Patents by Inventor Shinichi Tamabayashi

Shinichi Tamabayashi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method of inspecting optical waveguide substrate for optical conduction at increased speed and also inspecting optical waveguide substrate for crosstalk
    Patent number: 7106426
    Abstract: There is disclosed a method of inspecting an optical waveguide substrate for optical conduction at an increased inspecting rate and also inspecting an optical waveguide substrate for cross-talk. According to the disclosed method, a laser beam is applied from a laser beam scanning optical system to one end face of an optical waveguide of an optical waveguide substrate which is an object to be inspected, and the laser beam emitted from the other end of the optical waveguide is detected by a CCD camera, which output detected result data. A light spot position confirming device compares the detected result data with stored data.
    Type: Grant
    Filed: December 19, 2002
    Date of Patent: September 12, 2006
    Assignee: NEC Toppan Circuit Solutions, Inc.
    Inventors: Hideo Kikuchi, Mikio Oda, Hikaru Kouta, Sakae Kitajo, Yuzo Shimada, Yoshio Matsumoto, Shinichi Tamabayashi
  • Method of inspecting optical waveguide substrate for optical conduction at increased speed and also inspecting optical waveguide substrate for crosstalk
    Publication number: 20030117614
    Abstract: There is disclosed a method of inspecting an optical waveguide substrate for optical conduction at an increased inspecting rate and also inspecting an optical waveguid—e substrate for cross-talk. According to the disclosed method, a laser beam is applied from a laser beam scanning optical system to one end face of an optical waveguide of an optical waveguide substrate which is an object to be inspected, and the laser beam emitted from the other end of the optical waveguide is detected by a CCD camera, which output detected result data. A light spot position confirming device compares the detected result data with stored data.
    Type: Application
    Filed: December 19, 2002
    Publication date: June 26, 2003
    Applicant: NEC Toppan Circuit Solutions, Inc.
    Inventors: Hideo Kikuchi, Mikio Oda, Hikaru Kouta, Sakae Kitajo, Yuzo Shimada, Yoshio Matsumoto, Shinichi Tamabayashi