Abstract: Resistor material such as polysilicon is deposited on the insulating surface of a substrate and patterned to form resistor layers disposed generally parallel. Another resistor material such as polysilicon is deposited filling each space between adjacent resistor layers, with an insulating film being interposed between the upper and lower resistor materials, and etched back to form other resistor layers at respective spaces. After an insulating film is formed covering the resistor layers, contact holes are formed in the insulating film. A conductive layer is deposited and patterned to serially connect the resistor layers.

Abstract: On the principal surface of an Si semiconductor substrate, a field oxide film is formed defining an active region. On the active region, an insulated gate structure is formed including a gate oxide film and a polycrystalline Si layer. At the same time, a lower capacitor electrode of the polycrystalline Si layer is formed on the field oxide film. The surface of the polycrystalline layer is oxidized to form an insulating film. Another polycrystalline Si layer is deposited covering the insulating film. A mask is formed over the lower capacitor electrode. By using this mask as an etching mask, anisotropic etching is performed to leave an upper capacitor electrode and side wall spacers on the side walls of the gate electrode and lower capacitor electrode.

Abstract: On the principal surface of an Si semiconductor substrate, a field oxide film is formed defining an active region. On the active region, an insulated gate structure is formed including a gate oxide film and a polycrystalline Si layer. At the same time, a lower capacitor electrode of the polycrystalline Si layer is formed on the field oxide film. The surface of the polycrystalline layer is oxidized to form an insulating film. Another polycrystalline Si layer is deposited covering the insulating film. A mask is formed over the lower capacitor electrode. By using this mask as an etching mask, anisotropic etching is performed to leave an upper capacitor electrode and side wall spacers on the side walls of the gate electrode and lower capacitor electrode.

Abstract: A semiconductor integrated circuit including a MOSFET having a polycide gate structure, a resistor and a capacitor is monolithically manufactured. Polycrystalline silicon film, a dielectric film, and another polycrystalline silicon film are consecutively deposited. After processes of patterning and etching the dielectric film, the remaining dielectric films are used as an etching protection mask for the resistor and a capacitor. A refractory metal silicide for a polycide gate is uniformly deposited over the remaining another polycrystalline silicon films and dielectric films. The refractory metal silicide and polycrystalline silicon are consecutively etched through a patterned resist mask and the remaining dielectric films to simultaneously form the polycide gate, resistor and capacitor. Thus, a capacitor having small change in capacitance versus applied voltage is manufactured in a MOS IC device having a polycide gate.

Abstract: A weather-fastness test method utilizing a novel sample holder and constituted by the steps of fixing the sample to the holder which is provided with metal coils the shape of which varies in accordance with the variation in the temperature of the ambient air and the radiation heat from a light source and which are connected so as to apply a force to the sample as the temperature changes, placing the sample under predetermined conditions, e.g. exposing the sample to radiation by light, to air having a temperature and humidity of predetermined levels, and to rain, while the sample is under repeated tension, compressive force and/or bending stress due to the variation of the shape of the coils and imparted to the sample, and then evaluating the weather-fastness resistance of the sample.

Abstract: A method of carrying out an accelerated light fastness test on a sample of a material to be used under certain conditions of air convection along the surface thereof, is constituted by the steps of positioning a sample to be tested with the surface thereof which is exposed to light during intended conditions of use of the material spaced at a distance from a light source having a constant intensity of light radiated therefrom for causing the surface of the sample to receive a desired intensity of light, and positioning a filter between the surface of the sample and the light source and spaced a distance from the surface of the sample for causing air between the filter and the sample to be at the convection conditions corresponding to the certain conditions of air convection at the surface of the material under its intended conditions of use, whereby the temperature conditions of the material at the surface facing the source of light are made to correspond to the temperature conditions during the intended use

Abstract: A method of measuring or controlling ozone concentration by ultraviolet ray absorptiometry, includes charging air into a testing tank with its temperature controlled, measuring the disturbing gases generated from testpieces such as rubber samples inside the testing tank by regarding them as ozone, subtracting a value representative of the disturbing gases with a calculation circuit from a value indicative of the preexisting state in the tank to set the ozone concentration at zero, generating a necessary quantity of ozone with an ozonizer by using the zero ozone concentration as a reference point, suspending the generation of ozone after the passage of a predetermined time, measuring once again to obtain a new ozone concentration zero value, adjusting the ozone concentration zero value to the new value if there has been a change in the amount of disturbing gases generated, and repeating at least once the operation described above to regulate the ozone concentration to a desired ozone concentration.

Abstract: A test oven wherein heated air having a predetermined temperature is supplied and the oxygen concentration in the supplied air is controlled. The test oven has a test oven body having an air supply port and an air discharge port, a blower connected to the air supply port for blowing air thereinto, an oxygen concentration detector connected to the test oven body, an oxygen concentration setting control unit connected to the oxygen concentration detecting detector and including an oxygen concentration setter for setting a desired level of oxygen, and an oxygen concentration controller constantly comparing a reference output level generated on the basis of a concentration level set in advance in the oxygen concentration setter with an output level outputted from the oxygen concentration detector and for controling the actual output level to a set level, and at least one oxygen concentration adjusting device.

Abstract: A ventilation regulated hot air supplied constant temperature oven used for heat aging testing. Heated air of a predetermined temperature is supplied to a test oven body through an air supply port. Ventilation of the test oven is carried out through the air discharge port at a predetermined rate at predetermined time intervals.

Abstract: For enhancement of device stability, there is disclosed a semiconductor device fabricated on a semiconductor substrate comprising (a) source and drain regions formed in a surface portion of the semiconductor substrate and spaced from each other by a channel region, (b) a gate insulating film formed on the channel region, (c) a gate electrode structure formed on the gate insulating film, and (d) a passivation film of an insulating material covering the gate electrode structure and containing hydrogen-bonded-silicons equal in number to or less than 5.times.10.sup.21 per cm.sup.3, and the unstable hydrogen-bonded-silicons are decreased in number so that the semiconductor device only have a decreased trap density which results in stable operation.

Abstract: An apparatus for estimating and displaying the remainder of the lifetime of xenon lamps has a memory in which is stored data on the values of the discharge power of an average xenon lamp for maintaining the irradiance of the light emitted from the xenon lamp on the surface of a sample at a predetermined level, and the corresponding time of use of the average xenon lamp; a discharge power measuring device for measuring the level of the discharge power of a xenon lamp being used to irradiate the surface of a sample while the xenon lamp is being controlled to maintain the irradiance of the light emitted from the xenon lamp on the surface of the sample at a predetermined level; a timer for providing at each of a plurality of predetermined times instructions for starting a comparison of the value of the discharge power of said xenon lamp being used with the stored values; an arithmetic unit for obtaining from the memory the value of the stored cumulative time of use corresponding to the measured value of the disch

Abstract: A method and apparatus for determining the luster of a surface as a numerical value. The apparatus projects light from a light source through a light diffusing layer and through a layer of semitransparent material having thereon groups of parallel lines for projecting the lines onto the surface of a sample the luster of which is to be determined. The lines projected onto the surface are viewed with the eyes and the degree of distortion among the lines in the respective groups, which occurs due to the various conditions of the surface which affect the luster thereof, and to which has previously been assigned a numerical value, is determined, the numerical value of the thus determined degree of distortion for one group of figures being for the degree of gloss of the surface and the numerical value of the thus determined degree of distortion for another group being for the degree of clarity of the surface.

Abstract: A light fastness/weather resistance accelerated test apparatus, including a test tank having a discharge duct, a light source at the center of the test tank with a sample rotating frame rotatable around the light source and a black panel thermometer mounted on the sample rotating frame. A sensor on the sample rotating frame senses the temperature at the position of a sample. An air flow regulator is provided on the test tank, a blower is mounted for discharging air into the bottom of the tank, and a circulating duct is connected between the air flow regulator and the blower. A damper in the air flow regulator is movable to open the inside of the tank to the discharge duct or to direct air from within the tank into the circulating duct. An air mixer has a further damper and a bypass opening into the air flow regulator. The further damper is controlled to direct air through the bypass in response to the temperature outside the apparatus.

Abstract: A light resistance tester for maintaining a uniform temperature of the surface of a sample being tested has a testing chamber, a light source mounted in the center of the testing chamber, an annular sample mounting frame positioned around the light source and rotatable around the light source as the center of rotation, and an air circulation blower mounted in the lower portion of the testing chamber below the sample mounting frame and circulating air upwardly in the testing chamber toward the sample mounting frame. An air flow divider is positioned between the sample mounting frame and the light source for dividing the upward flow of air from the air circulation blower into a portion flowing in an upward path within the sample mounting frame and spaced inwardly from samples mounted on the frame and around the light source, and a portion flowing along an upward path along the outside of the sample mounting frame.

Abstract: A method and apparatus for measuring the gloss of a surface of a material by receiving light reflected from the surface and measuring the amount of light. Parallel light rays from a light source are directed against the surface the gloss of which is to be determined at an angle of incidence, and a cross-section of light rays reflected from the surface at an angle of reflection equal to the angle of incidence is received and the central region of the cross-section of the light rays is blocked out by a light intercepting plate, so that only the light received after the blocking out of the central region is used as a determination of the gloss of the surface.

Abstract: An apparatus for testing light fastness of a material having a housing with a test chamber therein and two downwardly and outwardly inclined specimen supporting walls on opposite sides of the chamber and two rows of horizontally positioned equal intensity ultraviolet fluorescent lamps one lying generally along each of the specimen supporting walls, with four lamps in each row. The uppermost lamp in each row is spaced downwardly from the upper edge of the specimen supporting wall and the next lower lamp is spaced above the midpoint of the vertical dimension of the wall substantially equal distances, the uppermost and next lower lamps being spaced from each other slightly less than twice the equal distance.

Abstract: A device which simulates the burning of an elongated smoking product such as a cigarette, for testing the combustability of an article. The device includes a rod-shaped resistive heating element, the length and cross section of which are the same as those of the product whose burning characteristics are to be simulated. The heating element may be divided into a plurality of longitudinally aligned heat insulated segments. A plurality of lead wires are successively spaced along the length of the heating element so as to respectively uniformly heat the respective portions of the heating element between the adjacent lead wires when an electric current is applied separately thereto. Circuitry is provided for applying an electric current to successively adjacent portions of the heating element through the lead wires for predetermined periods of time, beginning at one end of the heating element and ending at the other, thereby simulating the burning of a cigarette.

Abstract: An electrolytic cell for an actinometer, constituted by a glass vessel having a glass filter extending across the central portion thereof and forming a separator wall dividing the vessel into two side by side chambers. A body of mercury is provided in the bottom of one chamber and a platinum wire extends into the body of mercury for forming an anode for the cell. A carbon plate is mounted in the other chamber spaced from the separator wall and has a hole extending thereinto from the top, and mercury substantially fills the hole, and a further platinum wire extends into this mercury for forming a cathode for the cell. A glass tube extends downwardly from the other chamber for collecting precipitated mercury therein during operation of the cell, and an electrolyte fills the tube and the chambers and extends to a level just above the upper end of the carbon plate.

Abstract: An integrating sphere type standard light source has a spherical shell the inner surface of which is coated with a white coating having a high reflectivity. The shell has a light source aperture in the top thereof, a viewing aperture in the side thereof and a specimen exposure aperture in the bottom thereof. A light source is mounted in the light source aperture and depends into said shell and includes a source of light and a light shielding plate between the source of light and the remainder of the interior of the shell, the light shielding plate also being coated with a white coating having a high reflectivity. A specimen supporting plate is positioned beneath the specimen exposure aperture and is normally positioned for supporting a specimen at the bottommost point of an imaginary spherical surface which is an extension of the internal surface of the shell into the specimen exposure aperture.

Abstract: A test apparatus for determining the abrasion resistance of the surface of a sample to be tested. The sample is placed with the surface to be tested facing downwardly through an aperture in a sample support, an abrasion wheel is positioned beneath the sample and urged upwardly against the sample, the sample is reciprocated horizontally back and forth over the abrasion wheel, and at the end of each reciprocal movement, the abrasion wheel is moved away from the sample and rotationally indexed.