Patents by Inventor Shinichiro Totoki

Shinichiro Totoki has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9429505
    Abstract: In order for a parallel light beam to enable formation of an image at the center of a photodetector 52 without the use of an actuator for the adjustment by an order of micrometers, a particle size distribution measuring apparatus 1 is provided with: a control unit 70 for calculating the distribution of particle size; a lens 21, 22 which is located between a light source unit 40 and a cell base 31 and has an entrance plane 21a, 22a and an exit plane 21b, 22b that is not parallel to the entrance plane 21a, 22a; and a lens drive mechanism 25 that can rotate the lens 21, 22 for adjusting the optical axis so that the angle at which the parallel light beam enters into the entrance plane 21a, 22b can be changed, wherein a detecting surface 52b for adjusting the optical axis is formed on a photodetector 52.
    Type: Grant
    Filed: December 17, 2014
    Date of Patent: August 30, 2016
    Assignee: SHIMADZU CORPORATION
    Inventor: Shinichiro Totoki
  • Publication number: 20160178500
    Abstract: In order for a parallel light beam to enable formation of an image at the center of a photodetector 52 without the use of an actuator for the adjustment by an order of micrometers, a particle size distribution measuring apparatus 1 is provided with: a control unit 70 for calculating the distribution of particle size; a lens 21, 22 which is located between a light source unit 40 and a cell base 31 and has an entrance plane 21a, 22a and an exit plane 21b, 22b that is not parallel to the entrance plane 21a, 22a; and a lens drive mechanism 25 that can rotate the lens 21, 22 for adjusting the optical axis so that the angle at which the parallel light beam enters into the entrance plane 21a, 22b can be changed, wherein a detecting surface 52b for adjusting the optical axis is formed on a photodetector 52.
    Type: Application
    Filed: December 17, 2014
    Publication date: June 23, 2016
    Applicant: SHIMADZU CORPORATION
    Inventor: Shinichiro Totoki
  • Patent number: 8313628
    Abstract: A distribution of AC electric field regularly arranged in a cell is formed while storing a sample having particles dispersed in a medium in the cell, whereby the particles are dielectrically migrated in the medium to generate a diffraction grating by density distribution of the particles. Diffracted light generated by irradiating the diffraction grating by density distribution with measuring light is detected, and evaluation of dielectrophoretic intensities of the particles and/or the medium is performed from the detection result. According to this method, evaluation of dielectrophoretic characteristics can be performed without adhering a phosphor to particles, and since even a particle small in size can achieve a detection level by collecting a number of such particles to form a diffraction grating, dielectric characteristics of microparticles of several nanometers in diameter can be thus quantitatively measured with high sensitivity.
    Type: Grant
    Filed: July 19, 2006
    Date of Patent: November 20, 2012
    Assignee: Shimadzu Corporation
    Inventors: Yoshio Tsunazawa, Yukihisa Wada, Naoji Moriya, Kenji Takubo, Shinichiro Totoki, Haruo Shimaoka
  • Patent number: 7911610
    Abstract: The present invention relates to an optical measuring device which includes container for storing a sample, and an electrode pair for generating an electric field distribution upon impression of a voltage by an electrical power supply, thereby generating or extinguishing diffraction grating formed by a density modulation of particles within the sample. The particles within the sample are evaluated based upon a temporal change of an intensity of a diffracted light beam obtained by irradiating a light beam upon the diffraction grating formed by the density modulation of the particles. The electrodes constituting the electrode pair are configured to have a comb-like electrode teeth that are parallel with each other and are arranged such that the electrode teeth of one electrode are inserted between the electrode teeth of the other electrode. From such configuration, an optical measuring device of a high sensitivity and excellent S/N ratio can be obtained.
    Type: Grant
    Filed: January 17, 2006
    Date of Patent: March 22, 2011
    Assignee: Shimadzu Corporation
    Inventors: Naoji Moriya, Yuzo Nagumo, Yukihisa Wada, Naofumi Sakauchi, Fujio Inoue, Masahiro Takebe, Kenji Takubo, Shinichiro Totoki
  • Publication number: 20100012496
    Abstract: A distribution of AC electric field regularly arranged in a cell is formed while storing a sample having particles dispersed in a medium in the cell, whereby the particles are dielectrically migrated in the medium to generate a diffraction grating by density distribution of the particles. Diffracted light generated by irradiating the diffraction grating by density distribution with measuring light is detected, and evaluation of dielectrophoretic intensities of the particles and/or the medium is performed from the detection result. According to this method, evaluation of dielectrophoretic characteristics can be performed without adhering a phosphor to particles, and since even a particle small in size can achieve a detection level by collecting a number of such particles to form a diffraction grating, dielectric characteristics of microparticles of several nanometers in diameter can be thus quantitatively measured with high sensitivity.
    Type: Application
    Filed: July 19, 2006
    Publication date: January 21, 2010
    Inventors: Yoshio Tsunazawa, Yukihisa Wada, Naoji Moriya, Kenji Takubo, Shinichiro Totoki, Haruo Shimaoka
  • Publication number: 20090251695
    Abstract: Within a container 1 which is storing a sample is generated a regularly arranged electric field distribution by an impression of a voltage upon an electrode pair 2 provided within the container 1, thereby generating diffraction grating formed by a density modulation of particles within the sample within the container 1, there is obtained information upon a diffusion of the particles based upon a temporal change in an extinction process of an intensity of a diffracted light beam obtained by irradiating a light beam upon the diffraction grating formed by the density modulation of the particles, the electrodes 21, 22 constituting the electrode pair 2 are configured to have multiple linear electrode teeth 21a, 22a parallel with each other, the electrodes 21, 22 are arranged such that the electrode teeth 21a of one electrode 21 are inserted between the electrode teeth 22a of the other electrode 22, thereby increasing the width of the diffraction grating formed by the density modulation of the particles, and a rati
    Type: Application
    Filed: January 17, 2006
    Publication date: October 8, 2009
    Inventors: Naoji Moriya, Yuzo Nagumo, Yukihisa Wada, Naofumi Sakauchi, Fujio Inoue, Masahiro Takebe, Kenji Takubo, Shinichiro Totoki
  • Publication number: 20080192252
    Abstract: The invention provides an optical measuring device capable of performing measuring using a transient diffraction grating by only adjusting probe light, and a nanoparticle measuring device using the same principle as the optical measuring device.
    Type: Application
    Filed: July 15, 2005
    Publication date: August 14, 2008
    Applicant: SHIMADZU CORPORATION
    Inventors: Naoji Moriya, Shinichiro Totoki, Yuzo Nagumo, Yukihisa Wada, Naofumi Sakauchi, Fujio Inoue, Masahiro Takebe, Makiko Masutomi
  • Patent number: 7248363
    Abstract: A laser diffraction particle size analyzer irradiates a laser beam on particles in a scattered state, and measures a spatial intensity distribution of diffracted and scattered light from the particles. A particle size distribution of the particles is calculated from a result of the measurement. The laser diffraction particle size analyzer includes a laser device for generating an ultraviolet laser beam as a light source for generating a laser beam, and a fluorescent member closely attached to or disposed adjacent to a detecting surface of a photodiode array that measures the spatial intensity distribution of the diffracted and scattered light upon incidence thereof.
    Type: Grant
    Filed: September 27, 2004
    Date of Patent: July 24, 2007
    Assignee: Shimadzu Corporation
    Inventor: Shinichiro Totoki
  • Patent number: 7208030
    Abstract: An apparatus analyzes components of particulate materials suspended in air. The apparatus includes a container into which the air is introduced, a discharging electrode arranged in the container to electrically charge the particulate materials contained in the air, a dust collecting electrode arranged in the container to collect charged particulate materials utilizing electric potential difference, and a device for separating volatile components contained in the particulate materials collected on the dust collecting electrode. A gas analyzer is connected to the container into which the volatile components of the particulate materials separated in the container are introduced, to analyze the volatile components.
    Type: Grant
    Filed: September 9, 2005
    Date of Patent: April 24, 2007
    Assignee: Shimadzu Corporation
    Inventor: Shinichiro Totoki
  • Publication number: 20070019195
    Abstract: A particle size distribution measuring device detects, at a detecting portion, the spatial intensity distribution of diffracted light and scattered light produced by irradiating a sample including a group of particles, with laser light. The measuring device calculates the particle size distribution of the group of the particles using the detected results and has an irradiated area transfer device that allows an irradiated area of the laser light relative to the sample, to be displaced in at least one direction perpendicular to the direction the laser light advanced toward the sample (viz., either one-dimensionally or two-dimensionally), while the sample and detecting portion respectively remain fixed in stationary positions.
    Type: Application
    Filed: June 6, 2006
    Publication date: January 25, 2007
    Applicant: SHIMADZU CORPORATION
    Inventor: Shinichiro Totoki
  • Patent number: 7041153
    Abstract: In a method of measuring particles floating in an atmosphere, the atmosphere containing the particles is sucked into a container, ions are generated from a discharge electrode disposed in the container to charge the particles with the ions. A dust-collecting electrode is arranged in the container to electrically conduct with a ground potential, wherein the dust collecting electrode is formed of a transparent plate having a transparent conductive film on a surface thereof facing the discharge electrode. The charged particles are collected on the dust-collecting electrode disposed in the container by using a potential difference relative to the discharge electrode, and the particles on the dust-collecting electrode are measured.
    Type: Grant
    Filed: February 3, 2005
    Date of Patent: May 9, 2006
    Assignee: Shimadzu Corporation
    Inventor: Shinichiro Totoki
  • Publication number: 20060081127
    Abstract: An apparatus analyzes components of particulate materials suspended in air. The apparatus includes a container into which the air is introduced, a discharging electrode arranged in the container to electrically charge the particulate materials contained in the air, a dust collecting electrode arranged in the container to collect charged particulate materials utilizing electric potential difference, and a device for separating volatile components contained in the particulate materials collected on the dust collecting electrode. A gas analyzer is connected to the container into which the volatile components of the particulate materials separated in the container are introduced, to analyze the volatile components.
    Type: Application
    Filed: September 9, 2005
    Publication date: April 20, 2006
    Applicant: SHIMADZU CORPORATION
    Inventor: Shinichiro Totoki
  • Patent number: 6923848
    Abstract: A collecting device for collecting particles floating in the atmosphere includes a collecting container; a pump for sucking the atmosphere into the collecting container; a discharge electrode disposed in the collecting container for generating single polarity ions to charge the particles in the collecting container; and a dust-collecting electrode for collecting the charged particles in the collecting container through a potential difference between the discharge electrode and the dust-collecting electrode. The dust on the dust-collecting electrode is measured and analyzed.
    Type: Grant
    Filed: July 2, 2004
    Date of Patent: August 2, 2005
    Assignee: Shimadzu Corporation
    Inventor: Shinichiro Totoki
  • Publication number: 20050126260
    Abstract: In a method of measuring particles floating in an atmosphere, the atmosphere containing the particles is sucked into a container, ions are generated from a discharge electrode disposed in the container to charge the particles with the ions. A dust-collecting electrode is arranged in the container to electrically conduct with a ground potential, wherein the dust collecting electrode is formed of a transparent plate having a transparent conductive film on a surface thereof facing the discharge electrode. The charged particles are collected on the dust-collecting electrode disposed in the container by using a potential difference relative to the discharge electrode, and the particles on the dust-collecting electrode are measured.
    Type: Application
    Filed: February 3, 2005
    Publication date: June 16, 2005
    Applicant: SHIMADZU CORPORATION
    Inventor: Shinichiro Totoki
  • Patent number: 6904787
    Abstract: Particulate collector is carried onto airplane and collects suspended particulate matter in the atmospheric air in such a manner that suspended particulate matter is electrically charged by single-pole ions generated by a discharge electrode and the thus electrically charged particulates are attracted to a collecting electrode having an electric potential difference with respect to the discharge electrode so that the particulates are collected by the collecting electrode. The particulate collector is conveyed to an arbitrary altitude and driven so as to collect suspended particulate matter contained in the atmospheric air at the arbitrary altitude. Particulate collector is recovered onto the ground so as to make various measurements or the thus collected particulate collector is subjected to various measurements on airplane.
    Type: Grant
    Filed: April 8, 2003
    Date of Patent: June 14, 2005
    Assignee: Shimadzu Corporation
    Inventor: Shinichiro Totoki
  • Publication number: 20050083524
    Abstract: A laser diffraction particle size analyzer irradiates a laser beam on particles in a scattered state, and measures a spatial intensity distribution of diffracted and scattered light from the particles. A particle size distribution of the particles is calculated from a result of the measurement. The laser diffraction particle size analyzer includes a laser device for generating an ultraviolet laser beam as a light source for generating a laser beam, and a fluorescent member closely attached to or disposed adjacent to a detecting surface of a photodiode array that measures the spatial intensity distribution of the diffracted and scattered light upon incidence thereof.
    Type: Application
    Filed: September 27, 2004
    Publication date: April 21, 2005
    Inventor: Shinichiro Totoki
  • Patent number: 6881246
    Abstract: A collecting device for collecting suspended particles includes a mobility analysis device; a collecting container connected to an outlet of the mobility analysis device; a discharge electrode disposed inside the collecting container for charging the particles inside the collecting container by generating single polar ions; and a collecting electrode for collecting the charged particles inside the collecting container by an electric potential difference relative to the discharge electrode. In the mobility analysis device, the particles are charged and guided into a flow path. An electric field is created in the flow path, and the particles are guided into the path perpendicular to the electric field. Since a mobility of a particle in an electric field depends on a size of the particle, the particles guided in the path are separated according to the electric field, thereby obtaining particles with sizes in a specific range.
    Type: Grant
    Filed: April 3, 2003
    Date of Patent: April 19, 2005
    Assignee: Shimadzu Corporation
    Inventor: Shinichiro Totoki
  • Publication number: 20040231439
    Abstract: A collecting device for collecting particles floating in the atmosphere includes a collecting container; a pump for sucking the atmosphere into the collecting container; a discharge electrode disposed in the collecting container for generating single polarity ions to charge the particles in the collecting container; and a dust-collecting electrode for collecting the charged particles in the collecting container through a potential difference between the discharge electrode and the dust-collecting electrode. The dust on the dust-collecting electrode is measured and analyzed.
    Type: Application
    Filed: July 2, 2004
    Publication date: November 25, 2004
    Inventor: Shinichiro Totoki
  • Patent number: 6807874
    Abstract: A collecting device for collecting particles floating in the atmosphere includes a collecting container; a pump for sucking the atmosphere into the collecting container; a discharge electrode disposed in the collecting container for generating single polarity ions to charge the particles in the collecting container; and a dust-collecting electrode for collecting the charged particles in the collecting container through a potential difference between the discharge electrode and the dust-collecting electrode. The dust on the dust-collecting electrode is measured and analyzed.
    Type: Grant
    Filed: December 19, 2002
    Date of Patent: October 26, 2004
    Assignee: Shimadzu Corporation
    Inventor: Shinichiro Totoki
  • Patent number: 6674528
    Abstract: Suspended particulate matter in the atmospheric air is sucked into a container by a pump. The suspended particulate matter in the atmospheric air in the container is electrically charged so as to electrically collect it. The collected suspended particulate matter is irradiated with laser beams under the condition that the collected suspended particulate matter is dispersed at an appropriate concentration. A spatial intensity distribution of diffracted and scattered light obtained by irradiating laser beams to the suspended particulate matter is measured. A particle size distribution of the suspended particulate matter P is found from the result of measurement.
    Type: Grant
    Filed: July 16, 2002
    Date of Patent: January 6, 2004
    Assignee: Shimadzu Corporation
    Inventors: Motoaki Adachi, Kikuo Okuyama, Shinichiro Totoki, Michio Higuchi, Haruo Shimaoka, Akihiro Fukai