Patents by Inventor Shigeyuki Ueno

Shigeyuki Ueno has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8880846
    Abstract: A semiconductor device according to the present invention includes a first address generation unit that includes a first register group and generates a table address by a cyclically repeating first pattern using a value stored to the first register group, a second address generation unit that includes a second register group and generates an access address by a cyclically repeating second pattern using a value stored to the second register group and parameter information determined by the table address, and a control unit that outputs setting information to be supplied to the first register group and the second register group. Further, the semiconductor device performs at least one of a read process and a write process of data from and to a data memory using the access address.
    Type: Grant
    Filed: January 11, 2013
    Date of Patent: November 4, 2014
    Assignee: Renesas Electronics Corporation
    Inventors: Hiroyuki Nakajima, Shigeyuki Ueno
  • Patent number: 8621262
    Abstract: A semiconductor integrated circuit, including a first master circuit, a second master circuit, a first slave circuit assigned to the first master circuit, and determines that an access request signal is sent from the first master circuit when an identification information is a first value, a first bus coupled to the first master circuit, the second master circuit, and the first slave circuit, a bus controller is configured to transmit the access request signal to the first slave circuit via the first bus, a system controller directs the bus controller to substitute the first value for a second value on the identification information of the access request signal received from the second master circuit when the first master circuit is in the deactivated state.
    Type: Grant
    Filed: September 14, 2012
    Date of Patent: December 31, 2013
    Assignee: Renesas Electronics Corporation
    Inventors: Shigeyuki Ueno, Hiroyuki Nakajima
  • Publication number: 20130013831
    Abstract: A semiconductor integrated circuit, including a first master circuit, a second master circuit, a first slave circuit assigned to the first master circuit, and determines that an access request signal is sent from the first master circuit when an identification information is a first value, a first bus coupled to the first master circuit, the second master circuit, and the first slave circuit, a bus controller is configured to transmit the access request signal to the first slave circuit via the first bus, a system controller directs the bus controller to substitute the first value for a second value on the identification information of the access request signal received from the second master circuit when the first master circuit is in the deactivated state.
    Type: Application
    Filed: September 14, 2012
    Publication date: January 10, 2013
    Applicant: Renesas Electronics Corporation
    Inventors: Shigeyuki UENO, Hiroyuki Nakajima
  • Patent number: 7636870
    Abstract: To provide a debugging system, debugging method, and a semiconductor integrated circuit device capable of collecting debug-target information with accuracy and improving debug efficiency. A semiconductor integrated circuit device according to an embodiment of the present invention includes: subsystems; a break detecting unit detecting that a program execution of a CPU core in one subsystem satisfies a predetermined break condition; and a break selecting unit stopping operations of one selected from the subsystems in accordance with the detection result of the break detecting unit.
    Type: Grant
    Filed: October 26, 2006
    Date of Patent: December 22, 2009
    Assignee: NEC Electronics Corporation
    Inventor: Shigeyuki Ueno
  • Publication number: 20090085626
    Abstract: When a master circuit is in an inactive state, a slave circuit assigned to the master circuit is not used. Accordingly, the use efficiency of system recourses is decreased. To solve the above problem, a semiconductor integrated circuit reassigns a M2 region of a slave circuit, previously assigned to a first master circuit, to a second master circuit. That is to say, the M2 region of the slave circuit previously assigned to the first master circuit is reassigned to the second master circuit based on the operational status of the first master circuit. This improves the use efficiency of system resources of the semiconductor integrated circuit.
    Type: Application
    Filed: September 11, 2008
    Publication date: April 2, 2009
    Applicant: NEC ELECTRONICS CORPORATION
    Inventors: Shigeyuki Ueno, Hiroyuki Nakajima
  • Publication number: 20080072212
    Abstract: A semiconductor integrated circuit has a CPU executing a target program to be debugged, a peripheral circuit generating an internal signal in response to an operation of the CPU, and a monitor unit storing the internal signal of the peripheral circuit in response to a first status signal from the CPU executing the target program.
    Type: Application
    Filed: September 13, 2007
    Publication date: March 20, 2008
    Inventor: Shigeyuki Ueno
  • Publication number: 20070101198
    Abstract: To provide a debugging system, debugging method, and a semiconductor integrated circuit device capable of collecting debug-target information with accuracy and improving debug efficiency. A semiconductor integrated circuit device according to an embodiment of the present invention includes: subsystems; a break detecting unit detecting that a program execution of a CPU core in one subsystem satisfies a predetermined break condition; and a break selecting unit stopping operations of one selected from the subsystems in accordance with the detection result of the break detecting unit.
    Type: Application
    Filed: October 26, 2006
    Publication date: May 3, 2007
    Applicant: NEC ELECTRONICS CORPORATION
    Inventor: Shigeyuki Ueno