Patents by Inventor Shingo Matsuno

Shingo Matsuno has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • PRIORITY CONTROL SYSTEM, PRIORITY CONTROLLER, AND ACTUATOR
    Publication number: 20240090106
    Abstract: This invention is capable of detailed control in accordance with the mode of using a lighting apparatus and the like.
    Type: Application
    Filed: July 29, 2021
    Publication date: March 14, 2024
    Applicant: JIMBO ELECTRIC Co., Ltd.
    Inventors: Shingo Ishiyama, Kazuhiro Naito, Tatsuo Matsuno, Yoma Isakawa, Yasuhiro Suichi, Masahiro Fujita
  • Semiconductor test system and relay driving test method therefor
    Patent number: 8456171
    Abstract: It is aimed to provide a probe card test system and a relay driving test method for probe cards which can automatically and continuously perform tests without bringing needle tips into contact with a number of relays mounted on a probe card and by using a device. In a probe card test system for testing a probe card using a tester, the probe card includes a substrate having a first probe and a first relay connected to the first probe, a relay controller for the first relay and a first measurement channel for connecting the first relay and the first probe to the tester are further provided on the substrate. The tester includes a DC power supply, a control board for controlling the relay controller for the first relay, and a first measurement circuit connected to the first measurement channel, the DC power supply and a voltmeter. The first measurement circuit includes a first resistor having a predetermined time constant and a first changeover switch to be connected to the first measurement channel.
    Type: Grant
    Filed: October 16, 2009
    Date of Patent: June 4, 2013
    Assignee: Japan Electronic Materials Corp.
    Inventors: Shingo Matsuno, Kenji Emura, Hiroki Kitamura
  • SEMICONDUCTOR TEST SYSTEM AND RELAY DRIVING TEST METHOD THEREFOR
    Publication number: 20110193562
    Abstract: It is aimed to provide a semiconductor test system and a relay driving test method therefor which can automatically and continuously perform tests without bringing needle tips into contact with a number of relays mounted on a probe card and by using a device. In a semiconductor test system with a probe card and a tester, the probe card includes a substrate having a probe and a relay connected to the probe, a relay controller for the relay and a first measurement channel for connecting the relay and the probe to the tester are further provided on the substrate. The tester includes a DC power supply, a control board for controlling the relay controller, and a first circuit connected to the first measurement channel, the DC power supply and a voltmeter. The first measurement circuit includes a first resistor having a predetermined time constant and a first changeover switch to be connected to measurement channel.
    Type: Application
    Filed: October 16, 2009
    Publication date: August 11, 2011
    Applicant: JAPAN ELECTRONIC MATERIALS CORP.
    Inventors: Shingo Matsuno, Kenji Emura, Hiroki Kitamura