Patents by Inventor Shin Ishii

Shin Ishii has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11144789
    Abstract: Provided is a model parameter learning device and the like capable of learning model parameters such that the influence of a noise in input data can be suppressed. A model parameter learning device (1) alternately carries out first learning processing for learning model parameters W1, b1, W2 and b2 such that an error between data Xout and data Xorg is minimized, and second learning processing for learning model parameters W1, b1, Wm, bm, Wq and bq such that a loss function LAE is minimized.
    Type: Grant
    Filed: September 18, 2019
    Date of Patent: October 12, 2021
    Assignees: HONDA MOTOR CO., LTD., KYOTO UNIVERSITY
    Inventors: Kosuke Nakanishi, Yuji Yasui, Wataru Sasaki, Shin Ishii
  • Publication number: 20200097772
    Abstract: Provided is a model parameter learning device and the like capable of learning model parameters such that the influence of a noise in input data can be suppressed. A model parameter learning device (1) alternately carries out first learning processing for learning model parameters W1, b1, W2 and b2 such that an error between data Xout and data Xorg is minimized, and second learning processing for learning model parameters W1, b1, Wm, bm, Wq and bq such that a loss function LAE is minimized.
    Type: Application
    Filed: September 18, 2019
    Publication date: March 26, 2020
    Applicants: HONDA MOTOR CO., LTD., Kyoto University
    Inventors: Kosuke Nakanishi, Yuji Yasui, Wataru Sasaki, Shin Ishii
  • Patent number: 9662081
    Abstract: This invention provides an X-ray CT image processing method that allows more flexible expression by expressing X-ray absorption coefficients probabilistically, makes it possible to acquire reconstructed images that are comparable to those obtained by conventional methods but involve lower X-ray doses, and can reduce beam-hardening artifacts. A probability distribution for the observation of projected X-rays is set and statistical inference is performed. Said probability distribution is expressed in terms of the process of observing a multiple-X-ray sum resulting from multiple projected X-rays being incident upon a detector. Bayesian inference in which the expected value of the posterior distribution is used for statistical inference is performed on the basis of a prior distribution for X-ray absorption coefficients, said prior distribution having parameters for the material and the observation process in terms of which the multiple-X-ray sum is expressed.
    Type: Grant
    Filed: May 15, 2014
    Date of Patent: May 30, 2017
    Assignee: Kyoto University
    Inventors: Shinichi Maeda, Daigo Yoshikawa, Takumi Tanaka, Shin Ishii
  • Publication number: 20160120493
    Abstract: This invention provides an X-ray CT image processing method that allows more flexible expression by expressing X-ray absorption coefficients probabilistically, makes it possible to acquire reconstructed images that are comparable to those obtained by conventional methods but involve lower X-ray doses, and can reduce beam-hardening artifacts. A probability distribution for the observation of projected X-rays is set and statistical inference is performed. Said probability distribution is expressed in terms of the process of observing a multiple-X-ray sum resulting from multiple projected X-rays being incident upon a detector. Bayesian inference in which the expected value of the posterior distribution is used for statistical inference is performed on the basis of a prior distribution for X-ray absorption coefficients, said prior distribution having parameters for the material and the observation process in terms of which the multiple-X-ray sum is expressed.
    Type: Application
    Filed: May 15, 2014
    Publication date: May 5, 2016
    Inventors: Shinichi MAEDA, Daigo YOSHIKAWA, Takumi TANAKA, Shin ISHII
  • Patent number: 9129431
    Abstract: An x-ray CT image processing method which carries out a statistical estimate in prior knowledge relating to the movement and the x-ray absorption coefficient of a measurement subject comprises: a step of hypothesizing that the measurement subject changes smoothly over time, and defining a first probability model (prior knowledge of the measurement subject over all times) relating to movement and a second probability model (projected image observation model over all times) relating to observation; and a step of carrying out a statistical estimate dependent on both the first probability model and the second probability model. The first probability model relating to the movement of the measurement subject and the second model relating to observation are defined as probability models with which statistical estimates are carried out at the outset, and motion and CT images are simultaneously estimated by carrying out induction based on the probability models.
    Type: Grant
    Filed: December 18, 2012
    Date of Patent: September 8, 2015
    Assignee: National University Corporation Kyoto University
    Inventors: Shinichi Maeda, Takumi Tanaka, Shin Ishii
  • Publication number: 20140334705
    Abstract: An x-ray CT image processing method which carries out a statistical estimate in prior knowledge relating to the movement and the x-ray absorption coefficient of a measurement subject comprises: a step of hypothesizing that the measurement subject changes smoothly over time, and defining a first probability model (prior knowledge of the measurement subject over all times) relating to movement and a second probability model (projected image observation model over all times) relating to observation; and a step of carrying out a statistical estimate dependent on both the first probability model and the second probability model. The first probability model relating to the movement of the measurement subject and the second model relating to observation are defined as probability models with which statistical estimates are carried out at the outset, and motion and CT images are simultaneously estimated by carrying out induction based on the probability models.
    Type: Application
    Filed: December 18, 2012
    Publication date: November 13, 2014
    Inventors: Shin Ishii, Shinichi Maeda, Takumi Tanaka
  • Patent number: 8107735
    Abstract: A face model providing portion provides an stored average face model to an estimation portion estimating an affine parameter for obtaining a head pose. An individual face model learning portion obtains a result of tracking feature points by the estimation portion and learns an individual face model. The individual face model learning portion terminates the learning when a free energy of the individual face model is over a free energy of the average face model, and switches a face model provided to the estimation portion from the average face model to the individual face model. While learning the individual face mode, an observation matrix is factorized using a reliability matrix showing reliability of each observation value forming the observation matrix with emphasis on the feature point having higher reliability.
    Type: Grant
    Filed: October 2, 2007
    Date of Patent: January 31, 2012
    Assignees: Denso Corporation, National University Corporation Nara Institute of Science & Technologies
    Inventors: Mikio Shimizu, Naoki Fukaya, Takashi Bando, Tomohiro Shibata, Shin Ishii
  • Patent number: 7813544
    Abstract: An estimation device estimates a hidden state of an estimation subject from an observable state in a manner of a time series. The observable state is observed from the hidden state of the estimation subject under a procedure that has a hierarchical structure, which includes the hidden state of the estimation subject, the observable state, and an intermediate hidden state therebetween. The estimation device includes an estimation subject hidden state predicting means, an intermediate hidden state predicting means based on the state transition structure of the hidden state of the estimation subject, an intermediate hidden state likelihood observing means, an intermediate hidden state estimating means, an estimation subject hidden state likelihood observing means, estimation subject hidden state estimating means, an intermediate hidden state predicting means based on the state transition structure of the intermediate hidden state, and the mixing means.
    Type: Grant
    Filed: December 20, 2006
    Date of Patent: October 12, 2010
    Assignees: Denso Corporation, National University Corporation Nara Institute of Science and Technology
    Inventors: Naoki Fukaya, Mikio Shimizu, Shin Ishii, Tomohiro Shibata, Takashi Bando
  • Patent number: 7601532
    Abstract: A microarray for predicting the prognosis of neuroblastoma, wherein the microarray has 25 to 45 probes related to good prognosis, which are hybridized to a gene transcript whose expression is increased in a good prognosis patient with neuroblastoma and are selected from 96 polynucleotides consisting of the nucleotide sequences of SEQ. ID NOs. 1, 5, 6, 14. 16, 17, 19, 22-24, 28, 29, 31, 37, 39, 40, 43, 44, 47-52, 54, 57-60, 62, 64, 65, 67, 68, 72-75, 77, 78, 80-82, 84, 87, 89-91, 94, 100, 103, 112, 113, 118, 120, 129, 130, 132, 136, 138, 142, 144, 145, 148, 150-153, 155, 158-160, 163-165, 169-171, 173, 174, 177, 178, 180-182, 184, 186, 187, 189, 191, 192, 194, 195, 198-200 or their partial continuous sequences or their complementary strands, and 25 to 45 probes related to poor prognosis, which are hybridized to a gene transcript whose expression is increased in a poor prognosis patient with neuroblastoma and are selected from 104 polynucleotides consisting of the nucleotide sequences of SEQ. ID NOs.
    Type: Grant
    Filed: September 23, 2004
    Date of Patent: October 13, 2009
    Assignees: Hisamitsu Pharmaceutical Co., Inc., NGK Insulators, Ltd., Chiba-Prefecture
    Inventors: Akira Nakagawara, Miki Ohira, Shin Ishii, Takeshi Goto, Hiroyuki Kubo, Takahiro Hirata, Yasuko Yoshida, Saichi Yamada
  • Publication number: 20080253610
    Abstract: A face model providing portion provides an stored average face model to an estimation portion estimating an affine parameter for obtaining a head pose. An individual face model learning portion obtains a result of tracking feature points by the estimation portion and learns an individual face model. The individual face model learning portion terminates the learning when a free energy of the individual face model is over a free energy of the average face model, and switches a face model provided to the estimation portion from the average face model to the individual face model. While learning the individual face mode, an observation matrix is factorized using a reliability matrix showing reliability of each observation value forming the observation matrix with emphasis on the feature point having higher reliability.
    Type: Application
    Filed: October 2, 2007
    Publication date: October 16, 2008
    Applicants: DENSO Corporation, National University Corporation Nara Institute of Science and Technology
    Inventors: Mikio Shimizu, Naoki Fukaya, Takashi Bando, Tomohiro Shibata, Shin Ishii
  • Publication number: 20070147661
    Abstract: An estimation device estimates a hidden state of an estimation subject from an observable state in a manner of a time series. The observable state is observed from the hidden state of the estimation subject under a procedure that has a hierarchical structure, which includes the hidden state of the estimation subject, the observable state, and an intermediate hidden state therebetween. The estimation device includes an estimation subject hidden state predicting means, an intermediate hidden state predicting means based on the state transition structure of the hidden state of the estimation subject, an intermediate hidden state likelihood observing means, an intermediate hidden state estimating means, an estimation subject hidden state likelihood observing means, estimation subject hidden state estimating means, an intermediate hidden state predicting means based on the state transition structure of the intermediate hidden state, and the mixing means.
    Type: Application
    Filed: December 20, 2006
    Publication date: June 28, 2007
    Applicants: DENSO Corporation, National University Corporation Nara Institute Of Science and Technology
    Inventors: Naoki Fukaya, Mikio Shimizu, Shin Ishii, Tomohiro Shibata, Takashi Bando
  • Publication number: 20050287541
    Abstract: A microarray for predicting the prognosis of neuroblastoma, wherein the microarray has 25 to 45 probes related to good prognosis, which are hybridized to a gene transcript whose expression is increased in a good prognosis patient with neuroblastoma and are selected from 96 polynucleotides consisting of the nucleotide sequences of Seq. ID No. 1 to 96 or their partial continuous sequences or their complementary strands, and 25 to 45 probes related to poor prognosis, which are hybridized to a gene transcript whose expression is increased in a poor prognosis patient with neuroblastoma and are selected from 104 polynucleotides consisting of the nucleotide sequences of Seq. ID No. 97 to 200 or their partial continuous sequences or their complementary strands.
    Type: Application
    Filed: September 23, 2004
    Publication date: December 29, 2005
    Applicants: Hisamitsu Pharmaceutical Co., Inc., NGK Insulators, Ltd., Chiba-Prefecture
    Inventors: Akira Nakagawara, Miki Ohira, Shin Ishii, Takeshi Goto, Hiroyuki Kubo, Takahiro Hirata, Yasuko Yoshida, Saichi Yamada