Patents by Inventor Shinchi Oki

Shinchi Oki has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method of testing semiconductor integrated circuits and testing board for use therein
    Publication number: 20010011906
    Abstract: A method of testing semiconductor integrated circuits comprises the step of simultaneously testing a plurality of semiconductor integrated circuit elements for electric characteristics by applying a voltage to the respective testing electrodes of the semiconductor integrated circuit elements. The simultaneous testing step includes the step of applying the voltage to the respective testing electrodes of the semiconductor integrated circuit elements via PTC elements provided for the semiconductor integrated circuit elements in a one-to-one relationship.
    Type: Application
    Filed: March 20, 2001
    Publication date: August 9, 2001
    Inventors: Yoshiro Nakata, Shinchi Oki