Patents by Inventor Shin-Chan Kang
Shin-Chan Kang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 8199157Abstract: A system on chip (Soc) includes a system bus, a plurality of sub-systems, an image processing logic block, an image memory interface and an image processing memory block. The sub-systems are respectively connected to the system bus. The image processing logic block is connected to the system bus. The image processing logic block performs an image processing. The image processing logic block is included in a first power domain. The image memory interface is connected to the system bus and the image processing logic block. The image processing memory block is connected to the image memory interface. The image processing memory block is used for the image processing. The image memory interface and the image processing memory block are included in a second power domain different from the first power domain.Type: GrantFiled: January 31, 2008Date of Patent: June 12, 2012Assignee: Samsung Electronics Co., Ltd.Inventors: Sun-Hee Park, Shin-Chan Kang
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Patent number: 8055946Abstract: A semiconductor IC capable of debugging two or more processors at the same time using a single debugger and a semiconductor IC test system. The semiconductor IC includes processors operating at different frequencies, a trigger circuit which causes all of the processors to be in a debugging state when one of the processors is in the debugging state, and a JTAG circuit applying a boundary scan operation to the processors connected to a JTAG pin in series.Type: GrantFiled: December 8, 2009Date of Patent: November 8, 2011Assignee: Samsung Electronics Co., Ltd.Inventors: Shin-Chan Kang, Sun-Kyu Kim
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Patent number: 7818527Abstract: A wrapper circuit effectively converts a muxed-type memory (having time-multiplexed address and data lines) into a non-muxed type memory as seen by the controller (a non-muxed type memory controller). Wrapper circuit includes a select circuit (e.g., multiplexer) and an input/output buffer. The select circuit receives write data and an address from a non-muxed type memory controller and selects either the write data or the address according to a first control signal. The input/output buffer receives the selection among the write data and the address and passes the write data or the address to a muxed type memory. The input/output buffer also passes read data received from the memory to the memory controller.Type: GrantFiled: July 28, 2006Date of Patent: October 19, 2010Assignee: Samsung Electronics Co., Ltd.Inventor: Shin-Chan Kang
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Patent number: 7707340Abstract: A bus system, which may prevent data from being incorrectly transferred when an early termination occurs during a burst mode, may include a bus, for example, an advanced high-performance bus (AHB), at least one bus master device, a bus arbiter and at least one transfer mode selection circuit. The at least one bus master device may generate a burst cycle control signal, a transfer start signal and a bus control request signal for requesting control of the bus, and may be activated in response to a bus control grant signal, so as to exchange data via the bus. The bus arbiter may generate the bus control grant signal in response to the bus control request signal and provide the bus control grant signal to the bus master device. The at least one transfer mode selection circuit may convert a burst mode into a single mode to generate a selection signal, when the bus control grant signal is deactivated before a burst mode operation is completed.Type: GrantFiled: July 25, 2008Date of Patent: April 27, 2010Assignee: Samsung Electronics Co., Ltd.Inventors: Shin-Chan Kang, Jae-Young Lee, Kyo-Keun Ku
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Publication number: 20100088564Abstract: A semiconductor IC capable of debugging two or more processors at the same time by means of a single debugger and a semiconductor IC test system. The semiconductor IC includes processors operating at different frequencies, a trigger circuit which causes all of the processors to be in a debugging state when one of the processors is in the debugging state, and a JTAG circuit applying a boundary scan operation to the processors connected to a JTAG pin in series.Type: ApplicationFiled: December 8, 2009Publication date: April 8, 2010Applicant: SAMSUNG ELECTRONICS CO., LTD.Inventors: Shin-Chan KANG, Sun-Kyu KIM
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Patent number: 7644310Abstract: A semiconductor IC capable of debugging two or more processors at the same time by means of a single debugger and a semiconductor IC test system. The semiconductor IC includes processors operating at different frequencies, a trigger circuit which causes all of the processors to be in a debugging state when one of the processors is in the debugging state, and a JTAG circuit applying a boundary scan operation to the processors connected to a JTAG pin in series.Type: GrantFiled: August 19, 2008Date of Patent: January 5, 2010Assignee: Samsung Electronics Co., Ltd.Inventors: Shin-Chan Kang, Sun-Kyu Kim
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Publication number: 20080307260Abstract: A semiconductor IC capable of debugging two or more processors at the same time by means of a single debugger and a semiconductor IC test system. The semiconductor IC includes processors operating at different frequencies, a trigger circuit which causes all of the processors to be in a debugging state when one of the processors is in the debugging state, and a JTAG circuit applying a boundary scan operation to the processors connected to a JTAG pin in series.Type: ApplicationFiled: August 19, 2008Publication date: December 11, 2008Applicant: SAMSUNG ELECTRONICS CO., LTD.Inventors: Shin-Chan KANG, Sun-Kyu KIM
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Publication number: 20080288688Abstract: A bus system, which may prevent data from being incorrectly transferred when an early termination occurs during a burst mode, may include a bus, for example, an advanced high-performance bus (AHB), at least one bus master device, a bus arbiter and at least one transfer mode selection circuit. The at least one bus master device may generate a burst cycle control signal, a transfer start signal and a bus control request signal for requesting control of the bus, and may be activated in response to a bus control grant signal, so as to exchange data via the bus. The bus arbiter may generate the bus control grant signal in response to the bus control request signal and provide the bus control grant signal to the bus master device. The at least one transfer mode selection circuit may convert a burst mode into a single mode to generate a selection signal, when the bus control grant signal is deactivated before a burst mode operation is completed.Type: ApplicationFiled: July 25, 2008Publication date: November 20, 2008Inventors: Shin-Chan Kang, Jae-Young Lee, Kyo-Keun Ku
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Patent number: 7418535Abstract: A bus system, which may prevent data from being incorrectly transferred when an early termination occurs during a burst mode, may include a bus, for example, an advanced high-performance bus (AHB), at least one bus master device, a bus arbiter and at least one transfer mode selection circuit. The at least one bus master device may generate a burst cycle control signal, a transfer start signal and a bus control request signal for requesting control of the bus, and may be activated in response to a bus control grant signal, so as to exchange data via the bus. The bus arbiter may generate the bus control grant signal in response to the bus control request signal and provide the bus control grant signal to the bus master device. The at least one transfer mode selection circuit may convert a burst mode into a single mode to generate a selection signal, when the bus control grant signal is deactivated before a burst mode operation is completed.Type: GrantFiled: June 29, 2006Date of Patent: August 26, 2008Assignee: Samsung Electronics Co., Ltd.Inventors: Shin-Chan Kang, Jae-Young Lee, Kyo-Keun Ku
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Publication number: 20080186321Abstract: A system on chip (Soc) includes a system bus, a plurality of sub-systems, an image processing logic block, an image memory interface and an image processing memory block. The sub-systems are respectively connected to the system bus. The image processing logic block is connected to the system bus. The image processing logic block performs an image processing. The image processing logic block is included in a first power domain. The image memory interface is connected to the system bus and the image processing logic block. The image processing memory block is connected to the image memory interface. The image processing memory block is used for the image processing. The image memory interface and the image processing memory block are included in a second power domain different from the first power domain.Type: ApplicationFiled: January 31, 2008Publication date: August 7, 2008Inventors: Sun-hee Park, Shin-Chan Kang
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Publication number: 20070036005Abstract: A wrapper circuit effectively converts a muxed-type memory (having time-multiplexed address and data lines) into a non-muxed type memory as seen by the controller (a non-muxed type memory controller). Wrapper circuit includes a select circuit (e.g., multiplexer) and an input/output buffer. The select circuit receives write data and an address from a non-muxed type memory controller and selects either the write data or the address according to a first control signal. The input/output buffer receives the selection among the write data and the address and passes the write data or the address to a muxed type memory. The input/output buffer also passes read data received from the memory to the memory controller.Type: ApplicationFiled: July 28, 2006Publication date: February 15, 2007Inventor: Shin-Chan Kang
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Publication number: 20070005857Abstract: A bus system, which may prevent data from being incorrectly transferred when an early termination occurs during a burst mode, may include a bus, for example, an advanced high-performance bus (AHB), at least one bus master device, a bus arbiter and at least one transfer mode selection circuit. The at least one bus master device may generate a burst cycle control signal, a transfer start signal and a bus control request signal for requesting control of the bus, and may be activated in response to a bus control grant signal, so as to exchange data via the bus. The bus arbiter may generate the bus control grant signal in response to the bus control request signal and provide the bus control grant signal to the bus master device. The at least one transfer mode selection circuit may convert a burst mode into a single mode to generate a selection signal, when the bus control grant signal is deactivated before a burst mode operation is completed.Type: ApplicationFiled: June 29, 2006Publication date: January 4, 2007Inventors: Shin-Chan Kang, Jae-Young Lee, Kyo-Keun Ku
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Publication number: 20050193276Abstract: A semiconductor IC capable of debugging two or more processors at the same time by means of a single debugger and a semiconductor IC test system. The semiconductor IC includes processors operating at different frequencies, a trigger circuit which causes all of the processors to be in a debugging state when one of the processors is in the debugging state, and a JTAG circuit applying a boundary scan operation to the processors connected to a JTAG pin in series.Type: ApplicationFiled: December 28, 2004Publication date: September 1, 2005Inventors: Shin-Chan Kang, Sun-Kyu Kim