Patents by Inventor Shingo Hagiwara

Shingo Hagiwara has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7643325
    Abstract: A nonvolatile decision memory unit stores decision data indicating whether data stored in the normal memory cells is true or false. An inversion control circuit sets the inverting signal to a valid level with a predetermined probability. A write circuit writes data having logic which is inverse logic of data to be rewritten to the normal memory cells and writes decision data indicating false to the decision memory unit when the inverting signal indicates a valid level. Since inverse data is rewritten at a predetermined frequency, an imprint is prevented when a read operation is executed repetitively. Moreover, since frequent repeating of reverse polarization of the ferroelectric capacitor due to a rewrite operation is prevented, deterioration of the ferroelectric capacitor due to reverse polarization is minimized. Thus, occurrence of the imprint and deterioration of characteristics in the ferroelectric capacitor is prevented, and the reliability of the ferroelectric memory is improved.
    Type: Grant
    Filed: August 31, 2007
    Date of Patent: January 5, 2010
    Assignee: Fujitsu Microelectronics Limited
    Inventors: Shingo Hagiwara, Yoshiaki Kaneko, Amane Inoue, Akihito Kumagai, Isao Fukushi
  • Publication number: 20080175034
    Abstract: A nonvolatile decision memory unit stores decision data indicating whether data stored in the normal memory cells is true or false. An inversion control circuit sets the inverting signal to a valid level with a predetermined probability. A write circuit writes data having logic which is inverse logic of data to be rewritten to the normal memory cells and writes decision data indicating false to the decision memory unit when the inverting signal indicates a valid level. Since inverse data is rewritten at a predetermined frequency, an imprint is prevented when a read operation is executed repetitively. Moreover, since frequent repeating of reverse polarization of the ferroelectric capacitor due to a rewrite operation is prevented, deterioration of the ferroelectric capacitor due to reverse polarization is minimized. Thus, occurrence of the imprint and deterioration of characteristics in the ferroelectric capacitor is prevented, and the reliability of the ferroelectric memory is improved.
    Type: Application
    Filed: August 31, 2007
    Publication date: July 24, 2008
    Inventors: Shingo Hagiwara, Yoshiaki Kaneko, Amane Inoue, Akihito Kumagai, Isao Fukushi
  • Patent number: 6365443
    Abstract: On a semiconductor wafer, there are formed chip areas for storing memory areas, scribe areas for cutting the semiconductor wafer, pads for supplying electric signals from the outside in order to write data into the memory areas, and lead wires for electrically connecting the pads with the memory areas. The pads are formed within the scribe areas. After data has been written into the memory areas through the pads, the semiconductor wafer is cut along the scribe areas, thereby obtaining semiconductor chips. At the time of this cutting, the pads or the lead wires are cut.
    Type: Grant
    Filed: March 30, 2000
    Date of Patent: April 2, 2002
    Assignee: Fujitsu Limited
    Inventors: Shingo Hagiwara, Amane Inoue, Eiichi Nagai, Masaji Inami, Tohru Takeshima, Kouichi Noro, Hideaki Suzuki