Patents by Inventor Shin Yong Beom

Shin Yong Beom has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Active ion-doped waveguide-plasmon resonance sensor based on upconversion of active ions and imaging system using the same
    Patent number: 6807323
    Abstract: An active ion-doped waveguide-plasmon resonance (AID WPR) sensor based on plasmon surface resonance (PSR) and an imaging system using the sensor are provided. An additional dielectric thin film doped with active ions and acting as a waveguide is formed on a metal thin film. The active ions are excited by an incident light beam and fluoresce light of a shorter wavelength than the incident light beam through upconversion coupled to surface plasmon resonance, thereby increasing fluorescence intensity variations with respect to incident light angle variations. The AID WPR sensor and the imaging system can detect a minor refractive index variation of a sample, which could not be measured using an existing SPR sensor, or a trace adsorbed material, with 100 times larger refractive index resolution than the existing SPR sensor.
    Type: Grant
    Filed: March 4, 2002
    Date of Patent: October 19, 2004
    Assignee: Electronics and Telecommunications Research Institute
    Inventors: Shin Yong Beom, Hyeon-Bong Pyo, Jiwook Jeong, Lee Sang-Kyung, Dong Ho Shin, Min-Gon Kim, Park Seon Hee
  • Active ion-doped waveguide-plasmon resonance sensor based on upconversion of active ions and imaging system using the same
    Publication number: 20030099422
    Abstract: An active ion-doped waveguide-plasmon resonance (AID WPR) sensor based on plasmon surface resonance (PSR) and an imaging system using the sensor are provided. An additional dielectric thin film doped with active ions and acting as a waveguide is formed on a metal thin film. The active ions are excited by an incident light beam and fluoresce light of a shorter wavelength than the incident light beam through upconversion coupled to surface plasmon resonance, thereby increasing fluorescence intensity variations with respect to incident light angle variations. The AID WPR sensor and the imaging system can detect a minor refractive index variation of a sample, which could not be measured using an existing SPR sensor, or a trace adsorbed material, with 100 times larger refractive index resolution than the existing SPR sensor.
    Type: Application
    Filed: March 4, 2002
    Publication date: May 29, 2003
    Inventors: Shin Yong Beom, Hyeon-Bong Pyo, Jiwook Jeong, Lee Sang-Kyung, Dong Ho Shin, Min-Gon Kim, Park Seon Hee