Patents by Inventor Shigeru Watari

Shigeru Watari has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Standard cell having test pad for probing and semiconductor integrated circuit device containing the standard cells
    Patent number: 5008727
    Abstract: A cell containing a test pad is defined as a standard cell, in the same fashion as a logic circuit, and is disposed and wired, together with logic circuit cells, in the internal circuit region excluding the input and output pad regions around the chip by a standard cell system. The cell containing the test pad possesses the pad region for feeding a reference potential in the cell, or the pad region capable of detecting a reference signal, or the layout pattern for expressing an arbitrary code for distinguishing the cell from other cells.
    Type: Grant
    Filed: January 23, 1989
    Date of Patent: April 16, 1991
    Assignee: Matsushita Electric Industrial Co., Ltd.
    Inventors: Joji Katsura, Yoshiyuki Takagi, Shigeru Watari