Patents by Inventor Shih-Yi Wu

Shih-Yi Wu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20210118125
    Abstract: A hot spot defect detecting method and a hot spot defect detecting system are provided. In the method, hot spots are extracted from a design of a semiconductor product to define a hot spot map comprising hot spot groups, wherein local patterns in a same context of the design yielding a same image content are defined as a same hot spot group. During runtime, defect images obtained by an inspection tool performing hot scans on a wafer manufactured with the design are acquired and the hot spot map is aligned to each defect image to locate the hot spot groups. The hot spot defects in each defect image are detected by dynamically mapping the hot spot groups located in each defect image to a plurality of threshold regions and respectively performing automatic thresholding on pixel values of the hot spots of each hot spot group in the corresponding threshold region.
    Type: Application
    Filed: December 15, 2020
    Publication date: April 22, 2021
    Applicant: Taiwan Semiconductor Manufacturing Company, Ltd.
    Inventors: Chien-Huei Chen, Pei-Chao Su, Xiaomeng Chen, Chan-Ming Chang, Shih-Yung Chen, Hung-Yi Chung, Kuang-Shing Chen, Li-Jou Lee, Yung-Cheng Lin, Wei-Chen Wu, Shih-Chang Wang, Chien-An Lin
  • Publication number: 20210081898
    Abstract: A human resource management method, comprising: obtaining a feature parameter associated with an employee; performing a prediction algorithm based on machine learning according to the feature parameter to output a human resource index; and performing a classification procedure to convert the human resource index to an understandable information.
    Type: Application
    Filed: November 25, 2019
    Publication date: March 18, 2021
    Applicants: INVENTEC (PUDONG) TECHNOLOGY CORPORATION, INVENTEC CORPORATION
    Inventors: Shih-Yi WU, Trista Pei-Chun CHEN, Wei-Chao CHEN
  • Patent number: 10915169
    Abstract: Correction method and device for an eye-tracker are provided. A non-predetermined scene frame is provided and analyzed to obtain a salient feature information, which is in-turn used to correct an eye-tracking operation. The correction can be done at the initial or during the wearing of an eye-tracker.
    Type: Grant
    Filed: March 11, 2019
    Date of Patent: February 9, 2021
    Assignee: National Taiwan University
    Inventors: Shao-Yi Chien, Chia-Yang Chang, Shih-Yi Wu
  • Publication number: 20200192471
    Abstract: Eye-tracking methods and devices are provided for reducing operating workload. One sub frame of an eye frame and/or a scene frame is used to estimate the eyeball position. Such an approach can reduce operating workload and power consumption.
    Type: Application
    Filed: March 11, 2019
    Publication date: June 18, 2020
    Inventors: Shao-Yi Chien, Yu-Sheng Lin, Shih-Yi Wu
  • Publication number: 20200167957
    Abstract: Correction method and device for an eye-tracker are provided. A non-predetermined scene frame is provided and analyzed to obtain a salient feature information, which is in-turn used to correct an eye-tracking operation. The correction can be done at the initial or during the wearing of an eye-tracker.
    Type: Application
    Filed: March 11, 2019
    Publication date: May 28, 2020
    Inventors: Shao-Yi Chien, Chia-Yang Chang, Shih-Yi Wu