Patents by Inventor Shigeyoshi FUJIHARA

Shigeyoshi FUJIHARA has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10712147
    Abstract: A measurement system includes a measuring instrument, a measurement control device, and a ranging device. The measuring instrument includes a base that is to be fixed to a tool shaft of a machining apparatus, a first rod and a second rod that are connected to the base, and a first measuring head and a second measuring head that are fixed to the respective rods and irradiate an object to be measured with measurement light. The measurement control device acquires a distance I between the first measuring head and an inner peripheral surface of the hole of the object to be measured, and a distance O between the second measuring head and an outer peripheral surface of the object from the ranging device, and calculates the thickness of the object on the basis of the distance I, the distance O, and a distance between the first and second measuring heads.
    Type: Grant
    Filed: August 29, 2019
    Date of Patent: July 14, 2020
    Assignee: Hitachi Metals, Ltd.
    Inventors: Masahiro Watanabe, Koji Utsumi, Shigeyoshi Fujihara, Yusuke Omuro, Shinji Kayama
  • Publication number: 20200103219
    Abstract: A measurement system includes a measuring instrument, a measurement control device, and a ranging device. The measuring instrument includes a base that is to be fixed to a tool shaft of a machining apparatus, a first rod and a second rod that are connected to the base, and a first measuring head and a second measuring head that are fixed to the respective rods and irradiate an object to be measured with measurement light. The measurement control device acquires a distance I between the first measuring head and an inner peripheral surface of the hole of the object to be measured, and a distance O between the second measuring head and an outer peripheral surface of the object from the ranging device, and calculates the thickness of the object on the basis of the distance I, the distance O, and a distance between the first and second measuring heads.
    Type: Application
    Filed: August 29, 2019
    Publication date: April 2, 2020
    Inventors: Masahiro WATANABE, Koji UTSUMI, Shigeyoshi FUJIHARA, Yusuke OMURO, Shinji KAYAMA
  • Patent number: 9459614
    Abstract: A machining condition estimating apparatus, and method, for estimating a machining condition to suppress a wear volume of a tool when conducting cutting work in a work machine are provided. For example, an analysis model presenting shapes of a tool and cutting material, may be defined, to be a target of analysis, and an initial value for use of analysis and change volume of the machining condition parameter as analysis parameters may be set up. Coordinates for tool and cutting material contact may be calculated. Moreover, a boundary movement rate, a maximum contact length, and a contact angle are calculated. A machining condition presented by the analysis parameter may also be searched and outputted.
    Type: Grant
    Filed: January 15, 2014
    Date of Patent: October 4, 2016
    Assignee: Hitachi Metals, Ltd.
    Inventors: Koji Utsumi, Shigeyoshi Fujihara, Tadashi Kitamura, Kenichi Inoue, Shinji Kayama
  • Publication number: 20140200709
    Abstract: A machining condition estimating apparatus, for estimating a long life-time machining condition, by suppressing boundary wears, from among plural numbers of choices of machining conditions, without building up database, comprise: a means for defining an analysis model presenting shapes of a tool and a cutting material, to be a target of analysis, and various kinds of machining condition parameters relating to relative positions between the tool and the cutting material; a means for setting up an initial value for use of analysis and change volume of the machining condition parameter as analysis parameters; a means for conducting geometric calculation of contact length, over which the tool and the cutting material of the model contact with, for each analysis parameter; a means for producing a distribution waveform, plotting the contact length “Lci” for each position “?i” of a point on each blade edge calculated, on “?i”?“Lci” coordinates, thereby to calculate a ratio of movement length of a boundary portion wi
    Type: Application
    Filed: January 15, 2014
    Publication date: July 17, 2014
    Applicant: Hitachi Metals, Ltd.
    Inventors: Koji UTSUMI, Shigeyoshi FUJIHARA, Tadashi KITAMURA, Kenichi INOUE, Shinji KAYAMA