Patents by Inventor Shih-Bou Chang

Shih-Bou Chang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and system for generating test pulses to test electronic elements
    Patent number: 7369957
    Abstract: A method and system for generating test pulses to test electronic elements are disclosed. After determining a transmission clock, which is smaller than a test clock, and a serial of predetermined pulses, the serial of data bits corresponding to the serial of predetermined pulses can be generated. Then the serial of data bits can be transformed into a serial data stream for transmission. By transmitting the serial data stream according to the transmission clock, the serial of predetermined pulses corresponding to the test clock can be generated.
    Type: Grant
    Filed: February 20, 2007
    Date of Patent: May 6, 2008
    Assignee: King Yuan Electronics Co., Ltd.
    Inventors: Shih-Bou Chang, Diann-Fang Lin
  • Method and system for generating test pulses to test electronic elements
    Publication number: 20070156368
    Abstract: A method and system for generating test pulses to test electronic elements are disclosed. After determining a transmission clock, which is smaller than a test clock, and a serial of predetermined pulses, the serial of data bits corresponding to the serial of predetermined pulses can be generated. Then the serial of data bits can be transformed into a serial data stream for transmission. By transmitting the serial data stream according to the transmission clock, the serial of predetermined pulses corresponding to the test clock can be generated.
    Type: Application
    Filed: February 20, 2007
    Publication date: July 5, 2007
    Inventors: Shih-Bou Chang, Diann-Fang Lin
  • Method and system for generating test pulses to test electronic elements
    Publication number: 20050209805
    Abstract: A method and system for generating test pulses to test electronic elements are disclosed. After determining a transmission clock, which is smaller than a test clock, and a serial of predetermined pulses, the serial of data bits corresponding to the serial of predetermined pulses can be generated. Then the serial of data bits can be transformed into a serial data stream for transmission. By transmitting the serial data stream according to the transmission clock, the serial of predetermined pulses corresponding to the test clock can be generated.
    Type: Application
    Filed: September 8, 2004
    Publication date: September 22, 2005
    Inventors: Shih-Bou Chang, Diann-Fang Lin