Patents by Inventor Shigeru Takezawa

Shigeru Takezawa has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11150182
    Abstract: A method for testing an analysis apparatus that analyzes a first fluid flowing through a pipe using light that has passed through a probe attached to and disposed inside the pipe such that a portion of a light path passes outside a housing of the probe. The method includes: after a second fluid that absorbs less of the light than the first fluid has been introduced into the pipe, introducing a third fluid having predetermined absorption characteristics into the housing of the probe; and analyzing the absorption characteristics of the third fluid using the light that has passed through the probe.
    Type: Grant
    Filed: September 5, 2018
    Date of Patent: October 19, 2021
    Assignee: YOKOGAWA ELECTRIC CORPORATION
    Inventors: Yoshihisa Hidaka, Gen Matsuno, Shigeru Takezawa, Hideko Tanaka, Kaori Sakuma, Akihiro Murata, Toshiki Ohara
  • Publication number: 20200256792
    Abstract: A method for testing an analysis apparatus that analyzes a first fluid flowing through a pipe using light that has passed through a probe attached to and disposed inside the pipe such that a portion of a light path passes outside a housing of the probe. The method includes: after a second fluid that absorbs less of the light than the first fluid has been introduced into the pipe, introducing a third fluid having predetermined absorption characteristics into the housing of the probe; and analyzing the absorption characteristics of the third fluid using the light that has passed through the probe.
    Type: Application
    Filed: September 5, 2018
    Publication date: August 13, 2020
    Applicant: YOKOGAWA ELECTRIC CORPORATION
    Inventors: Yoshihisa Hidaka, Gen Matsuno, Shigeru Takezawa, Hideko Tanaka, Kaori Sakuma, Akihiro Murata, Toshiki Ohara
  • Patent number: 10605724
    Abstract: A multi-component gas analysis system includes a spectrometric analysis device configured to obtain ratio of each of first components in a multi-component gas based on an absorption spectrum of light that has transmitted through the multi-component gas; a density measurement device configured to measure a first density of the multi-component gas; and a calculation device configured to calculate a ratio of each of second components in the multi-component gas using the ratio of each of the first components obtained by the spectrometric analysis device and the first density measured by the density measurement device, the second components being components that cannot be obtained by the spectrometric analysis device.
    Type: Grant
    Filed: May 23, 2016
    Date of Patent: March 31, 2020
    Assignee: Yokogawa Electric Corporation
    Inventors: Shigeru Takezawa, Takuya Yahagi, Yoshihisa Hidaka
  • Publication number: 20160349176
    Abstract: A multi-component gas analysis system includes a spectrometric analysis device configured to obtain ratio of each of first components in a multi-component gas based on an absorption spectrum of light that has transmitted through the multi-component gas; a density measurement device configured to measure a first density of the multi-component gas; and a calculation device configured to calculate a ratio of each of second components in the multi-component gas using the ratio of each of the first components obtained by the spectrometric analysis device and the first density measured by the density measurement device, the second components being components that cannot be obtained by the spectrometric analysis device.
    Type: Application
    Filed: May 23, 2016
    Publication date: December 1, 2016
    Applicant: YOKOGAWA ELECTRIC CORPORATION
    Inventors: Shigeru TAKEZAWA, Takuya YAHAGI, Yoshihisa HIDAKA
  • Patent number: 7219111
    Abstract: The objective is to realize a numeric value search apparatus and numeric value search method capable of rapidly searching for a numeric value of a prescribed rank. The present invention is characterized in that it comprises the following: a storage unit which stores multiple pieces of digitized numeric value data; a resolution specifying means which specifies a frequency distribution resolution; a frequency distribution creation unit which determines the frequency distribution of numeric value data in the storage unit using the resolution specified by this resolution specifying means; and a computation unit which determines the numeric value range or numeric value with the prescribed rank from the frequency distribution determined by this frequency distribution creation unit; wherein the resolution specifying means increases the resolution specified to the frequency distribution creation unit in steps, based on the computation results of the computation unit.
    Type: Grant
    Filed: September 17, 2003
    Date of Patent: May 15, 2007
    Assignee: Yokogawa Electric Corporation
    Inventors: Takuya Saitou, Yoshinobu Sugihara, Shigeru Takezawa
  • Patent number: 7219025
    Abstract: The present invention is intended to provide a waveform measuring instrument which can carry out signal processing and waveform parameter measurement with high accuracy and at high resolution. In a waveform measuring instrument configured to write measured signal waveforms into a memory after converting the waveforms to digital data, the present invention is characterized by providing an interpolation system which performs interpolation between the above digital data and writing the data obtained after interpolation into the above memory.
    Type: Grant
    Filed: December 13, 2002
    Date of Patent: May 15, 2007
    Assignee: Yokogawa Electric Corporation
    Inventors: Takuya Saitou, Shigeru Takezawa
  • Patent number: 6909979
    Abstract: The present invention is intended to provide a waveform measuring instrument whose waveform reproducibility in the equivalent time sampling system is improved. The present invention is characterized by that, in a waveform measuring instrument configured so that the repeated waveform data items are acquired and sent to the acquisition memory by means of the equivalent time sampling, the above acquisition memory is divided into a plurality of time slot regions corresponding to the interval of equivalent time sampling and a plurality of memory address groups is assigned to each time slot region.
    Type: Grant
    Filed: December 18, 2002
    Date of Patent: June 21, 2005
    Assignee: Yokogawa Electric Corporation
    Inventors: Takuya Saitou, Shigeru Takezawa
  • Publication number: 20040064490
    Abstract: The objective is to realize a numeric value search apparatus and numeric value search method capable of rapidly searching for a numeric value of a prescribed rank.
    Type: Application
    Filed: September 17, 2003
    Publication date: April 1, 2004
    Applicant: YOKOGAWA ELECTRIC CORPORATION
    Inventors: Takuya Saitou, Yoshinobu Sugihara, Shigeru Takezawa
  • Publication number: 20030120443
    Abstract: The present invention is intended to provide a waveform measuring instrument whose waveform reproducibility in the equivalent time sampling system is improved.
    Type: Application
    Filed: December 18, 2002
    Publication date: June 26, 2003
    Applicant: YOKOGAWA ELECTRIC CORPORATION
    Inventors: Takuya Saitou, Shigeru Takezawa
  • Publication number: 20030115003
    Abstract: The present invention is intended to provide a waveform measuring instrument which can carry out signal processing and waveform parameter measurement with high accuracy and at high resolution.
    Type: Application
    Filed: December 13, 2002
    Publication date: June 19, 2003
    Applicant: YOKOGAWA ELECTRIC CORPORATION
    Inventors: Takuya Saitou, Shigeru Takezawa