Patents by Inventor Shin Hwei TAN

Shin Hwei TAN has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10152406
    Abstract: According to an aspect of an embodiment, one or more systems or methods may be configured to locate a fault in a software program using a test suite. The systems or methods may be further configured to modify, using a repair template, the software program in response to locating the fault. In addition, the systems or methods may be configured to determine whether the modification satisfies an anti-pattern condition. The anti-pattern condition may indicate whether the modification is improper. The systems or methods may also be configured to disallow the modification in response to the modification satisfying the anti-pattern condition or perform further testing on the software program, as modified, in response to the modification not satisfying the anti-pattern condition.
    Type: Grant
    Filed: August 25, 2015
    Date of Patent: December 11, 2018
    Assignee: FUJISTU LIMITED
    Inventors: Hiroaki Yoshida, Shin Hwei Tan, Mukul R. Prasad
  • Publication number: 20170060735
    Abstract: According to an aspect of an embodiment, one or more systems or methods may be configured to locate a fault in a software program using a test suite. The systems or methods may be further configured to modify, using a repair template, the software program in response to locating the fault. In addition, the systems or methods may be configured to determine whether the modification satisfies an anti-pattern condition. The anti-pattern condition may indicate whether the modification is improper. The systems or methods may also be configured to disallow the modification in response to the modification satisfying the anti-pattern condition or perform further testing on the software program, as modified, in response to the modification not satisfying the anti-pattern condition.
    Type: Application
    Filed: August 25, 2015
    Publication date: March 2, 2017
    Inventors: Hiroaki YOSHIDA, Shin Hwei TAN, Mukul R. PRASAD