Patents by Inventor Shinichi Ohtsu

Shinichi Ohtsu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5745370
    Abstract: An electromagnetic field intensity calculating device calculates according to a moment method the intensities of the electric field and the magnetic field radiated by an electric circuit device having metal portions and dielectric portions.
    Type: Grant
    Filed: May 1, 1995
    Date of Patent: April 28, 1998
    Assignee: Fujitsu Limited
    Inventors: Shinichi Ohtsu, Makoto Mukai, Sekiji Nishino, Kenji Nagase
  • Patent number: 5691631
    Abstract: The apparatus of the present invention has an interface circuit which returns power in H-level output state, a first power circuit supplying a first supply voltage, and a second power circuit supplying a second supply voltage. The second power circuit receives the entered first supply voltage from the first power circuit, and in a first operation mode (L-level output condition), brings the first supply voltage of 3.3 V down to the second supply voltage of 1.5 V and supplies same to the interface circuit. In a second operation mode (H-level output condition) of the load circuit, a current output from the load circuit is brought up to the first supply voltage of 3.3 V and feeds same back to the first power circuit.
    Type: Grant
    Filed: June 5, 1995
    Date of Patent: November 25, 1997
    Assignee: Fujitsu Limited
    Inventors: Hiroshi Shimamori, Ryuichi Yanagisawa, Shinichi Ohtsu
  • Patent number: 5650935
    Abstract: In a calculation apparatus for calculating intensity of an electromagnetic field radiated from an electronic circuit device, the apparatus includes: an input data file for storing structural information of the device; an input unit for receiving structural information of the device to be analyzed from the input data file; a section unit for dividing the device into applicable sections for a distributed constant circuit method and inapplicable sections for the method by analyzing the structural information of the device; a first calculation unit for calculating current distribution at the applicable sections using the distributed constant circuit method; a second calculation unit for calculating current distribution at the inapplicable sections using a moment method and using the current distribution obtained by the first calculation unit; a third calculation unit for calculating the intensity of electromagnetic fields radiated from the device based on the current distributions obtained from the first and seco
    Type: Grant
    Filed: November 30, 1994
    Date of Patent: July 22, 1997
    Assignee: Fujitsu Limited
    Inventors: Sekiji Nishino, Makoto Mukai, Shinichi Ohtsu, Kenji Nagase