Abstract: A semiconductor device includes first and second processor cores configured to perform a lock step operation and including first and second scan chains. The semiconductor device further includes a scan test control unit that controls a scan test of the first and second processor cores using the first and second scan chains, and a start-up control unit that outputs a reset signal for bringing the first and second processor cores into a reset state. The start-up control unit outputs an initialization scan request before the start of a lock step operation, and the scan test control unit performs an initialization scan test operation on the first and second processor cores by using an initialization pattern.

Abstract: A semiconductor device includes first and second CPUs, first and second SPUs for controlling a snoop operation, a controller supporting ASIL D of a functional safety standard and a memory. The controller sets permission of the snoop operation to the first and second SPUs when a software lock-step is not performed. The controller sets prohibition of the snoop operation to the first and second SPUs when the software lock-step is performed. The first CPU executes a first software for the software lock-step, and writes an execution result in a first area for the memory. The second CPU executes a second software for the software lock-step, and writes an execution result in a second area of the memory. The execution result written in the first area is compared with the execution result written in the second area.

Abstract: A semiconductor device has a timer unit and a processing unit. The timer unit includes a binary counter, a first converter that converts a first count value output from the binary counter to a gray code to output as first gray code data. The processing unit includes a first synchronizer that captures the first gray code data transferred from the timer unit in synchronization with the system clock signal and outputs the captured first gray code data as second gray code data, and a fault detection unit that generates a data for fault detection based on the first gray code data transferred from the timer unit and compares a second count value based on the second gray code data with a third counter value based on the data for fault detection.

Abstract: A semiconductor device has a timer unit and a processing unit. The timer unit includes a binary counter, a first converter that converts a first count value output from the binary counter to a gray code to output as first gray code data. The processing unit includes a first synchronizer that captures the first gray code data transferred from the timer unit in synchronization with the system clock signal and outputs the captured first gray code data as second gray code data, and a fault detection unit that generates a data for fault detection based on the first gray code data transferred from the timer unit and compares a second count value based on the second gray code data with a third counter value based on the data for fault detection.

Abstract: A semiconductor device has a timer unit and a processing unit. The timer unit includes a binary counter, a first converter that converts a first count value output from the binary counter to a gray code to output as first gray code data. The processing unit includes a first synchronizer that captures the first gray code data transferred from the timer unit in synchronization with the system clock signal and outputs the captured first gray code data as second gray code data, and a fault detection unit that generates a data for fault detection based on the first gray code data transferred from the timer unit and compares a second count value based on the second gray code data with a third counter value based on the data for fault detection.

Abstract: A semiconductor device has a timer unit and a processing unit. The timer unit includes a binary counter, a first converter that converts a first count value output from the binary counter to a gray code to output as first gray code data. The processing unit includes a first synchronizer that captures the first gray code data transferred from the timer unit in synchronization with the system clock signal and outputs the captured first gray code data as second gray code data, and a fault detection unit that generates a data for fault detection based on the first gray code data transferred from the timer unit and compares a second count value based on the second gray code data with a third counter value based on the data for fault detection.

Abstract: A semiconductor device includes first and second CPUs, first and second SPUs for controlling a snoop operation, a controller supporting ASIL D of a functional safety standard and a memory. The controller sets permission of the snoop operation to the first and second SPUs when a software lock-step is not performed. The controller sets prohibition of the snoop operation to the first and second SPUs when the software lock-step is performed. The first CPU executes a first software for the software lock-step, and writes an execution result in a first area for the memory. The second CPU executes a second software for the software lock-step, and writes an execution result in a second area of the memory. The execution result written in the first area is compared with the execution result written in the second area.

Abstract: A semiconductor device includes first and second CPUs, first and second SPUs for controlling a snoop operation, a controller supporting ASIL D of a functional safety standard and a memory. The controller sets permission of the snoop operation to the first and second SPUs when a software lock-step is not performed. The controller sets prohibition of the snoop operation to the first and second SPUs when the software lock-step is performed. The first CPU executes a first software for the software lock-step, and writes an execution result in a first area for the memory. The second CPU executes a second software for the software lock-step, and writes an execution result in a second area of the memory. The execution result written in the first area is compared with the execution result written in the second area.

Abstract: A semiconductor apparatus includes a storage circuit, a processing circuit that performs processing using data stored in the storage circuit and writes data into the storage circuit as the processing is performed, a scan test circuit that executes a scan test on the processing circuit when the processing circuit does not perform processing, and an inhibit circuit that inhibits writing of data from the processing circuit to the storage circuit when the scan test on the processing circuit is executed.

Abstract: A semiconductor device includes first and second CPUs, first and second SPUs for controlling a snoop operation, a controller supporting ASIL D of a functional safety standard and a memory. The controller sets permission of the snoop operation to the first and second SPUs when a software lock-step is not performed. The controller sets prohibition of the snoop operation to the first and second SPUs when the software lock-step is performed. The first CPU executes a first software for the software lock-step, and writes an execution result in a first area for the memory. The second CPU executes a second software for the software lock-step, and writes an execution result in a second area of the memory. The execution result written in the first area is compared with the execution result written in the second area.

Abstract: A semiconductor apparatus includes a storage circuit, a processing circuit that performs processing using data stored in the storage circuit and writes data into the storage circuit as the processing is performed, a scan test circuit that executes a scan test on the processing circuit when the processing circuit does not perform processing, and an inhibit circuit that inhibits writing of data from the processing circuit to the storage circuit when the scan test on the processing circuit is executed.

Abstract: A semiconductor apparatus includes a storage circuit, a processing circuit that performs processing using data stored in the storage circuit and writes data into the storage circuit as the processing is performed, a scan test circuit that executes a scan test on the processing circuit when the processing circuit does not perform processing, and an inhibit circuit that inhibits writing of data from the processing circuit to the storage circuit when the scan test on the processing circuit is executed.

Abstract: A semiconductor apparatus includes a storage circuit, a processing circuit that performs processing using data stored in the storage circuit and writes data into the storage circuit as the processing is performed, a scan test circuit that executes a scan test on the processing circuit when the processing circuit does not perform processing, and an inhibit circuit that inhibits writing of data from the processing circuit to the storage circuit when the scan test on the processing circuit is executed.

Abstract: An object of the present invention is to achieve fast data processing. A unit (FF) is included for selecting whether a central processing unit (CPU) performs instruction reading in units of 16 bits (a first word length) or in units of 32 bits (a second word length). Depending on whether instruction reading is performed in units of 16 bits or 32 bits, increment values (+2 and +4) by which a program counter (PC) is incremented are switched. Data reading or writing is performed in units of a given data length irrespective of the selecting unit. When the CPU issues a request for instruction reading in units of 16 bits or 32 bits or for data reading or writing, a bus control unit performs reading or writing a predetermined number of times according to a bus width designated for a resource located at an address specified in the request. The bus control unit causes the CPU to wait until an instruction of 16 or 32 bits long (read data) requested by the CPU gets ready.

Abstract: An apparatus and method for selecting whether a central processing unit (CPU) performs instruction reading in units of 16 bits (a first word length) or in units of 32 bits (a second word length). Depending on whether instruction reading is performed in units of 16 bits or 32 bits, increment values (+2 and +4) by which a program counter (PC) is incremented are switched. Data reading or writing is performed in units of a given data length irrespective of the selecting unit. When the CPU issues a request for instruction reading in units of 16 bits or 32 bits or for data reading or writing, a bus control unit performs reading or writing a predetermined number of times according to a bus width designated for a resource located at an address specified in the request.

Abstract: An object of the present invention is to achieve fast data processing. A unit (FF) is included for selecting whether a central processing unit (CPU) performs instruction reading in units of 16 bits (a first word length) or in units of 32 bits (a second word length). Depending on whether instruction reading is performed in units of 16 bits or 32 bits, increment values (+2 and +4) by which a program counter (PC) is incremented are switched. Data reading or writing is performed in units of a given data length irrespective of the selecting unit. When the CPU issues a request for instruction reading in units of 16 bits or 32 bits or for data reading or writing, a bus control unit performs reading or writing a predetermined number of times according to a bus width designated for a resource located at an address specified in the request. The bus control unit causes the CPU to wait until an instruction of 16 or 32 bits long (read data) requested by the CPU gets ready.

Abstract: Disclosed here is a data processor provided with an addressing mode for calculating each effective address from the displacement (reference address) included in the subject instruction and the information retained in an index register allocated to a general-purpose register so as to minimize an increase of the logical/physical scale. The value in the index register is increased so as to be shifted according to the memory access size, for example, by one when the memory access size is byte and by two when the memory access size is word. Because both extension and shifting are included in the effective address calculation, the number of instructions, as well as the number of execution states are reduced. And, because the array size is smaller than the address space size, the upper part of each general-purpose register is used as a data register, thereby the data amount to be written in each general-purpose register is increased and the number of times for reading/writing from/in the subject memory is reduced.