Abstract: An IC element supplied to a testing station is guided by a rail and a guide member to move by its own weight. At least one of the rail and guide member has built therein plate-shaped ceramic heater or plate-shaped silicone rubber heater. The guide member urges the IC element against the rail to heat the IC element. An auxiliary stopper is provided opposite but aslant to the IC element sliding surface of the rail. The IC element moving on the rail is yieldingly urged by the auxiliary stopper against the sliding surface of the rail, braked and engages an engaging piece at the lower end of the auxiliary stopper. The IC element is disengaged from the engaging piece to slightly move and stopped by a main stopper, where the IC element is tested. A plurality of such testing passages are provided, and IC elements simultaneously tested in the testing passage are fed to discharge rails respectively corresponding thereto.

Abstract: In a contact drive assembly for use with test equipment for testing, for example, an IC element, a movable contact piece is brought into contact with a terminal pin of the IC element to connect it to a measuring circuit. A flexible tube is disposed adjacent the movable contact piece and compressed air is supplied to the flexible tube to inflate it, biasing the movable contact piece to engage with or disengage from the terminal pin.