Patents by Inventor Shin Imamura

Shin Imamura has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11906420
    Abstract: This invention is capable of improving performance of a biochemical analyzer and facilitating the maintenance. A light source includes: a first LED that emits ultraviolet light and a second LED that has a light emission spectrum different from that of the first LED, the first LED and the second LED being disposed in parallel; a reflection surface that is opposite to the first LED and reflects light of the first LED; and a dichroic surface that is opposite to the second LED, reflects light of the first LED, and allows light of the second LED to penetrate.
    Type: Grant
    Filed: January 31, 2020
    Date of Patent: February 20, 2024
    Assignee: Hitachi High-Tech Corporation
    Inventors: Yoshifumi Sekiguchi, Shin Imamura, Takahiro Ando, Tomoto Kawamura, Yuya Matsuoka, Sakuichiro Adachi, Yasuhiro Keta, Eiichiro Takada
  • Patent number: 11846736
    Abstract: The purpose of the present invention is to provide a scintillator for a charged particle beam device and a charged particle beam device which achieve both an increase in emission intensity and a reduction in afterglow intensity. This scintillator for a charged particle beam device is characterized by comprising a substrate (13), a buffer layer (14) formed on a surface of the substrate (13), a stack (12) of a light emitting layer (15) and a barrier layer (16) formed on a surface of the buffer layer (14), and a conductive layer (17) formed on a surface of the stack (12) and by being configured such that the light emitting layer (15) contains InGaN, the barrier layer (16) contains GaN, and the ratio b/a of the thickness b of the barrier layer (16) to the thickness a of the light emitting layer (15) is 11 to 25.
    Type: Grant
    Filed: July 10, 2019
    Date of Patent: December 19, 2023
    Assignee: HITACHI HIGH-TECH CORPORATION
    Inventors: Eri Takahashi, Shin Imamura, Makoto Suzuki, Shunsuke Mizutani
  • Publication number: 20230374377
    Abstract: The purpose of the present invention is to increase the amount of near-infrared light emitted by a phosphor excited by near-ultraviolet light to blue light. The present invention relates to a phosphor containing gallium oxide Ga2O3 as the base composition, one or two elements selected from Cr and Fe as the light-emitting center, and aluminum fluoride AlF3 as the flux.
    Type: Application
    Filed: August 31, 2021
    Publication date: November 23, 2023
    Inventors: Masaaki KOMATSU, Shin IMAMURA, Yoshifumi SEKIGUCHI, Takahiro ANDO, Eiichiro TAKADA
  • Patent number: 11754493
    Abstract: A broadband light source device in a biochemical analyzing device, and facilitates maintenance thereof, including an LED substrate that is provided with an LED chip generating a light beam having a first wavelength band and including a fluorescent substance in the light beam having a first wavelength band and that is provided with an LED chip generating a light beam having a second wavelength band, in which the fluorescent substance includes at least alumina and at least one of Fe, Cr, Bi, Tl, Ce, Tb, Eu, and Mn and is produced by calcining a raw material that contains sodium at 6.1 to 15.9 wt. % in the whole raw material. The broadband light source device further includes an optical system including a light pipe that color-mixes the light beam passing through the fluorescent substance of the LED chip and the light beam emitted from the LED chip, and a flat dichroic prism.
    Type: Grant
    Filed: October 9, 2019
    Date of Patent: September 12, 2023
    Assignee: HITACHI HIGH-TECH CORPORATION
    Inventors: Tomoto Kawamura, Takahiro Ando, Shin Imamura, Masaaki Komatsu, Yuya Matsuoka, Takeshi Ishida, Sakuichiro Adachi
  • Publication number: 20230266485
    Abstract: A charged-particle detecting device 108, 108a, 108b, 108c, 108d, 108e, 108f, 108g or a radiation detecting device 203 detects charged particles or radiation as a detection target. These detection devices are each provided with: a scintillator 109 provided with a fluorescent layer 109a that converts the detection target into light 112; a light detector 111, 111b that detects the light 112 emitted from the scintillator 109; a light guide 110, 117 provided between the scintillator 109 and the light detector 111, 111b; and a blocking part 113, 114 that blocks a portion of the detection target incident on the scintillator 109 or the light emitted from the scintillator 109.
    Type: Application
    Filed: June 17, 2020
    Publication date: August 24, 2023
    Applicant: Hitachi High-Tech Corporation
    Inventors: Laila Ambar SARI, Shin IMAMURA, Takumu IWANAKA, Yoshifumi SEKIGUCHI
  • Patent number: 11694873
    Abstract: A charged particle beam apparatus using a light guide that improves light utilization efficiency includes a detector including a scintillator for emitting light when a charged particle is incident, a light receiving element, and a light guide for guiding the light from the scintillator to the light receiving element. The light guide includes: an incident surface that faces a light emitting surface of the scintillator and to which the light emitted by the scintillator is incident; an emitting surface that is configured to emit light; and a reflecting surface that is inclined with respect to the incident surface so that the light from the incident surface is reflected toward the emitting surface. The emitting surface is smaller than the incident surface. A slope surface is provided between the incident surface and the emitting surface, faces the reflecting surface, and is inclined with respect to the incident surface.
    Type: Grant
    Filed: October 10, 2022
    Date of Patent: July 4, 2023
    Assignee: HITACHI HIGH-TECH CORPORATION
    Inventors: Yoshifumi Sekiguchi, Shin Imamura, Shunsuke Mizutani, Shahedul Hoque, Uki Ikeda
  • Publication number: 20230184704
    Abstract: The present invention provides: a scintillator which is reduced in the intensity of the afterglow, while having increased luminous intensity; and a charged particle radiation apparatus. A scintillator according to the present invention is characterized in that: a base material, a buffer layer, a light emitting part and a first conductive layer are sequentially stacked in this order; the light emitting part contains one or more elements that are selected from the group consisting of Ga, Zn, In, Al, Cd, Mg, Ca and Sr; and a second conductive layer is provided between the base material and the light emitting part.
    Type: Application
    Filed: June 10, 2020
    Publication date: June 15, 2023
    Inventors: Eri TAKAHASHI, Shin IMAMURA, Makoto SUZUKI, Shunsuke MIZUTANI
  • Publication number: 20230050424
    Abstract: Provided are a charged particle detector and a radiation detector capable of obtaining an observation image with correct contrast without saturation even when the number of signal electrons incident on a detector is increased due to an increase in the current of a primary electron beam. The charged particle detector is characterized by having a scintillator (109) having a signal electron detection surface (109a) for detecting signal electrons emitted when a specimen is irradiated with primary electrons and converting the signal electrons into light, a light detector (111) having a light detection surface (111a) for detecting the light emitted from the scintillator (109), and a light guide (110) disposed between the scintillator (109) and the light detector (111), wherein the area of the light detection surface (111a) is larger than the area of the signal electron detection surface (109a).
    Type: Application
    Filed: March 2, 2020
    Publication date: February 16, 2023
    Inventors: Takumu IWANAKA, Yoshifumi SEKIGUCHI, Toshiaki KUSUNOKI, Shin IMAMURA, Hajime KAWANO
  • Publication number: 20230030651
    Abstract: A charged particle beam apparatus using a light guide that improves light utilization efficiency includes a detector including a scintillator for emitting light when a charged particle is incident, a light receiving element, and a light guide for guiding the light from the scintillator to the light receiving element. The light guide includes: an incident surface that faces a light emitting surface of the scintillator and to which the light emitted by the scintillator is incident; an emitting surface that is configured to emit light; and a reflecting surface that is inclined with respect to the incident surface so that the light from the incident surface is reflected toward the emitting surface. The emitting surface is smaller than the incident surface. A slope surface is provided between the incident surface and the emitting surface, faces the reflecting surface, and is inclined with respect to the incident surface.
    Type: Application
    Filed: October 10, 2022
    Publication date: February 2, 2023
    Applicant: HITACHI HIGH-TECH CORPORATION
    Inventors: Yoshifumi SEKIGUCHI, Shin IMAMURA, Shunsuke MIZUTANI, Shahedul HOQUE, Uki IKEDA
  • Publication number: 20220413169
    Abstract: Provided are a scintillator and the like capable of improving emission intensity. A scintillator (S) comprises a sapphire substrate (6), a GaN layer (4) that is provided on the incident side to the sapphire substrate (6) and includes GaN, a quantum well structure (3) provided on the incident side to the GaN layer (4), and a conductive layer (2) provided on the incident side to the quantum well structure (3), wherein a plurality of emitting layers (21) including InGaN and a plurality of barrier layers (22) including GaN are alternatively stacked in the quantum well structure (3), and an oxygen-containing layer (23) including oxygen is provided between the quantum well structure (3) and the conductive layer (2).
    Type: Application
    Filed: November 19, 2020
    Publication date: December 29, 2022
    Inventors: Shin IMAMURA, Toshiaki KUSUNOKI, Eri TAKAHASHI, Yoshifumi SEKIGUCHI, Takayuki KANDA
  • Publication number: 20220397581
    Abstract: Provided is an automatic analysis device capable of obtaining a stable light intensity over a wide wavelength band by multiplexing a plurality of LED lights and adjusting the temperature characteristics of each LED element. The automatic analysis device according to the present disclosure is configured such that light emitted from a second LED is reflected to be multiplexed on the same optical axis as the light emitted from a first LED, and the first LED and the second LED are in contact with the same temperature adjustment member.
    Type: Application
    Filed: October 7, 2020
    Publication date: December 15, 2022
    Applicant: HITACHI HIGH-TECH CORPORATION
    Inventors: Takahiro ANDO, Sakuichiro ADACHI, Yasuhiro KETA, Yuya MATSUOKA, Hiromitsu MORI, Shin IMAMURA, Eiichiro TAKADA, Makoto ARAI
  • Patent number: 11515120
    Abstract: A charged particle beam apparatus using a light guide that improves light utilization efficiency includes a detector including a scintillator for emitting light when a charged particle is incident, a light receiving element, and a light guide for guiding the light from the scintillator to the light receiving element. The light guide includes: an incident surface that faces a light emitting surface of the scintillator and to which the light emitted by the scintillator is incident; an emitting surface that is configured to emit light; and a reflecting surface that is inclined with respect to the incident surface so that the light from the incident surface is reflected toward the emitting surface. The emitting surface is smaller than the incident surface. A slope surface is provided between the incident surface and the emitting surface, faces the reflecting surface, and is inclined with respect to the incident surface.
    Type: Grant
    Filed: September 21, 2018
    Date of Patent: November 29, 2022
    Assignee: HITACHI HIGH-TECH CORPORATION
    Inventors: Yoshifumi Sekiguchi, Shin Imamura, Shunsuke Mizutani, Shahedul Hoque, Uki Ikeda
  • Patent number: 11506534
    Abstract: An automatic analysis apparatus comprises: a light source generating light having a center wavelength equal to or shorter than 340 nm; a fluorescent substance excited by the light source light, and generates light together with transmitted light from the light source, having a wavelength of 340 nm to 800 nm; a condenser lens; at least one slit; a reaction cell holding a reaction solution where a specimen and reagent are mixed, and that the light source light and the light from the fluorescent substance enter; and a detector that detects light transmitted through the reaction cell. The light source, fluorescent substance, condenser lens, and slit are provided along a straight light corresponding to the optical axis. The width of the slit's opening is equal to or narrower than the width of a ray forming an image of the light source at the position of the slit.
    Type: Grant
    Filed: October 24, 2017
    Date of Patent: November 22, 2022
    Assignee: Hitachi High-Tech Corporation
    Inventors: Takeshi Ishida, Isao Yamazaki, Sakuichiro Adachi, Shin Imamura
  • Publication number: 20220244412
    Abstract: The purpose of the present invention is to provide a scintillator for a charged particle beam device and a charged particle beam device which achieve both an increase in emission intensity and a reduction in afterglow intensity. This scintillator for a charged particle beam device is characterized by comprising a substrate (13), a buffer layer (14) formed on a surface of the substrate (13), a stack (12) of a light emitting layer (15) and a barrier layer (16) formed on a surface of the buffer layer (14), and a conductive layer (17) formed on a surface of the stack (12) and by being configured such that the light emitting layer (15) contains InGaN, the barrier layer (16) contains GaN, and the ratio b/a of the thickness b of the barrier layer (16) to the thickness a of the light emitting layer (15) is 11 to 25.
    Type: Application
    Filed: July 10, 2019
    Publication date: August 4, 2022
    Inventors: Eri TAKAHASHI, Shin IMAMURA, Makoto SUZUKI, Shunsuke MIZUTANI
  • Publication number: 20220214266
    Abstract: This invention is capable of improving performance of a biochemical analyzer and facilitating the maintenance. A light source includes: a first LED that emits ultraviolet light and a second LED that has a light emission spectrum different from that of the first LED, the first LED and the second LED being disposed in parallel; a reflection surface that is opposite to the first LED and reflects light of the first LED; and a dichroic surface that is opposite to the second LED, reflects light of the first LED, and allows light of the second LED to penetrate.
    Type: Application
    Filed: January 31, 2020
    Publication date: July 7, 2022
    Inventors: Yoshifumi SEKIGUCHI, Shin IMAMURA, Takahiro ANDO, Tomoto KAWAMURA, Yuya MATSUOKA, Sakuichiro ADACHI, Yasuhiro KETA, Eiichiro TAKADA
  • Publication number: 20220181138
    Abstract: The present invention implements an ion detector with which it is possible to avoid direct collisions of negative ions with a scintillator, prevent degradation of the scintillator, prolong life of the scintillator, reduce the need for maintenance, and perform highly sensitive detection of both positive and negative ions. With respect to a reference line 65 connecting a central point 63 of a positive ion CD 52 and a central point 64 of a counter electrode 54, a central point 66 of a negative ion CD 53 is provided in a region of a side opposite to a region of a side of a central point 67 of a scintillator 56. Positive ions entering from an ion entrance 62 receive a deflection force and collide with the positive ion CD 52 to generate secondary electrons. The generated secondary electrons collide with the scintillator 56 to generate light. The generated light passes through a light guide 59 and is detected by a photomultiplier tube 58. A negative potential barrier is generated along the reference line 65.
    Type: Application
    Filed: January 22, 2020
    Publication date: June 9, 2022
    Inventors: Kiyomi YOSHINARI, Masuyuki SUGIYAMA, Yuichiro HASHIMOTO, Shin IMAMURA
  • Patent number: 11348757
    Abstract: In order to improve a yield of light generated by a collision between secondary electrons and gas molecules, the invention provides a charged particle beam device including: a charged particle beam source configured to irradiate a sample with a charged particle beam; a sample chamber configured to hold the sample and a gas molecule; a positive electrode configured to form an electric field that accelerates a secondary electron emitted from the sample; a photodetector configured to detect light generated by a collision between the accelerated secondary electron and the gas molecule; and a light condensing unit disposed between the sample and the photodetector, having a light emitting space in which the light is generated, and configured to condense the light generated in the light emitting space on a photodetector side.
    Type: Grant
    Filed: July 19, 2018
    Date of Patent: May 31, 2022
    Assignee: Hitachi High-Tech Corporation
    Inventors: Shuhei Yabu, Michio Hatano, Shin Imamura, Masaaki Komatsu
  • Publication number: 20210381954
    Abstract: A broadband light source device in a biochemical analyzing device, and facilitates maintenance thereof, including an LED substrate that is provided with an LED chip generating a light beam having a first wavelength band and including a fluorescent substance in the light beam having a first wavelength band and that is provided with an LED chip generating a light beam having a second wavelength band, in which the fluorescent substance includes at least alumina and at least one of Fe, Cr, Bi, Tl, Ce, Tb, Eu, and Mn and is produced by calcining a raw material that contains sodium at 6.1 to 15.9 wt. % in the whole raw material. The broadband light source device further includes an optical system including a light pipe that color-mixes the light beam passing through the fluorescent substance of the LED chip and the light beam emitted from the LED chip, and a flat dichroic prism.
    Type: Application
    Filed: October 9, 2019
    Publication date: December 9, 2021
    Inventors: Tomoto KAWAMURA, Takahiro ANDO, Shin IMAMURA, Masaaki KOMATSU, Yuya MATSUOKA, Takeshi ISHIDA, Sakuichiro ADACHI
  • Publication number: 20210272768
    Abstract: In order to improve a yield of light generated by a collision between secondary electrons and gas molecules, the invention provides a charged particle beam device including: a charged particle beam source configured to irradiate a sample with a charged particle beam; a sample chamber configured to hold the sample and a gas molecule; a positive electrode configured to form an electric field that accelerates a secondary electron emitted from the sample; a photodetector configured to detect light generated by a collision between the accelerated secondary electron and the gas molecule; and a light condensing unit disposed between the sample and the photodetector, having a light emitting space in which the light is generated, and configured to condense the light generated in the light emitting space on a photodetector side.
    Type: Application
    Filed: July 19, 2018
    Publication date: September 2, 2021
    Inventors: Shuhei YABU, Michio HATANO, Shin IMAMURA, Masaaki KOMATSU
  • Publication number: 20210253949
    Abstract: The present invention improves the performance of an analyzer and facilitates the maintenance of the analyzer. This fluorescent body is produced by firing a raw material which contains: an alumina; and at least one among Fe, Cr, Bi, Tl, Ce, Tb, Eu, and Mn, wherein the raw material contains 6.1-15.9 wt % of sodium with respect to the total amount of the raw material.
    Type: Application
    Filed: April 8, 2019
    Publication date: August 19, 2021
    Applicant: Hitachi High-Tech Corporation
    Inventors: Masaaki KOMATSU, Shin IMAMURA, Takeshi ISHIDA, Isao YAMAZAKI, Sadamitsu ASO