Patents by Inventor Shigetoshi Oshima

Shigetoshi Oshima has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for manufacturing detection coil for magnetic resonance measurement
    Patent number: 10571533
    Abstract: A manufacturing method includes forming a superconductive thin-film layer on a substrate and processing the superconductive thin-film layer into a shape of a detection coil for magnetic resonance measurement. Accordingly, a superconductive thin-film layer having the detection coil shape can be formed. The method further includes irradiating the shape-processed superconductive thin-film layer with ions. Accordingly, lattice defects serving as pinning can be formed in the superconductive thin-film layer.
    Type: Grant
    Filed: July 19, 2017
    Date of Patent: February 25, 2020
    Assignee: JEOL Ltd.
    Inventors: Shigetoshi Oshima, Shigenori Tsuji
  • Method for manufacturing detection coil for magnetic resonance measurement
    Patent number: 10539634
    Abstract: A manufacturing method includes forming a superconductive thin-film layer on a substrate and processing the superconductive thin-film layer into a shape of a detection coil for magnetic resonance measurement. Accordingly, a superconductive thin-film layer having the detection coil shape can be formed. The method further includes irradiating the shape-processed superconductive thin-film layer with ions. Accordingly, lattice defects serving as pinning can be formed in the superconductive thin-film layer.
    Type: Grant
    Filed: July 19, 2017
    Date of Patent: January 21, 2020
    Assignee: JEOL Ltd.
    Inventors: Shigetoshi Oshima, Shigenori Tsuji
  • Method for Manufacturing Detection Coil for Magnetic Resonance Measurement
    Publication number: 20180024207
    Abstract: A manufacturing method includes forming a superconductive thin-film layer on a substrate and processing the superconductive thin-film layer into a shape of a detection coil for magnetic resonance measurement. Accordingly, a superconductive thin-film layer having the detection coil shape can be formed. The method further includes irradiating the shape-processed superconductive thin-film layer with ions. Accordingly, lattice defects serving as pinning can be formed in the superconductive thin-film layer.
    Type: Application
    Filed: July 19, 2017
    Publication date: January 25, 2018
    Inventors: Shigetoshi Oshima, Shigenori Tsuji