Abstract: An optical phase diversity receiver may include: a diffraction grating including grating surfaces; a first input waveguide to which a first optical signal is inputted; a second input waveguide to which a second optical signal is inputted; and a slab waveguide including an input terminal optically coupled with the first and second input waveguides, and an output terminal provided at a position at which optical signals reflected by the diffraction grating reach the slab waveguide. Every determined number of grating surfaces are chirped in an identical manner. The slab waveguide is configured to guide the first and the second optical signals to the diffraction grating and guide the optical signals reflected by the diffraction grating to the output terminal. The grating surfaces are configured such that each of the optical signals reflected by the diffraction grating is divided into the predetermined number by optical power distribution.

Abstract: An optical phase diversity receiver may include: a diffraction grating including grating surfaces; a first input waveguide to which a first optical signal is inputted; a second input waveguide to which a second optical signal is inputted; and a slab waveguide including an input terminal optically coupled with the first and second input waveguides, and an output terminal provided at a position at which optical signals reflected by the diffraction grating reach the slab waveguide. Every determined number of grating surfaces are chirped in an identical manner. The slab waveguide is configured to guide the first and the second optical signals to the diffraction grating and guide the optical signals reflected by the diffraction grating to the output terminal. The grating surfaces are configured such that each of the optical signals reflected by the diffraction grating is divided into the predetermined number by optical power distribution.

Abstract: An apparatus for measuring on-chip characteristics in a semiconductor circuit is provided. The apparatus for measuring the on-chip characteristics includes an oscillation unit, a timing test unit, and a selection unit. The oscillation unit is configured to selectively output a first oscillation signal responsive to a first control signal. The timing test unit is configured to generate a second oscillation signal using an input clock signal, generate a pulse from the second oscillation signal responsive to a second control signal, and determine whether an operating time violation has occurred based on a comparison of the second oscillation signal and the pulse. The selection unit is configured to select one of the output of the oscillation unit and the output of the timing test unit responsive to a test mode signal.

Abstract: An apparatus for measuring on-chip characteristics in a semiconductor circuit is provided. The apparatus for measuring the on-chip characteristics includes an oscillation unit, a timing test unit, and a selection unit. The oscillation unit is configured to selectively output a first oscillation signal responsive to a first control signal. The timing test unit is configured to generate a second oscillation signal using an input clock signal, generate a pulse from the second oscillation signal responsive to a second control signal, and determine whether an operating time violation has occurred based on a comparison of the second oscillation signal and the pulse. The selection unit is configured to select one of the output of the oscillation unit and the output of the timing test unit responsive to a test mode signal.