Abstract: A laser beam output apparatus includes a pulsed laser output section, an optical path determining section, a wavelength changing section, and a multiplexer. The pulsed laser output section outputs a laser beam having a predetermined wavelength as first pulses. The optical path determining section receives the first pulses and determines one among a plurality of optical paths for each of the first pulses for output. The wavelength changing section receives light beams traveling, respectively, through the plurality of optical paths and changes the light beams to have their respective different wavelengths for output. The multiplexer multiplexes outputs from the wavelength changing section.

Abstract: A test apparatus inspects an antenna element or a device including the antenna element as a DUT by OTA. A front-end unit includes a plurality of electric field detection elements provided to face a plurality of points on a radiation surface of the antenna element of the DUT. The plurality of electric field detection elements can simultaneously detect the electric fields formed at the corresponding points by the DUT, respectively. A tester body receives a plurality of detection signals from the front-end unit and evaluates the DUT.

Abstract: An optical testing device for use in testing an optical measuring instrument provides incident light from a light source to an incident object and receives reflected light due to reflection of the incident light at the incident object. The optical testing device includes an incident light receiving section that receives incident light, and a light signal providing section. The light signal providing section provides a light signal to the incident object after a predetermined delay time since the incident light receiving section has received the incident light. A reflected light signal due to reflection of the light signal at the incident object is provided to the optical measuring instrument. The delay time is approximately equal to the time between emission of the incident light from the light source and reception of the reflected light by the optical measuring instrument in the case of actually using the optical measuring instrument.

Abstract: According to the present invention, an optical device includes: a first electro-optical member and a second electro-optical member. The first electro-optical member has two convex portions spaced from each other by a recessed portion and a connecting portion arranged under the recessed portion to connect the two convex portions, the first electro-optical member exhibiting an electro-optical effect. The second electro-optical member has a recessed portion member arranged within the recessed portion, the second electro-optical member exhibiting an electro-optical effect. The permittivity of the first electro-optical member is higher than the permittivity of the second electro-optical member. The refractive index of the first electro-optical member is higher than the refractive index of the second electro-optical member. During application of an electric field, light to be transmitted is applied to the recessed portion member.

Abstract: A test apparatus inspects an antenna element or a device including the antenna element as a DUT by OTA. A front-end unit includes a plurality of electric field detection elements provided to face a plurality of points on a radiation surface of the antenna element of the DUT. The plurality of electric field detection elements can simultaneously detect the electric fields formed at the corresponding points by the DUT, respectively. A tester body receives a plurality of detection signals from the front-end unit and evaluates the DUT.

Abstract: According to the present invention, an optical device includes: a first electro-optical member and a second electro-optical member. The first electro-optical member has two convex portions spaced from each other by a recessed portion and a connecting portion arranged under the recessed portion to connect the two convex portions, the first electro-optical member exhibiting an electro-optical effect. The second electro-optical member has a recessed portion member arranged within the recessed portion, the second electro-optical member exhibiting an electro-optical effect. The permittivity of the first electro-optical member is higher than the permittivity of the second electro-optical member. The refractive index of the first electro-optical member is higher than the refractive index of the second electro-optical member. During application of an electric field, light to be transmitted is applied to the recessed portion member.

Abstract: An optical testing device for use in testing an optical measuring instrument provides incident light from a light source to an incident object and receives reflected light due to reflection of the incident light at the incident object. The optical testing device includes an incident light receiving section that receives incident light, and a light signal providing section. The light signal providing section provides a light signal to the incident object after a predetermined delay time since the incident light receiving section has received the incident light. A reflected light signal due to reflection of the light signal at the incident object is provided to the optical measuring instrument. The delay time is approximately equal to the time between emission of the incident light from the light source and reception of the reflected light by the optical measuring instrument in the case of actually using the optical measuring instrument.

Abstract: A laser beam output apparatus includes a pulsed laser output section, an optical path determining section, a wavelength changing section, and a multiplexer. The pulsed laser output section outputs a laser beam having a predetermined wavelength as first pulses. The optical path determining section receives the first pulses and determines one among a plurality of optical paths for each of the first pulses for output. The wavelength changing section receives light beams traveling, respectively, through the plurality of optical paths and changes the light beams to have their respective different wavelengths for output. The multiplexer multiplexes outputs from the wavelength changing section.

Abstract: Provided is a test apparatus including an optical test signal generating section that generates an optical test signal; an optical signal supplying section that supplies the optical test signal to a device under test that is a testing target among a plurality of the devices under test; a first optical switch section that selects, from among optical signals output by the plurality of devices under test, the optical signal output by the device under test that is the testing target; and an optical signal receiving section that receives the selected optical signal.

Abstract: A test apparatus that easily tests a device under test having an optical interface. Provided is a test method, a test apparatus, and a device interface apparatus on which is mounted a device under test having an optical interface, the device interface apparatus comprising a device mounting section on which the device under test is mounted; an optical connector that is connected to the optical interface of the device under test; and an optical signal detecting section that detects an optical signal output from at least one of the optical interface and the optical connector, before the optical interface of the device under test mounted on the device mounting section is connected to the optical connector.

Abstract: Provided is a test apparatus including an optical test signal generating section that generates an optical test signal; an optical signal supplying section that supplies the optical test signal to a device under test that is a testing target among a plurality of the devices under test; a first optical switch section that selects, from among optical signals output by the plurality of devices under test, the optical signal output by the device under test that is the testing target; and an optical signal receiving section that receives the selected optical signal.

Abstract: A test apparatus that easily tests a device under test having an optical interface. Provided is a test method, a test apparatus, and a device interface apparatus on which is mounted a device under test having an optical interface, the device interface apparatus comprising a device mounting section on which the device under test is mounted; an optical connector that is connected to the optical interface of the device under test; and an optical signal detecting section that detects an optical signal output from at least one of the optical interface and the optical connector, before the optical interface of the device under test mounted on the device mounting section is connected to the optical connector.

Abstract: There is provided a test apparatus for testing a device under test, including a test signal generator that generates a test signal to test the device under test, an electric-photo converter that converts the test signal into an optical test signal, an optical interface that (i) transmits the optical test signal generated by the electric-photo converter to an optical receiver of the device under test and (ii) receives and outputs an optical response signal output from the device under test, a photo-electric converter that converts the optical response signal output from the optical interface into an electrical response signal and transmits the electrical response signal, and a signal receiver that receives the response signal transmitted from the photo-electric converter and a test method.

Abstract: Provided is a test apparatus that tests a device under test including an optical coupler transmitting optical signals in a direction perpendicular to a device surface. The test apparatus includes a substrate on which the device under test is to be loaded, an optical transmission path that transmits the optical signals, and a lens section facing the optical coupler on the substrate that focuses the optical signals from an end of either the optical coupler or the optical transmission path to an end of the other.

Abstract: [PROBLEM] Providing an optical source that outputs optical frequency modulated light having a constant output optical intensity. [MEANS FOR SOLVING THE PROBLEM] Provided is a light source apparatus that outputs an optical signal having an optical frequency corresponding to a frequency control signal, the light source apparatus including a laser light source section that outputs laser light having an optical frequency corresponding to the frequency control signal; and an optical intensity adjusting section that compensates for intensity change of the laser light to output laser light in which the intensity change caused by a change in the optical frequency is restricted.

Abstract: To efficiently apply jitter to an optical signal using a simple configuration, provided is an optical signal output apparatus that outputs an optical pulse pattern signal including jitter, the optical signal generating apparatus comprising a light source section that outputs an optical signal having an optical frequency corresponding to a frequency control signal; an optical modulation section that modulates the optical signal output by the light source section, according to a designated pulse pattern; and an optical jitter generating section that delays an optical signal passed by the optical modulation section according to the optical frequency, to apply jitter to the optical signal.

Abstract: It is an object of the present invention to test a device under test including an optical interface. Provided is a device interface apparatus on which is loaded a device under test including an optical interface. The device interface apparatus comprises a device loading section on which the device under test is loaded; an optical connector that is to be connected to the optical interface of the device under test; and an optical connector moving section that moves the optical connector toward the optical interface of the device under test loaded on the device loading section, to optically connect the optical connector and the optical interface.

Abstract: Provided is a test apparatus that tests a device under test including an optical coupler for transmitting optical signals in a surface direction and a first groove for holding an optical transmission path connected to the optical coupler. The test apparatus comprises a substrate on which the device under test is to be loaded; an optical transmission path to be connected to the optical coupler; and a pressing section that presses the optical transmission path from the substrate side toward the first groove. Also provided is a test method.

Abstract: Provided is an optical modulator that modulates input light with a high frequency and low half-wave voltage. An optical device comprises a substrate; a dielectric film that is formed on the substrate and includes a first optical waveguide and a second optical waveguide that run parallel to each other; an insulating film formed on the dielectric film; a coplanar line that is formed on the insulating film and includes a signal line arranged between the first optical waveguide and the second optical waveguide, a first ground line arranged in a first region, and a second ground line arranged in a second region; and auxiliary electrodes that are arranged in the first region and the second region, are formed in contact with the dielectric film or within the insulating film, and apply bias voltages to the first optical waveguide and the second optical waveguide.

Abstract: Provided is an optical modulator that modulates input light with a high frequency and low half-wave voltage. An optical device comprises a substrate; a dielectric film that is formed on the substrate and includes a first optical waveguide and a second optical waveguide that run parallel to each other; an insulating film formed on the dielectric film; a coplanar line that is formed on the insulating film and includes a signal line arranged between the first optical waveguide and the second optical waveguide, a first ground line arranged in a first region, and a second ground line arranged in a second region; and auxiliary electrodes that are arranged in the first region and the second region, are formed in contact with the dielectric film or within the insulating film, and apply bias voltages to the first optical waveguide and the second optical waveguide.