Patents by Inventor Shin-Cheng Chu

Shin-Cheng Chu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Electronic test system and associated method
    Patent number: 8816708
    Abstract: Electronic test system and associated method, including a first and a second connection terminals respectively coupled to two pins of a chip under test, a signal source terminal coupled to a signal generator, a first and a second measurement terminals coupled to a tester, a fifth switch, a seventh switch and a switch circuit which has a first and a fourth front terminals coupled to the signal source terminal, has a first and a fourth back terminals coupled to the first and second connection terminals, and controls conduction between the first front terminal and the first back terminal, as well as conduction between the fourth front terminal and the fourth back terminal. The fifth switch is coupled between the fourth back terminal and the first measurement terminal, and the seventh switch is coupled between the first connection terminal and the second measurement terminal.
    Type: Grant
    Filed: July 12, 2012
    Date of Patent: August 26, 2014
    Assignees: Global Unichip Corporation, Taiwan Semiconductor Manufacturing Co., Ltd
    Inventors: Shin-Cheng Chu, Ching-Tsung Chen, Teng-Hui Lee, Chia-Jen Kao
  • ELECTRONIC TEST SYSTEM AND ASSOCIATED METHOD
    Publication number: 20130113508
    Abstract: Electronic test system and associated method, including a first and a second connection terminals respectively coupled to two pins of a chip under test, a signal source terminal coupled to a signal generator, a first and a second measurement terminals coupled to a tester, a fifth switch, a seventh switch and a switch circuit which has a first and a fourth front terminals coupled to the signal source terminal, has a first and a fourth back terminals coupled to the first and second connection terminals, and controls conduction between the first front terminal and the first back terminal, as well as conduction between the fourth front terminal and the fourth back terminal. The fifth switch is coupled between the fourth back terminal and the first measurement terminal, and the seventh switch is coupled between the first connection terminal and the second measurement terminal.
    Type: Application
    Filed: July 12, 2012
    Publication date: May 9, 2013
    Applicants: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD, GLOBAL UNICHIP CORPORATION
    Inventors: Shin-Cheng Chu, Ching-Tsung Chen, Teng-Hui Lee, Chia-Jen Kao