Patents by Inventor Shigeyuki Akiyama

Shigeyuki Akiyama has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10379039
    Abstract: An NDIR gas sensor has high responsiveness and less noise and includes a radiating section arranged to radiate an infrared ray, a detecting section arranged to detect the infrared ray radiated by the radiating section, and a sample cell extending between the radiating section and the detecting section along a route of the infrared ray and covering the entire circumference of the route of the infrared ray. The sample cell includes a plurality of cell elements extending along the route of the infrared ray. Side portions of the cell elements adjacent to each other overlap at an interval from each other.
    Type: Grant
    Filed: June 10, 2016
    Date of Patent: August 13, 2019
    Assignees: Kyoto University, Masa International Corp.
    Inventors: Yu Tanaka, Shigeyuki Akiyama
  • Publication number: 20180188162
    Abstract: An NDIR gas sensor has high responsiveness and less noise and includes a radiating section arranged to radiate an infrared ray, a detecting section arranged to detect the infrared ray radiated by the radiating section, and a sample cell extending between the radiating section and the detecting section along a route of the infrared ray and covering the entire circumference of the route of the infrared ray. The sample cell includes a plurality of cell elements extending along the route of the infrared ray. Side portions of the cell elements adjacent to each other overlap at an interval from each other.
    Type: Application
    Filed: June 10, 2016
    Publication date: July 5, 2018
    Inventors: Yu TANAKA, Shigeyuki AKIYAMA
  • Patent number: 9962647
    Abstract: This invention provides a zero gas refiner for CO2 concentration measurement device that can continuously refine a zero gas that is preferable for CO2 concentration measurement. This invention adopts the zero gas refiner comprising a water adsorbent and a CO2 adsorbent that desorb an adsorbed component and restore an adsorption ability by being heated to a predetermined restoration temperature, a refiner body that adsorbs water and CO2 in an introduced sample gas or air in this order by the use of the water adsorbent and the CO2 adsorbent housed inside of the refiner body so as to refine a zero gas and that leads out the zero gas, and a heating mechanism that applies heat to the refiner body at a time when the adsorption ability of the water adsorbent or the CO2 adsorbent drops to an amount that is less than or equal to a predetermined amount.
    Type: Grant
    Filed: June 10, 2015
    Date of Patent: May 8, 2018
    Assignee: HORIBA, Ltd.
    Inventors: Yusuke Mizuno, Shigeyuki Akiyama, Tomomichi Oka
  • Publication number: 20150360171
    Abstract: This invention provides a zero gas refiner for CO2 concentration measurement device that can continuously refine a zero gas that is preferable for CO2 concentration measurement. This invention adopts the zero gas refiner comprising a water adsorbent and a CO2 adsorbent that desorb an adsorbed component and restore an adsorption ability by being heated to a predetermined restoration temperature, a refiner body that adsorbs water and CO2 in an introduced sample gas or air in this order by the use of the water adsorbent and the CO2 adsorbent housed inside of the refiner body so as to refine a zero gas and that leads out the zero gas, and a heating mechanism that applies heat to the refiner body at a time when the adsorption ability of the water adsorbent or the CO2 adsorbent drops to an amount that is less than or equal to a predetermined amount.
    Type: Application
    Filed: June 10, 2015
    Publication date: December 17, 2015
    Inventors: Yusuke MIZUNO, Shigeyuki AKIYAMA, Tomomichi OKA
  • Publication number: 20130305813
    Abstract: A process gas analyzing device is provided. The process gas analyzing device may include a sample gas introducing unit configured to introduce a process gas including a sublimable aromatic compound; a sublimable aromatic compound removing unit configured to remove the sublimable aromatic compound; a process gas pretreatment unit arranged between the sample gas introducing unit and the sublimable aromatic compound removing unit; and a gas analyzing unit arranged in a downstream position of the sublimable aromatic compound removing unit. The sublimable aromatic compound removing unit may include an adsorbent of activated carbon including a non-volatile acid.
    Type: Application
    Filed: May 20, 2013
    Publication date: November 21, 2013
    Applicant: HORIBA, Ltd.
    Inventors: Shigeyuki Akiyama, Yuki Imamura
  • Patent number: 8276469
    Abstract: A stack-gas measuring apparatus includes a sample introducing unit (sampling unit and heating conduit pipe) for introducing stack-gas, a cooling unit (containing wet filter) in which dust components in the stack-gas are agglomerated, a filter column containing a filter element made of a polymer material for collecting the dust components, a mist scrubber which is disposed downstream of the filter column and which contains an adsorbent for removing acid mist in the stack-gas, and an analyzer in which the cleaning-processed gas is introduced to measure a particular component in the stack-gas.
    Type: Grant
    Filed: August 28, 2009
    Date of Patent: October 2, 2012
    Assignee: HORIBA, Ltd.
    Inventors: Shigeyuki Akiyama, Atsushi Yamamoto, Takuji Oida
  • Patent number: 7928033
    Abstract: The present invention relates to a catalyst for reducing mercury, which comprises a reagent comprising any of the sulfites of potassium, sodium, calcium and magnesium, or any of the phosphates thereof, or a combination of them, as a main reagent of a catalyst component. And the present invention relates to the catalyst for reducing mercury, wherein the catalyst component is mixed with a different salt as an agent for inhibiting crystallization of the catalyst component.
    Type: Grant
    Filed: March 15, 2007
    Date of Patent: April 19, 2011
    Assignees: Horiba, Ltd., Nippon Instruments Corporation
    Inventors: Shigeyuki Akiyama, Junji Kato, Fujio Koga, Koji Ishikawa
  • Publication number: 20110064620
    Abstract: The present invention relates to a catalyst for reducing mercury, which comprises a reagent comprising any of the sulfites of potassium, sodium, calcium and magnesium, or any of the phosphates thereof, or a combination of them, as a main reagent of a catalyst component. And the present invention relates to the catalyst for reducing mercury, wherein the catalyst component is mixed with a different salt as an agent for inhibiting crystallization of the catalyst component.
    Type: Application
    Filed: November 16, 2010
    Publication date: March 17, 2011
    Inventors: Shigeyuki Akiyama, Junji Kato, Fujio Koga, Koji Ishikawa
  • Publication number: 20100050790
    Abstract: A stack-gas measuring apparatus includes a sample introducing unit (sampling unit and heating conduit pipe) for introducing stack-gas, a cooling unit (containing wet filter ) in which dust components in the stack-gas are agglomerated, a filter column containing a filter element made of a polymer material for collecting the dust components, a mist scrubber which is disposed downstream of the filter column and which contains an adsorbent for removing acid mist in the stack-gas, and an analyzer in which the cleaning-processed gas is introduced to measure a particular component in the stack-gas.
    Type: Application
    Filed: August 28, 2009
    Publication date: March 4, 2010
    Applicant: HORIBA, LTD.
    Inventors: Shigeyuki Akiyama, Atsushi Yamamoto, Takuji Oida
  • Publication number: 20080188002
    Abstract: There is provided a method and apparatus for removing selenium oxide in a sample as well as a method and apparatus for measuring mercury in coal combustion exhaust gas by using the same. The apparatus for removing selenium oxide in a sample, comprising: (1) a heating introduction path for heating a sample, (2) a primary cooling unit having a flow path through which the heated sample flows countercurrently to cooling water, whereby the heated sample is mixed with, and cooled by, cooling water, (3) a secondary cooling unit having a spiral flow path for cooling the mixed gas and having a space for gas/liquid separation at the end of the spiral flow path, (4) a regenerator for introducing condensed water from the secondary cooling unit, and (5) a condensed water-cooling path for connecting the regenerator to the primary cooling unit.
    Type: Application
    Filed: February 1, 2008
    Publication date: August 7, 2008
    Inventors: Junji Kato, Shigeyuki Akiyama, Fujio Koga, Koji Ishikawa
  • Publication number: 20070232488
    Abstract: The present invention relates to a catalyst for reducing mercury, which comprises a reagent comprising any of the sulfites of potassium, sodium, calcium and magnesium, or any of the phosphates thereof, or a combination of them, as a main reagent of a catalyst component. And the present invention relates to the catalyst for reducing mercury, wherein the catalyst component is mixed with a different salt as an agent for inhibiting crystallization of the catalyst component.
    Type: Application
    Filed: March 15, 2007
    Publication date: October 4, 2007
    Inventors: Shigeyuki Akiyama, Junji Kato, Fujio Koga, Koji Ishikawa
  • Patent number: 7227642
    Abstract: This invention relates to a multi-component absorbance monitor, and the object is to provide a general-purpose and highly accurate compact absorbance monitor. Disclosed is an absorbance monitor including a light source, a sample cell and a plurality of detectors as elements, wherein a light collecting member is arranged between the light source and one detector, and an inside wall of the light collecting member has a site for guiding a part of light from the light source, that is, a light guiding opening, and light from the light guiding opening enters another detector. Preferably, the light collecting member lies between the light source and the sample cell. Preferably, an optical element used for another detector described above is arranged in the light guiding opening and adjacently to a light path formed by the light collecting member.
    Type: Grant
    Filed: October 4, 2004
    Date of Patent: June 5, 2007
    Assignee: Horiba, Ltd.
    Inventors: Takuji Oida, Shigeyuki Akiyama, Masahiko Endo, Norikazu Iwata, Satoshi Inoue, Masahiko Fujiwara
  • Publication number: 20050082483
    Abstract: This invention relates to a multi-component absorbance monitor, and the object is to provide a general-purpose and highly accurate compact absorbance monitor. Disclosed is an absorbance monitor including a light source, a sample cell and a plurality of detectors as elements, wherein a light collecting member is arranged between the light source and one detector, and an inside wall of the light collecting member has a site for guiding a part of light from the light source, that is, a light guiding opening, and light from the light guiding opening enters another detector. Preferably, the light collecting member lies between the light source and the sample cell. Preferably, an optical element used for another detector described above is arranged in the light guiding opening and adjacently to a light path formed by the light collecting member.
    Type: Application
    Filed: October 4, 2004
    Publication date: April 21, 2005
    Inventors: Takuji Oida, Shigeyuki Akiyama, Masahiko Endo, Norikazu Iwata, Satoshi Inoue, Masahiko Fujiwara
  • Patent number: 6878339
    Abstract: The present invention provides a NOx-concentration measuring apparatus D for quantitatively analyzing the concentration of NOx contained in a sample gas. The measuring apparatus D comprises a sampling probe for obtaining the sample gas, a drain separator 2 for condensing moisture contained in the sample gas as a condensed water and separating the condensed water from the sample gas, an NO2 converter 3 for converting NO2 contained in the sample gas into NO, a secondary cooling device 7 for additionally cooling the sample gas, and an NO analyzer 1, arranged in this order with respect to a sample-gas line of the NOx-concentration measuring apparatus. The drain separator is a high-flow-velocity cooling type drain separator. Further, the sample-gas line between the sampling probe and the drain separator is heated and/or thermally insulated over the entire length thereof. The measuring apparatus can provide a high-precision measurement while suppressing NO2 loss.
    Type: Grant
    Filed: February 19, 2003
    Date of Patent: April 12, 2005
    Assignee: Horiba, Ltd.
    Inventors: Shigeyuki Akiyama, Satoshi Inoue, Masahiko Fujiwara
  • Publication number: 20030156982
    Abstract: The present invention provides a NOx-concentration measuring apparatus D for quantitatively analyzing the concentration of NOx contained in a sample gas. The measuring apparatus D comprises a sampling probe for obtaining the sample gas, a drain separator 2 for condensing moisture contained in the sample gas as a condensed water and separating the condensed water from the sample gas, an NO2 converter 3 for converting NO2 contained in the sample gas into NO, a secondary cooling device 7 for additionally cooling the sample gas, and an NO analyzer 1, arranged in this order with respect to a sample-gas line of the NOx-concentration measuring apparatus. The drain separator is a high-flow-velocity cooling type drain separator.
    Type: Application
    Filed: February 19, 2003
    Publication date: August 21, 2003
    Applicant: HORIBA, Ltd.
    Inventors: Shigeyuki Akiyama, Satoshi Inoue, Masahiko Fujiwara
  • Patent number: 5810928
    Abstract: A method of measuring gas component Concentrations of special material gases for semiconductor, and a semiconductor equipment are provided. The method and apparatus can be incorporated in a gas pipe line system in an inline manner, and measure the component and concentration of a gas flowing through a gas pipe line or a gas with which the gas pipe line system is filled, thereby eliminating any erroneous connection. In the method of measuring gas component concentrations of special material gases for semiconductor, as means for attaining the objects, an infrared gas detector is disposed in a gas pipe line between a gas cylinder containing a special material gas for semiconductor and a semiconductor producing section, so that the gas component and concentration are measured in an inline manner. An apparatus for supplying special material gases for semiconductor is also provided.
    Type: Grant
    Filed: November 16, 1995
    Date of Patent: September 22, 1998
    Assignees: Mitsubishi Corporation, Horiba Co. Ltd., Stec, Inc.
    Inventors: Hiroyuki Harada, Toshihiko Uno, Shigeyuki Akiyama, Tetuo Shimizu
  • Patent number: 5780716
    Abstract: A gas analyzing apparatus includes a sample gas line with a sample line valve for providing a sample gas, and a reference gas line with a reference line valve for providing a reference gas. A first gas analyzer is connected to the sample line downstream of the sample line valve, and a second gas analyzer is connected to both the sample and reference gas lines downstream of the valves. The lines are configured such that sample gas and reference gas may be alternately provided to the second gas analyzer either directly or indirectly via the first gas analyzer.
    Type: Grant
    Filed: August 22, 1996
    Date of Patent: July 14, 1998
    Assignee: Horiba, Ltd.
    Inventors: Naohito Shimizu, Shigeyuki Akiyama, Masahiko Fujiwara, Satoshi Inoue, Takuji Oida
  • Patent number: 5773828
    Abstract: A gas analyzer has a simple composition and can measure multi-components at a high accuracy. A plurality of measuring cells, including a case where the cells are different in length from each other, communicate sequentially with each other through a communication part to form a single gas path. A cut-on filter as an infrared penetration/reflection means for diffracting spectrally an infrared wavelength is provided on a light source side. A NO.sub.X measuring cell 3 having a cell length of about 60 mm and a CO.sub.2 measuring cell 7 having a cell length of about 1 mm which communicate through the communication part with each other, and a capacitor microphone (an infrared-ray detector for NO.sub.X) and a pyroelectric detector (an infrared-ray detector for CO.sub.2) are provided on the infrared penetration and reflection sides of the optical filter.
    Type: Grant
    Filed: February 23, 1996
    Date of Patent: June 30, 1998
    Assignee: Horiba, Ltd.
    Inventors: Shigeyuki Akiyama, Masahiko Fujiwara, Takuji Oida, Naohito Shimizu, Aritoshi Yoneda, Toshikazu Ohnishi
  • Patent number: 5693945
    Abstract: An ultraviolet light source is provided on one end of a cell into which a sample gas is introduced. A beam splitter for dividing beams which have been transmitted through the cell into two optical paths is provided on the other end of the cell. A first detector is provided in one optical path, and a second detector is provided in the other optical path. A gas filter filled with a component to be measured is positioned between the detectors and beam splitter so that a concentration of the component to be measured may be obtained on the basis of a difference between the output of the first detector and the product of the output of the second detector and an appointed constant. Influences resulting from components coexisting in the sample gas are reduced. Alternatively, an infrared light source may be provided on one end of a sample cell. A gas filter filled with a gas the same as the gas to be measured is provided at the other end of the sample cell.
    Type: Grant
    Filed: July 28, 1995
    Date of Patent: December 2, 1997
    Assignee: Horiba Ltd.
    Inventors: Shigeyuki Akiyama, Masahiko Fujiwara, Fujio Koga, Naohito Shimizu, Toshihiko Uno, Aritoshi Yoneda
  • Patent number: 5572032
    Abstract: A gas analyzer capable of simultaneously detecting two or more components in a single-cell mode and a gas-analyzing mechanism suitable for simultaneously detecting two or more components in a cross-flow modulation single-cell mode are provided. A gas analyzer unit includes two measuring cells, light sources provided on one end side of each of the measuring cells, gas filter cells with interferential gaseous components hindering a detection of components to be measured enclosed provided on the other end side of each of the measuring cells, beam splitters included in two gas filter cells, first- and fourth and second- and third detectors provided on the side of transmitting position and the side of reflecting position, respectively, of each of the beam splitters and a sampling device connected with a rotary valve.
    Type: Grant
    Filed: November 18, 1994
    Date of Patent: November 5, 1996
    Assignee: Horiba, Ltd.
    Inventors: Masahiko Fujiwara, Shigeyuki Akiyama, Masahiko Ishida, Satoshi Inoue