Patents by Inventor Shinichi Kuwayama

Shinichi Kuwayama has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Methods for measurement, analysis and assessment of ground structure
    Publication number: 20040034472
    Abstract: For determination of the laminar structure and other characteristics of a ground, oscillation sensors for detecting the vertical component or vertical and horizontal components of oscillations are disposed at three or more points within a comparatively small area at ground level to simultaneously measure microseisms at the respective points, if necessary with locations of said points being varied and measurements be performed at the respective locations and the vertical oscillation data or vertical and horizontal oscillation data thus generated are analyzed. This method not only permits an expedient, positive and accurate assessment of the laminar structure and other characteristics of the ground but also permits the measurement of ground structure even when the area available for measurement is small.
    Type: Application
    Filed: August 4, 2003
    Publication date: February 19, 2004
    Inventors: Koji Tokimatsu, Shinichi Kuwayama
  • Methods for measurement, analysis and assessment of ground structure
    Patent number: 6612398
    Abstract: For determination of the laminar structure and other characteristics of a ground, oscillation sensors for detecting the vertical component or vertical and horizontal components of oscillations are disposed at three or more points within a comparatively small area at ground level to simultaneously measure microseisms at the respective points, if necessary with locations of said points being varied and measurements be performed at the respective locations and the vertical oscillation data or vertical and horizontal oscillation data thus generated are analyzed. This method not only permits an expedient, positive and accurate assessment of the laminar structure and other characteristics of the ground but also permits the measurement of ground structure even when the area available for measurement is small.
    Type: Grant
    Filed: August 15, 2000
    Date of Patent: September 2, 2003
    Inventors: Koji Tokimatsu, Shinichi Kuwayama
  • Methods for measurement, analysis and assessment of ground structure
    Patent number: 6253870
    Abstract: For determination of the laminar structure and other characteristics of a ground, oscillation sensors for detecting the vertical component or vertical and horizontal components of oscillations are disposed at three or more points within a comparatively small area at ground level to simultaneously measure microseisms at the respective points, if necessary with locations of said points being varied and measurements be performed at the respective locations and the vertical oscillation data or vertical and horizontal oscillation data thus generated are analyzed. This method not only permits an expedient, positive and accurate assessment of the laminar structure and other characteristics of the ground but also permits the measurement of ground structure even when the area available for measurement is small.
    Type: Grant
    Filed: July 3, 1997
    Date of Patent: July 3, 2001
    Inventors: Koji Tokimatsu, Shinichi Kuwayama