    Date of Patent: August 3, 2010
    Assignee: Advantest Corporation
    Inventors: Shigeru Hosoda, Masaaki Ogawa
  • Publication number: 20090051381
    Abstract: An electronic device testing apparatus 1 comprising a temperature measurement device 51 for measuring a temperature of an IC device D based on a voltage of a thermal diode provided inside the IC device D, a temperature sensor 154 and a temperature applying device 153 provided to a pusher 150, and a calibration means for calculating a correction value from a difference of a measurement temperature of a predetermined IC device D by the temperature measurement device 51 and that by the temperature sensor 154; wherein a temperature of the IC device D to be tested is measured by the temperature measurement device 51 at an actual operation, and the temperature applying device 153 is controlled based on the obtained measurement temperature and a correction value calculated by the calibration means.
    Type: Application
    Filed: August 25, 2005
    Publication date: February 26, 2009
    Inventors: Shigeru Hosoda, Masaaki Ogawa