Patents by Inventor Shin-Ae Lee

Shin-Ae Lee has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20040104447
    Abstract: An integrated circuit structure can include an isolation structure that electrically isolates an active region of an integrated circuit substrate from adjacent active regions and an insulation layer that extends from the isolation structure to beneath the active region. An epitaxial silicon layer extends from the active region through the insulation layer to a substrate beneath the insulation layer.
    Type: Application
    Filed: November 12, 2003
    Publication date: June 3, 2004
    Inventors: Sung-Min Kim, Dong-Gun Park, Chang-Sub Lee, Jeong-Dong Choe, Shin-Ae Lee, Seong-Ho Kim
  • Publication number: 20040084746
    Abstract: A self-aligned contact structure and a method of forming the same include selected neighboring gate electrodes with adjacent sidewalls that are configured to angle toward each other. The angled surfaces of the gate electrodes can be protected using a liner layer that can extend the length of the contact window to define the sidewalls of the contact window.
    Type: Application
    Filed: October 29, 2003
    Publication date: May 6, 2004
    Inventors: Seong-Ho Kim, Dong-Gun Park, Chang-Sub Lee, Jeong-Dong Choe, Sung-Min Kim, Shin-Ae Lee
  • Publication number: 20040077148
    Abstract: Transistors of a semiconductor device are fabricated by forming a plurality of gate electrodes on a semiconductor substrate. The gate electrodes are used as an ion implantation mask. A first impurity is ion implanted below the exposed surface of the semiconductor substrate to form first impurity regions. A second impurity is ion implanted in two directions by tilting the implantation to a predetermined angle to thereby form second impurity regions separated from the first impurity regions. The second impurity regions are formed below the channel region under the gate electrodes. The second impurity regions may overlap to provide a higher impurity concentration below a portion of the channel.
    Type: Application
    Filed: June 10, 2003
    Publication date: April 22, 2004
    Inventors: Chang-Sub Lee, Jeong-Dong Choi, Seong-Ho Kim, Shin-Ae Lee, Sung-Min Kim, Dong-Gun Park
  • Publication number: 20040063286
    Abstract: Integrated circuit field effect transistor devices include a substrate having a surface and an active channel pattern on the surface. The active channel pattern includes channels that are stacked upon one another and are spaced apart from one another to define at least one tunnel between adjacent channels. A gate electrode surrounds the channels and extends through the at least one tunnel. A pair of source/drain regions also is provided. Integrated circuit field effect transistors are manufactured, by forming a pre-active pattern on a surface of a substrate. The pre-active pattern includes a series of interchannel layers and channel layers stacked alternately upon each other. Source/drain regions are formed on the substrate at opposite ends of the pre-active pattern. The interchannel layers are selectively removed to form tunnels. A gate electrode is formed in the tunnels and surrounding the channels.
    Type: Application
    Filed: July 1, 2003
    Publication date: April 1, 2004
    Inventors: Sung-Min Kim, Dong-Gun Park, Chang-Sub Lee, Jeong-Dong Choe, Shin-Ae Lee, Seong-Ho Kim