Patents by Inventor SHIH-EN JHONG

SHIH-EN JHONG has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Optical film defect detection method and system thereof
    Patent number: 9582872
    Abstract: An optical defect detection method and a system thereof are disclosed. The detection method includes a process of detecting an image of an optical film by an optical detector. The image is converted into a clean detection image by conducting the following processes: uniforming the brightness, enhancing the contrast, filtering off the noise, smoothing the image and binarizing the image. A relative relation between a pixel and the surrounding pixels of the clean detection image is converted into a spatial relation sequence model. The spatial relation sequence model is compared to the different types of the defect sequence model, so that the defect type of the optical film is identified as a point defect, a lack of material defect or a ripple defect.
    Type: Grant
    Filed: December 11, 2015
    Date of Patent: February 28, 2017
    Assignee: YUAN ZE UNIVERSITY
    Inventors: Chia-Yu Hsu, Shih-En Jhong, Kuo-Hua Lai, Chien-Lung Chan
  • OPTICAL FILM DEFECT DETECTION METHOD AND SYSTEM THEREOF
    Publication number: 20170004612
    Abstract: An optical defect detection method and a system thereof are disclosed. The detection method includes a process of detecting an image of an optical film by an optical detector. The image is converted into a clean detection image by conducting the following processes: uniforming the brightness, enhancing the contrast, filtering off the noise, smoothing the image and binarizing the image. A relative relation between a pixel and the surrounding pixels of the clean detection image is converted into a spatial relation sequence model. The spatial relation sequence model is compared to the different types of the defect sequence model, so that the defect type of the optical film is identified as a point defect, a lack of material defect or a ripple defect.
    Type: Application
    Filed: December 11, 2015
    Publication date: January 5, 2017
    Inventors: CHIA-YU HSU, SHIH-EN JHONG, KUO-HUA LAI, CHIEN-LUNG CHAN