Patents by Inventor Shigeru Izumi

Shigeru Izumi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5640462
    Abstract: An imaging method of an X-ray computerized tomography (X-ray CT) comprising the steps of reconstructing a partial region including a region of interest from penetrating data of an object, extracting only shape information from the reconstructed image, setting a threshold function determined by resolution to the reconstructed image information which is equivalent to linear absorption coefficient distribution (density), extracting the reconstructed image information by making the information into bi-values or tri-values based on the threshold function or by differentiating the information, and extracting and imaging only a portion where the linear absorption coefficient distribution (density) changes stepwise.
    Type: Grant
    Filed: September 17, 1992
    Date of Patent: June 17, 1997
    Assignee: Hitachi, Ltd.
    Inventors: Katsutoshi Sato, Shigeru Izumi, Shoji Kamata, Hiroshi Miyai, Hiroshi Kitaguchi, Masahiro Kondo, Seishi Watahiki
  • Patent number: 5457322
    Abstract: The invention provides a high sensitivity semiconductor radiation detection apparatus having pn junctions formed in opposite surfaces of at least one semiconductor wafer. A common electrode for the pn junctions is formed in the substrate region of the semiconductor wafers, and a variable reverse bias voltage is supplied to an electrode formed in contact with at least one of the pn junctions, to vary the thickness of the depletion region generated at said pn junction, and hence the sensitivity of said junction to incident radiation of varying energy levels. By adjusting the relative thickness of the respective depletion regions, different types of radiation may be distinguished.
    Type: Grant
    Filed: March 29, 1994
    Date of Patent: October 10, 1995
    Assignee: Hitachi, Ltd.
    Inventors: Hiroshi Kitaguchi, Shigeru Izumi
  • Patent number: 5336890
    Abstract: A high sensitivity semiconductor radiation detector and semiconductor radiation detection apparatus having pn junctions formed in surfaces of at least one semiconductor wafer. A common electrode for the pn junctions may be formed in substrate regions of the semiconductor wafers, and a variable reverse bias voltage may be supplied to at least one electrode formed in contact with a pair of pn junctions. The variable reverse bias means adjusts depletion region thickness(es) so that the detector can detect and distinguish different kinds of nuclear radiation by differing energy levels.
    Type: Grant
    Filed: October 1, 1993
    Date of Patent: August 9, 1994
    Assignee: Hitachi, Ltd.
    Inventors: Hiroshi Kitaguchi, Shigeru Izumi
  • Patent number: 5321269
    Abstract: A neutron individual dose meter and a neutron dose rate meter, both capable of implementing the effective dose equivalent response. The neutron individual dose meter is capable of being accomplished by providing a composite layer made up of a converter such as boron, and a proton radiator, on the surface of a semiconductor neutron detection element. The neutron dose rate meter is capable of being accomplished through such a structure as to surround a neutron detector with a neutron moderator and a thermal neutron absorber which has openings. Thus, a neutron individual dose meter and a neutron dose rate meter, both capable of implementing the effective dose equivalent response and measurement at lower operating voltage have been provided. Further, these meters are capable of being implemented by utilizing a single semiconductor detection element, respectively.
    Type: Grant
    Filed: December 27, 1991
    Date of Patent: June 14, 1994
    Assignee: Hitachi, Ltd.
    Inventors: Hiroshi Kitaguchi, Shigeru Izumi, Akihisa Kaihara
  • Patent number: 5316983
    Abstract: An apparatus and a method for analysis of a particle by irradiation of the particle in a fluid with an intense laser pulse to cause laser breakdown and to detect sonic waves or plasma emission which are generated by the laser breakdown. The size of the particle is measured by using at least two kinds of information from the following: intensity of plasma emission or sonic wave generated by the laser breakdown, location of the laser breakdown plasma, and plasma emission waveform. Also, a laser pulse having flattened distribution of intensity for the irradiation is used in order to eliminate the dependence of the measured value on the particle location.
    Type: Grant
    Filed: August 5, 1991
    Date of Patent: May 31, 1994
    Assignee: Hitachi, Ltd.
    Inventors: Haruo Fujimori, Tetsuya Matsui, Taiko Ajiro, Kenji Yokose, Shigeru Izumi
  • Patent number: 5228071
    Abstract: A CT system for cross-sectional imaging and a method using the same are involved. A second table for fine adjustment of an object is arranged on a conventional first table for the object. The center of gravity of a cross-sectional image of the object imaged in advance is determined, the object is finely moved by means of the second table such that the determined center of gravity coincides with the center or a corner of a mesh used for image formation, and cross-sectional imaging is again carried out. Through this, contrast at the edge of the object can be improved when the object is highly symmetrical as are many industrial products.
    Type: Grant
    Filed: November 27, 1991
    Date of Patent: July 13, 1993
    Assignee: Hitachi, Ltd.
    Inventors: Shoji Kamata, Shigeru Izumi
  • Patent number: 5222114
    Abstract: An X-ray analysis apparatus has a charged particle beam generator, an X-ray generating target bombarded by the beam and a detector for X-rays from said target transmitted by a test piece. To improve the spatial resolution of the apparatus, the beam size is reduced at the target by locating the target outside a vacuum chamber of the beam generator by providing the target as a non-circular narrow track of X-ray generating material exposed at both surfaces of the target, and by providing the beam generator with a beam accelerator and means for reducing the beam diameter between the beam accelerator and the target.
    Type: Grant
    Filed: May 28, 1991
    Date of Patent: June 22, 1993
    Assignee: Hitachi, Ltd.
    Inventors: Shoji Kamata, Shigeru Izumi
  • Patent number: 5099127
    Abstract: A portable intensitometer including a radioactive radiation detector, an operation processing device for digitally processing the output signal of the radioactive radiation detector, and a device which produces a processed result of the operation processing device, wherein the improvement further includes a device for storing the data of exposure history and exposure control values of an individual person, and an interface which is connected to the storage device and to said operation processing device to input or output the data relative to an external equipment. The operation processing device carries out exposure control calculation for an individual person relying upon the output signals from the radioactive radiation detector and upon the read signals from the storage device. Therefore, the daily control, weekly control and monthly control are carried out in real time for each of the individual persons, to realize perfect exposure control for the individual persons.
    Type: Grant
    Filed: September 30, 1988
    Date of Patent: March 24, 1992
    Assignee: Hitachi, Ltd.
    Inventors: Hiroshi Kitaguchi, Shigeru Izumi, Satoshi Suzuki, Satoru Kawasaki, Masahiro Kondo, Shinji Mitani, Tatsuo Hayashi, Yukito Koiwa
  • Patent number: 5076502
    Abstract: A system for discriminating radiation-contaminated fragments on the basis of a predetermined radioactive concentration includes a detection device for detecting the radiation of the fragments, the detection device having a generally vertically-extending path of transfer of the fragments, at least one radiation detector disposed at one of the inside and outside of asid transfer path, and a transfer device for sequentially transferring the fragments in the transfer path; a convey device for conveying the fragments to said detection device; and a controller for determining the radioactive concentration of the fragments in accordance with the radiation detected by the detection device and for judging whether or not the radioactive concentration of the fragments is the predetermined radioactive concentration. The controller is also operable to control the transfer device so as to adjust the speed of transfer of the fragments in the transfer path.
    Type: Grant
    Filed: December 19, 1989
    Date of Patent: December 31, 1991
    Assignee: Hitachi, Ltd.
    Inventors: Hiroshi Kitaguchi, Shigeru Izumi, Hideo Yusa, Makoto Kikuchi
  • Patent number: 4879466
    Abstract: A structure of semiconductor radiation detector element having a p-n junction comprises a substrate layer including a radiation absorbing layer having a silicon equivalent thickness not smaller than 140 .mu.m and located adjacent to a depletion layer formed at the p-n junction. With the simplified structure, both the detection sensitivity and the energy compensating performance are enhanced significantly.
    Type: Grant
    Filed: January 29, 1988
    Date of Patent: November 7, 1989
    Assignee: Hitachi, Ltd.
    Inventors: Hiroshi Kitaguchi, Shigeru Izumi, Satoshi Suzuki
  • Patent number: 4843537
    Abstract: A safety control safeguard system includes sensors disposed in a quadruple array. First, second, third and fourth signal processing channels provided in parallel each include signal processing means for receiving output signals from the associated sensors for producing a trip signal. First and second actuating means operable independent of each other are provided for actuating an apparatus to be controlled. A first switch means operatively connected to the first, second, third and fourth processing channels for activating the first actuating means in response to reception of the trip signal produced by the signal processing channels and second switch means operatively connected to the first, second, third and fourth processing channels for activating the second actuating means in response to reception of the trip signal produced by the signal processing channels.
    Type: Grant
    Filed: July 2, 1987
    Date of Patent: June 27, 1989
    Assignee: Hitachi, Ltd.
    Inventors: Setsuo Arita, Shunsuke Utena, Fumio Murata, Atomi Noguchi, Shigeru Izumi, Satoshi Suzuki, Fumiyasu Ookido
  • Patent number: 4641526
    Abstract: Method and apparatus for estimating the location of an unknown sound source in a structure to be monitored, wherein sounds from at least three known sound sources are detected by a plurality of detectors. At least one of peak value data and signal arrival time data derived from the outputs of the detectors are classified for each of the known sound sources and stored in a storage. Pattern differences from each of the known sound sources to a number of predetermined positions respectively, are calculated to prepare for each of the known sound sources a correspondence table indicating relationships between the calculated pattern difference and the real distances from the known sound source positions to the predetermined positions, the correspondence table being stored in a storage. The pattern differences for each of the known sound source positions are calculated on the basis of the sound signal data derived through detection of a sound from an unknown sound source and the data stored in the storage.
    Type: Grant
    Filed: June 5, 1984
    Date of Patent: February 10, 1987
    Assignee: Hitachi, Ltd.
    Inventors: Shigeru Izumi, Makoto Senoh, Koji Tsumaki, Kenji Miyata
  • Patent number: 4621532
    Abstract: A chain-like self-moving robot includes three or more capsule units connected to one another in a string by means of couplers. By expanding and contracting intercapsule spaces in a predetermined sequence so that a smaller number of the capsules are moved while a larger number of capsules remain stationary, the chain-like robot can move forwardly or backwardly.
    Type: Grant
    Filed: May 15, 1985
    Date of Patent: November 11, 1986
    Assignees: Hitachi, Ltd., Tokyo Gas Co., Ltd.
    Inventors: Atsushi Takagi, Shigeru Izumi, Fuminobu Takahashi, Chikara Sato, Shinji Naitoh, Shinji Sonoda
  • Patent number: 4586378
    Abstract: Method and apparatus for evaluating location of an unknown sound generated in a structure such as a pressure vessel. A plurality of sound detectors are mounted on the structure for detecting sounds generated in the structure. On the basis of sound information of the unknown sound source derived from the outputs of the detectors, the location where the unknown sound is produced is determined. To this end, reference sounds are first generated at a plurality of known reference sound source positions, wherein information of the reference sounds derived from the outputs of the detectors are stored in a storage unit. Equi-pattern-distance curves each of which is in an equal pattern distance between a supposed unknown sound source and each of the reference sound sources are calculated on the basis of the reference sound information. The equi-pattern-distance curves are further corrected in accordance with the reference sound information.
    Type: Grant
    Filed: October 5, 1984
    Date of Patent: May 6, 1986
    Assignee: Hitachi, Ltd.
    Inventors: Shigeru Izumi, Yoshihiro Michiguchi, Makoto Senoh
  • Patent number: 4377947
    Abstract: A device for identifying an acoustic sound producing location in an axial direction of a rotating body by using an acoustic signal and a rotational pulse signal. In the device, a rubbing location identifying signal is provided in synchronism with the rotational pulse signal in which the pulse interval corresponds to the distance between acoustic sensors or a rotor length. A phase of a peak in a rubbing location identifying signal as measured with respect to the pulse represents an acutal rubbing location.
    Type: Grant
    Filed: November 13, 1980
    Date of Patent: March 29, 1983
    Assignee: Hitachi, Ltd.
    Inventors: Osami Matsushita, Motohiro Satoh, Susumu Hioki, Katsuaki Kikuchi, Shigeru Izumi
  • Patent number: 4352167
    Abstract: A number of sound detectors are provided on an external enclosure of a pressure vessel of a nuclear reactor. Output signals produced from the individual detectors are combined into a pattern in terms of time difference of the detector output signals relative to the time point at which the detected signal is first produced in response to the sound signal and relative peak values of the detector output signals relative to the magnitude of the output signal produced by the detector which detects the sound signal with the highest sensitivity. The pattern thus obtained is then compared with patterns which have been previously prepared by intentionally producing the sound signals at locations in interest within the pressure vessel, to thereby estimate the location within the pressure vessel at which the sound is produced.
    Type: Grant
    Filed: March 12, 1980
    Date of Patent: September 28, 1982
    Assignees: The Chubu Electric Power Co., Inc., The Chugoku Electric Power Co., Inc., The Tokyo Electric Power Co., Inc., Hitachi, Ltd.
    Inventors: Yuuji Hashimoto, Izumi Kobayashi, Mitsuo Suzuki, Kimio Yamada, Shigeru Izumi, Yoshihiro Michiguchi
  • Patent number: RE35908
    Abstract: A neutron individual dose meter and a neutron dose rate meter, both capable of implementing the effective dose equivalent response. The neutron individual dose meter is capable of being accomplished by providing a composite layer made up of a converter such as boron, and a proton radiator, on the surface of a semiconductor neutron detection element. The neutron dose rate meter is capable of being accomplished through such a structure as to surround a neutron detector with a neutron moderator and a thermal neutron absorber which has openings. Thus, a neutron individual dose meter and a neutron dose rate meter, both capable of implementing the effective dose equivalent response and measurement at lower operating voltage have been provided. Further, these meters are capable of being implemented by utilizing a single semiconductor detection element, respectively.
    Type: Grant
    Filed: June 14, 1996
    Date of Patent: September 29, 1998
    Assignee: Hitachi, Ltd.
    Inventors: Hiroshi Kitaguchi, Shigeru Izumi, Akihasa Kaihara