Patents by Inventor Shigeru Osaki

Shigeru Osaki has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6798527
    Abstract: An object of the present invention is to provide a method for accurately measuring a three-dimensional shape of a measuring subject independent of the surface shape of the measuring subject, and another object thereof is to shorten the time from the measurements of the measuring subject until three-dimensional shape data is obtained so as to carry out efficient measuring operations. In a three-dimensional measuring system 1 that measures a three-dimensional shape of a measuring subject, two three-dimensional measuring devices 10, 20 are placed. The three-dimensional measuring device 10 measures a measuring subject placed in a measuring space 3 by allowing a laser slit light L1 in a longitudinal direction to scan in a lateral direction. Moreover, the three-dimensional measuring device 20 measures the measuring subject placed in a measuring space 3 by allowing the laser slit light L1 in a lateral direction to scan in a longitudinal direction.
    Type: Grant
    Filed: April 24, 2002
    Date of Patent: September 28, 2004
    Assignee: Minolta Co., Ltd.
    Inventors: Tadashi Fukumoto, Shigeru Osaki, Masahiro Ariizumi, Norio Matsunaga, Yoshihisa Abe
  • Publication number: 20020171847
    Abstract: An object of the present invention is to provide a method for accurately measuring a three-dimensional shape of a measuring subject independent of the surface shape of the measuring subject, and another object thereof is to shorten the time from the measurements of the measuring subject until three-dimensional shape data is obtained so as to carry out efficient measuring operations. In a three-dimensional measuring system 1 that measures a three-dimensional shape of a measuring subject, two three-dimensional measuring devices 10, 20 are placed. The three-dimensional measuring device 10 measures a measuring subject placed in a measuring space 3 by allowing a laser slit light L1 in a longitudinal direction to scan in a lateral direction. Moreover, the three-dimensional measuring device 20 measures the measuring subject placed in a measuring space 3 by allowing the laser slit light L1 in a lateral direction to scan in a longitudinal direction.
    Type: Application
    Filed: April 24, 2002
    Publication date: November 21, 2002
    Inventors: Tadashi Fukumoto, Shigeru Osaki, Masahiro Ariizumi, Norio Matsunaga, Yoshihisa Abe
  • Patent number: 4989982
    Abstract: A spectral sensitivity correcting device in a photoelectric tristimulus colorimeter which comprises three light receiving systems for the measurement of tristimulus values. Signals indicative of respective outputs from two of the light receiving systems multiplied by predetermined correction coefficients are added to or subtracted from an output from the remaining light receiving system so that spectral sensitivity characteristics of the remaining light receiving system can approach predetermined spectral sensitivity characteristics.
    Type: Grant
    Filed: August 4, 1989
    Date of Patent: February 5, 1991
    Assignee: Minolta Camera Kabushiki Kaisha
    Inventors: Shigeru Osaki, Masami Sugiyama