Patents by Inventor Shingo Inazumi

Shingo Inazumi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11619591
    Abstract: An image inspection apparatus includes: an image capturing unit which captures images of an object; a transparent illumination unit which has a light-emitting surface which radiates light to the object and is configured to be able to control a light-emitting position on the light-emitting surface and a radiation direction of the light; and a control unit which is configured to control the image capturing unit and the illumination unit. The control unit causes the illumination unit to change the light-emitting position and the radiation direction, causes the image capturing unit to capture images of the object, identifies a light-emitting position and a radiation direction of the illumination unit when a measurement point of the surface of the object is illuminated from images of the object, and calculates a distance to the measurement point on the basis of the identified light-emitting position and the identified radiation direction.
    Type: Grant
    Filed: January 15, 2019
    Date of Patent: April 4, 2023
    Assignee: OMRON Corporation
    Inventors: Yutaka Kato, Shingo Inazumi
  • Patent number: 11567013
    Abstract: An image inspection device and a lighting device capable of setting an irradiation solid angle for each location of a visual field and capable of miniaturization are provided. The image inspection device includes a photographing portion that photographs the target, and a light transmissible lighting portion that is disposed between the target and the photographing portion and configured to irradiate light in a direction toward the target. The lighting portion includes a plurality of light-emitting portions that is arranged in a matrix form and configured to be capable of selectively emitting light, and an optical system configured to control irradiation directions of the light emitted from each of the plurality of light-emitting portions to be directions corresponding to positions of each of the plurality of light-emitting portions.
    Type: Grant
    Filed: January 16, 2019
    Date of Patent: January 31, 2023
    Assignee: OMRON Corporation
    Inventors: Yutaka Kato, Shingo Inazumi
  • Patent number: 11536667
    Abstract: The image inspection apparatus includes an image capturing unit which captures images of an object, a transparent illumination unit disposed between the object and the image capturing unit, and a control unit configured to control the image capturing unit and the illumination unit. The illumination unit radiates light to the object in a first direction and causes the light to scan and radiates light to the object in a second direction and causes the light to scan. The image capturing unit captures images of the object. The control unit identifies a light-emitting position of the illumination unit when a measurement point of the surface of the object is illuminated from images of the object captured, and calculates a distance to the measurement point on the basis of the identified light-emitting position, the first direction and the second direction.
    Type: Grant
    Filed: January 15, 2019
    Date of Patent: December 27, 2022
    Assignee: OMRON Corporation
    Inventors: Yutaka Kato, Shingo Inazumi
  • Patent number: 11303821
    Abstract: An illumination device includes illumination units for irradiating light on an object and a substrate member, which is an example of a holding mechanism for detachably holding the illumination units according to a predetermined disposition rule. The substrate member has a connection part for electrically connecting with a controller. The substrate member holds a part of the illumination units by linking parts.
    Type: Grant
    Filed: January 16, 2019
    Date of Patent: April 12, 2022
    Assignee: OMRON Corporation
    Inventors: Shingo Inazumi, Jaewook Hwang, Yutaka Kato
  • Patent number: 11080843
    Abstract: An image inspecting apparatus includes at least one image capturing part, a lighting part, a control part including a moving part, a searching part analyzing an image captured by the image capturing part under a first image capturing condition and searching for a defect candidate from an object under inspection, and a determining part. When the searching part finds the defect candidate from the object under inspection, the control part controls an image capturing condition such that a part where the defect candidate is found by the searching part is photographed under a second image capturing condition that is clearer than the first image capturing condition. The determining part analyzes an image captured by the image capturing part under the second image capturing condition and determines whether the defect of the object under inspection is present or absent.
    Type: Grant
    Filed: December 14, 2018
    Date of Patent: August 3, 2021
    Assignee: OMRON Corporation
    Inventors: Shingo Inazumi, Yutaka Kato
  • Patent number: 10909672
    Abstract: An appearance inspection system enabling a route to be easily set when a target is imaged while causing a relative position of an imaging device with respect to the target to be different is provided. A decision part decides a plurality of relative position candidates of the imaging device with respect to the target at which focus of a lens module is possible on the inspection target position with regard to each of a plurality of the inspection target positions on the target. A selection part selects relative positions one by one from corresponding plurality of relative position candidates for each of the plurality of inspection target positions and selects a route candidate satisfying a preset requirement from a plurality of route candidates generated by sequentially connecting the plurality of selected relative positions as a designation route.
    Type: Grant
    Filed: January 16, 2019
    Date of Patent: February 2, 2021
    Assignee: OMRON Corporation
    Inventors: Shingo Inazumi, Yutaka Kato, Naoya Nakashita
  • Patent number: 10863069
    Abstract: An image processing system and a setting method capable of performing lighting setting of illumination in a simpler manner are provided. The control device (100) evaluates evaluation lighting patterns (xi) one by one to calculate evaluation values (Pi), and uses coefficients (1i) determined based on the evaluation values (Pi) to linearly combine each evaluation lighting pattern (xi) to determine a lighting pattern for measurement (L).
    Type: Grant
    Filed: December 17, 2018
    Date of Patent: December 8, 2020
    Assignee: OMRON Corporation
    Inventors: Jaewook Hwang, Shingo Inazumi, Yutaka Kato
  • Patent number: 10748020
    Abstract: A controller includes a specifying part and a reception part. The specifying part specifies positions where the illumination units are connected. The reception part presents a lightable area and an unlightable area in different modes based on the positions where the illumination units are connected, the positions being specified by the specifying part. The reception part receives settings of the lighting conditions for the lightable area.
    Type: Grant
    Filed: January 17, 2019
    Date of Patent: August 18, 2020
    Assignee: OMRON Corporation
    Inventors: Shingo Inazumi, Jaewook Hwang, Yutaka Kato
  • Publication number: 20190289189
    Abstract: An illumination device includes illumination units for irradiating light on an object and a substrate member, which is an example of a holding mechanism for detachably holding the illumination units according to a predetermined disposition rule. The substrate member has a connection part for electrically connecting with a controller. The substrate member holds a part of the illumination units by linking parts.
    Type: Application
    Filed: January 16, 2019
    Publication date: September 19, 2019
    Applicant: OMRON Corporation
    Inventors: Shingo INAZUMI, Jaewook HWANG, Yutaka KATO
  • Publication number: 20190286929
    Abstract: A controller includes a specifying part and a reception part. The specifying part specifies positions where the illumination units are connected. The reception part presents a lightable area and an unlightable area in different modes based on the positions where the illumination units are connected, the positions being specified by the specifying part. The reception part receives settings of the lighting conditions for the lightable area.
    Type: Application
    Filed: January 17, 2019
    Publication date: September 19, 2019
    Applicant: OMRON Corporation
    Inventors: Shingo INAZUMI, Jaewook HWANG, Yutaka KATO
  • Patent number: 10417754
    Abstract: An inspection system is provided with an inspection device configured to examine the external features of an object; and a control device for controlling the inspection device; the inspection device including: a substantially column-shaped first barrel that includes a first through hole configured for an object to pass therethrough; and a plurality of imaging units provided on the inner peripheral surface which forms the first through hole in the first barrel; and the control device including: an image processing unit configured to process an image captured and output by each of the imaging units for the purpose of inspection.
    Type: Grant
    Filed: March 2, 2017
    Date of Patent: September 17, 2019
    Assignee: OMRON Corporation
    Inventors: Yuki Kimura, Akira Matsui, Shingo Inazumi
  • Publication number: 20190279354
    Abstract: An appearance inspection system enabling a route to be easily set when a target is imaged while causing a relative position of an imaging device with respect to the target to be different is provided. A decision part decides a plurality of relative position candidates of the imaging device with respect to the target at which focus of a lens module is possible on the inspection target position with regard to each of a plurality of the inspection target positions on the target. A selection part selects relative positions one by one from corresponding plurality of relative position candidates for each of the plurality of inspection target positions and selects a route candidate satisfying a preset requirement from a plurality of route candidates generated by sequentially connecting the plurality of selected relative positions as a designation route.
    Type: Application
    Filed: January 16, 2019
    Publication date: September 12, 2019
    Applicant: OMRON Corporation
    Inventors: Shingo INAZUMI, Yutaka KATO, NAOYA NAKASHITA
  • Publication number: 20190272630
    Abstract: An image inspecting apparatus includes at least one image capturing part, a lighting part, a control part including a moving part, a searching part analyzing an image captured by the image capturing part under a first image capturing condition and searching for a defect candidate from an object under inspection, and a determining part. When the searching part finds the defect candidate from the object under inspection, the control part controls an image capturing condition such that a part where the defect candidate is found by the searching part is photographed under a second image capturing condition that is clearer than the first image capturing condition. The determining part analyzes an image captured by the image capturing part under the second image capturing condition and determines whether the defect of the object under inspection is present or absent.
    Type: Application
    Filed: December 14, 2018
    Publication date: September 5, 2019
    Applicant: OMRON Corporation
    Inventors: Shingo INAZUMI, Yutaka KATO
  • Publication number: 20190268517
    Abstract: An image processing system and a setting method capable of performing lighting setting of illumination in a simpler manner are provided. The control device (100) evaluates evaluation lighting patterns (xi) one by one to calculate evaluation values (Pi), and uses coefficients (1i) determined based on the evaluation values (Pi) to linearly combine each evaluation lighting pattern (xi) to determine a lighting pattern for measurement (L).
    Type: Application
    Filed: December 17, 2018
    Publication date: August 29, 2019
    Applicant: OMRON Corporation
    Inventors: Jaewook HWANG, Shingo INAZUMI, Yutaka KATO
  • Publication number: 20190265170
    Abstract: The image inspection apparatus includes an image capturing unit which captures images of an object, a transparent illumination unit disposed between the object and the image capturing unit, and a control unit configured to control the image capturing unit and the illumination unit. The illumination unit radiates light to the object in a first direction and causes the light to scan and radiates light to the object in a second direction and causes the light to scan. The image capturing unit captures images of the object. The control unit identifies a light-emitting position of the illumination unit when a measurement point of the surface of the object is illuminated from images of the object captured, and calculates a distance to the measurement point on the basis of the identified light-emitting position, the first direction and the second direction.
    Type: Application
    Filed: January 15, 2019
    Publication date: August 29, 2019
    Applicant: OMRON Corporation
    Inventors: Yutaka KATO, Shingo INAZUMI
  • Publication number: 20190265171
    Abstract: An image inspection apparatus includes: an image capturing unit which captures images of an object; a transparent illumination unit which has a light-emitting surface which radiates light to the object and is configured to be able to control a light-emitting position on the light-emitting surface and a radiation direction of the light; and a control unit which is configured to control the image capturing unit and the illumination unit. The control unit causes the illumination unit to change the light-emitting position and the radiation direction, causes the image capturing unit to capture images of the object, identifies a light-emitting position and a radiation direction of the illumination unit when a measurement point of the surface of the object is illuminated from images of the object, and calculates a distance to the measurement point on the basis of the identified light-emitting position and the identified radiation direction.
    Type: Application
    Filed: January 15, 2019
    Publication date: August 29, 2019
    Applicant: OMRON Corporation
    Inventors: Yutaka Kato, Shingo Inazumi
  • Publication number: 20190242830
    Abstract: An image inspection device and a lighting device capable of setting an irradiation solid angle for each location of a visual field and capable of miniaturization are provided. The image inspection device includes a photographing portion that photographs the target, and a light transmissible lighting portion that is disposed between the target and the photographing portion and configured to irradiate light in a direction toward the target. The lighting portion includes a plurality of light-emitting portions that is arranged in a matrix form and configured to be capable of selectively emitting light, and an optical system configured to control irradiation directions of the light emitted from each of the plurality of light-emitting portions to be directions corresponding to positions of each of the plurality of light-emitting portions.
    Type: Application
    Filed: January 16, 2019
    Publication date: August 8, 2019
    Applicant: OMRON Corporation
    Inventors: Yutaka KATO, Shingo INAZUMI
  • Publication number: 20180005365
    Abstract: An inspection system is provided with an inspection device configured to examine the external features of an object; and a control device for controlling the inspection device; the inspection device including: a substantially column-shaped first barrel that includes a first through hole configured for an object to pass therethrough; and a plurality of imaging units provided on the inner peripheral surface which forms the first through hole in the first barrel; and the control device including: an image processing unit configured to process an image captured and output by each of the imaging units for the purpose of inspection.
    Type: Application
    Filed: March 2, 2017
    Publication date: January 4, 2018
    Inventors: Yuki KIMURA, Akira MATSUI, Shingo INAZUMI
  • Patent number: 8950896
    Abstract: An illumination apparatus includes lenses, a first casing that has a radiation plane provided with annularly arranged windows for attaching the lenses, respectively, independently, and that has an opening at a position opposite to the radiation plane, and a first substrate associated with each of the lenses and accordingly disposed. The first substrate has at least one light emitting device mounted thereon. The first casing includes a holding portion associated with each of the windows. The holding portion each permits the lens to be attached to the first casing from a side thereof having the opening and also restrains the lens from moving through the first casing toward the radiation plane, and when the lens is attached to the first casing, the lens has an optical axis in a direction having a predetermined angle relative to a center axis of the first casing.
    Type: Grant
    Filed: March 16, 2011
    Date of Patent: February 10, 2015
    Assignee: OMRON Corporation
    Inventors: Naoki Nishimori, Akira Matsui, Rie Masuda, Jun Ota, Sayuki Nakada, Shingo Inazumi
  • Patent number: D911419
    Type: Grant
    Filed: October 9, 2019
    Date of Patent: February 23, 2021
    Assignee: OMRON Corporation
    Inventors: Masaru Horie, Shingo Inazumi