Patents by Inventor Shinichi Tomonaga

Shinichi Tomonaga has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7599052
    Abstract: A defect marking device includes a flaw inspection device which has a plurality of light-receiving parts that identify reflected lights coming from an inspection plane of a metal strip under two or more of optical conditions different from each other; a signal processing section that judges the presence/absence of surface flaw on the inspection plane based on a combination of reflected light components identified under these optical conditions different from each other; and a marking device which applies marking that indicates information relating to the flaw on the surface of the metal strip.
    Type: Grant
    Filed: August 13, 2008
    Date of Patent: October 6, 2009
    Assignee: NKK Corporation
    Inventors: Mitsuaki Uesugi, Shoji Yoshikawa, Masaichi Inomata, Tsutomu Kawamura, Takahiko Oshige, Hiroyuki Sugiura, Akira Kazama, Tsuneo Suyama, Yasuo Kushida, Shuichi Harada, Hajime Tanaka, Osamu Uehara, Shuji Kaneto, Masahiro Iwabuchi, Kozo Harada, Shinichi Tomonaga, Shigemi Fukuda
  • Publication number: 20090086209
    Abstract: A defect marking device includes a flaw inspection device which has a plurality of light-receiving parts that identify reflected lights coming from an inspection plane of a metal strip under two or more of optical conditions different from each other; a signal processing section that judges the presence/absence of surface flaw on the inspection plane based on a combination of reflected light components identified under these optical conditions different from each other; and a marking device which applies marking that indicates information relating to the flaw on the surface of the metal strip.
    Type: Application
    Filed: August 13, 2008
    Publication date: April 2, 2009
    Applicant: NKK Corporation
    Inventors: Mitsuaki Uesugi, Shoji Yoshikawa, Masaichi Inomata, Tsutomu Kawamura, Takahiko Oshige, Hiroyuki Sugiura, Akira Kazama, Tsuneo Suyama, Yasuo Kushida, Shuichi Harada, Hajime Tanaka, Osamu Uehara, Shuji Kaneto, Masahiro Iwabuchi, Kozo Harada, Shinichi Tomonaga, Shigemi Fukuda
  • Patent number: 7423744
    Abstract: A defect marking device includes a flaw inspection device which has a plurality of light-receiving parts that identify reflected lights coming from an inspection plane of a metal strip under two or more of optical conditions different from each other; a signal processing section that judges the presence/absence of surface flaw on the inspection plane based on a combination of reflected light components identified under these optical conditions different from each other; and a marking device which applies marking that indicates information relating to the flaw on the surface of the metal strip.
    Type: Grant
    Filed: October 24, 2006
    Date of Patent: September 9, 2008
    Assignee: NKK Corporation
    Inventors: Mitsuaki Uesugi, Shoji Yoshikawa, Masaichi Inomata, Tsutomu Kawamura, Takahiko Oshige, Hiroyuki Sugiura, Akira Kazama, Tsuneo Suyama, Yasuo Kushida, Shuichi Harada, Hajime Tanaka, Osamu Uehara, Shuji Kaneto, Masahiro Iwabuchi, Kozo Harada, Shinichi Tomonaga, Shigemi Fukuda
  • Patent number: 7248366
    Abstract: The defect marking method comprises the steps of: installing a surface defect tester to detect surface flaw and a marker device to apply marking at defect position, in a continuous processing line of steel sheet; detecting the surface flaw on the steel sheet using the surface defect tester; determining defect name, defect grade, defect length, and defect position in the width direction of the steel sheet, on the basis of thus detected flaw information, further identifying the defect in terms of harmful defect, injudgicable defect, and harmless defect; applying tracking of the defect position for each of the harmful defect and the injudgicable defect; and applying marking to the defect position. The defect marking device comprises a defect inspection means having plurality of light-receiving parts and a signal processing section, and a marking means.
    Type: Grant
    Filed: September 17, 2001
    Date of Patent: July 24, 2007
    Assignee: NKK Corporation
    Inventors: Mitsuaki Uesugi, Shoji Yoshikawa, Masaichi Inomata, Tsutomu Kawamura, Takahiko Oshige, Hiroyuki Sugiura, Akira Kazama, Tsuneo Suyama, Yasuo Kushida, Shuichi Harada, Hajime Tanaka, Osamu Uehara, Shuji Kaneto, Masahiro Iwabuchi, Kozo Harada, Shinichi Tomonaga, Shigemi Fukuda
  • Publication number: 20070052964
    Abstract: A defect marking device includes a flaw inspection device which has a plurality of light-receiving parts that identify reflected lights coming from an inspection plane of a metal strip under two or more of optical conditions different from each other; a signal processing section that judges the presence/absence of surface flaw on the inspection plane based on a combination of reflected light components identified under these optical conditions different from each other; and a marking device which applies marking that indicates information relating to the flaw on the surface of the metal strip.
    Type: Application
    Filed: October 24, 2006
    Publication date: March 8, 2007
    Applicant: NKK Corporation
    Inventors: Mitsuaki Uesugi, Shoji Yoshikawa, Masaichi Inomata, Tsutomu Kawamura, Takahiko Oshige, Hiroyuki Sugiura, Akira Kazama, Tsuneo Suyama, Yasuo Kushida, Shuichi Harada, Hajime Tanaka, Osamu Uehara, Shuji Kaneto, Masahiro Iwabuchi, Kozo Harada, Shinichi Tomonaga, Shigemi Fukuda
  • Publication number: 20020154308
    Abstract: The defect marking method comprises the steps of: installing a surface defect tester to detect surface flaw and a marker device to apply marking at defect position, in a continuous processing line of steel sheet; detecting the surface flaw on the steel sheet using the surface defect tester; determining defect name, defect grade, defect length, and defect position in the width direction of the steel sheet, on the basis of thus detected flaw information, further identifying the defect in terms of harmful defect, injudgicable defect, and harmless defect; applying tracking of the defect position for each of the harmful defect and the injudgicable defect; and applying marking to the defect position. The defect marking device comprises a defect inspection means having plurality of light-receiving parts and a signal processing section, and a marking means.
    Type: Application
    Filed: September 17, 2001
    Publication date: October 24, 2002
    Applicant: NKK Corporation, a Japanese Corporation
    Inventors: Mitsuaki Uesugi, Shoji Yoshikawa, Masaichi Inomata, Tsutomu Kawamura, Takahiko Oshige, Hiroyuki Sugiura, Akira Kazama, Tsuneo Suyama, Yasuo Kushida, Shuichi Harada, Hajime Tanaka, Osamu Uehara, Shuji Kaneto, Masahiro Iwabuchi, Kozo Harada, Shinichi Tomonaga, Shigemi Fukuda
  • Patent number: 6315829
    Abstract: An apparatus for hot-dip coating a steel strip, comprising: (a) an annealing furnace for continuously annealing the steel strip, the annealing furnace having an entrance side and an exit side; (b) a coating pot having a molten metal coating bath for coating the annealed steel strip; (c) a snout through which the annealed steel strip is introduced into the molten metal coating bath, one end of the snout being connected to the annealing furnace and the other end being immersed into the molten metal coating bath; (d) a seal device for sealing between the annealing furnace and the snout, the seal device being disposed at the exit side of the annealing furnace; and (e) a discharge device for discharging a gas containing a metal vapor from the snout to outside of the snout, the metal vapor being evaporated from the molten metal coating bath in the snout.
    Type: Grant
    Filed: May 9, 2000
    Date of Patent: November 13, 2001
    Assignee: NKK Corporation
    Inventors: Toshio Ishii, Munehiro Ishioka, Akira Hiraya, Seishi Hatakeyama, Nobuyuki Ishida, Teruhisa Kuwana, Kazumi Jiromaru, Toshihiko Ooi, Hideyuki Suzuki, Shinichi Tomonaga, Hitoshi Oishi, Kentaro Akashi, Takayuki Fukui
  • Patent number: 6093452
    Abstract: A method for hot-dip coating a steel strip comprises: (a) continuously annealing the steel strip in an annealing furnace; (b) introducing the annealed steel strip into a molten metal coating bath through a snout; (c) dipping the annealed steel strip into the molten metal coating bath; (d) controlling a pressure inside of the snout; and (e) discharging a gas containing a metal vapor from the snout to outside of the snout. An apparatus comprises an annealing furnace, a coating pot, a control device for controlling a pressure inside the snout and a gas discharging device.
    Type: Grant
    Filed: February 23, 1998
    Date of Patent: July 25, 2000
    Assignee: NKK Corporation
    Inventors: Toshio Ishii, Munehiro Ishioka, Akira Hiraya, Seishi Hatakeyama, Nobuyuki Ishida, Teruhisa Kuwana, Kazumi Jiromaru, Toshihiko Ooi, Hideyuki Suzuki, Shinichi Tomonaga, Hitoshi Oishi, Kentaro Akashi, Takayuki Fukui