Patents by Inventor SHIGEYUKI AKASE

SHIGEYUKI AKASE has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10991666
    Abstract: A location displacement of an electrode of a device relative to an electrode pad of a semiconductor element is detected based on a conduction state between the electrode pad of the semiconductor element and the electrode of the device. The electrode pad of the semiconductor element is segmented into multiple portions and a first pad through a fourth pad uniformly arranged. A location displacement detector determines that no location displacement has occurred when the electrode pad of the semiconductor element is conductive to the electrode of the device, and determines that a location displacement has occurred when the electrode pad of the semiconductor element is non-conductive to the electrode of the device.
    Type: Grant
    Filed: December 11, 2018
    Date of Patent: April 27, 2021
    Assignee: SHARP KABUSHIKI KAISHA
    Inventors: Yuta Ikawa, Kenichi Murakoshi, Hiroyoshi Higashisaka, Shigeyuki Akase
  • Publication number: 20190244575
    Abstract: A display apparatus includes: a plurality of pixel sections, each having a pixel element, to which image display signals are inputted; and test terminals via which the image display signals and test signals that are inputted from an outside source are selectively inputted to the plurality of pixel sections. A display apparatus includes: a plurality of pixel sections each having a pixel element; driver circuit sections that input image display signals to the plurality of pixel sections; and test terminals via which the image display signals and test signals that are inputted from an outside source are selectively inputted to the plurality of pixel sections, or the driver circuit sections generate test signals in accordance with test signals that are inputted from an outside source, and input the test signals thus generated to the plurality of pixel sections.
    Type: Application
    Filed: January 31, 2019
    Publication date: August 8, 2019
    Inventors: SHIGEYUKI AKASE, TSUYOSHI ONO, HIROYOSHI HIGASHISAKA
  • Publication number: 20190198471
    Abstract: A location displacement of an electrode of a device relative to an electrode pad of a semiconductor element is detected based on a conduction state between the electrode pad of the semiconductor element and the electrode of the device. The electrode pad of the semiconductor element is segmented into multiple portions and a first pad through a fourth pad uniformly arranged. A location displacement detector determines that no location displacement has occurred when the electrode pad of the semiconductor element is conductive to the electrode of the device, and determines that a location displacement has occurred when the electrode pad of the semiconductor element is non-conductive to the electrode of the device.
    Type: Application
    Filed: December 11, 2018
    Publication date: June 27, 2019
    Inventors: YUTA IKAWA, KENICHI MURAKOSHI, HIROYOSHI HIGASHISAKA, SHIGEYUKI AKASE