Patents by Inventor Shinichirou Hanawa

Shinichirou Hanawa has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20170017711
    Abstract: An object of the present invention is to perform a development work of an information asset with high efficiency. Provided is an information asset management system including a processor that executes a program, and a memory, and generating a new information asset based on a specified information asset. The information asset management system includes: an asset association storage part that stores therein asset association information obtained by associating the information asset with a process of generating a new information asset from the information asset and managing the new information asset; a process identification part that identifies the process to be executed for the specified information asset based on the asset association information; and an asset generation part that generates the new information asset from the specified information asset based on the identified process.
    Type: Application
    Filed: April 28, 2016
    Publication date: January 19, 2017
    Inventors: Shinichirou HANAWA, Akira KAMEI, Ryuji NII, Ryouji KUGITA, Sayo HORITA
  • Patent number: 8515569
    Abstract: The content of an operating instruction to each worker in a manufacturing process is controlled in the following way based on a manufacturing direction to the worker and on manufacturing achievement, work proficiency, and the like of the worker for the manufacturing direction. A deviation between a manufacturing direction and manufacturing achievement is calculated. Manufacturing direction parameters acting as factors of the calculated deviation are specified for each product to be manufactured. The above information is stored in a deviation factor database. For a new manufacturing direction, manufacturing direction parameters therein are checked against the deviation factor database to determine alarm information to be given to a worker on a manufacturing line, and the determined alarm information is outputted.
    Type: Grant
    Filed: May 26, 2010
    Date of Patent: August 20, 2013
    Assignee: Hitachi, Ltd.
    Inventors: Shinichirou Hanawa, Hitomi Arai
  • Publication number: 20120239179
    Abstract: The content of an operating instruction to each worker in a manufacturing process is controlled in the following way based on a manufacturing direction to the worker and on manufacturing achievement, work proficiency, and the like of the worker for the manufacturing direction. A deviation between a manufacturing direction and manufacturing achievement is calculated. Manufacturing direction parameters acting as factors of the calculated deviation are specified for each product to be manufactured. The above information is stored in a deviation factor database. For a new manufacturing direction, manufacturing direction parameters therein are checked against the deviation factor database to determine alarm information to be given to a worker on a manufacturing line, and the determined alarm information is outputted.
    Type: Application
    Filed: May 26, 2010
    Publication date: September 20, 2012
    Inventors: Shinichirou Hanawa, Hitomi Arai
  • Patent number: 8000819
    Abstract: A manufacturing instruction evaluation support system includes a data reading part that reads a manufacturing instruction parameter group and manufacturing performance data corresponding thereto, a parameter sorting part that calculates a risk rate for each manufacturing instruction parameter configuring the manufacturing instruction parameter group and an average value of risk rates among the manufacturing instruction parameters to identify as available choices the manufacturing instruction parameters having the risk rates no greater than the average value, a parameter identifying part that calculates an explanatory variable selection reference value for the manufacturing instruction parameter group and the manufacturing instruction parameters of the available choices with the multiple regression analysis program to identify the manufacturing instruction parameter group or the manufacturing instruction parameters of the available choices having the greater calculated explanatory variable selection reference
    Type: Grant
    Filed: February 25, 2009
    Date of Patent: August 16, 2011
    Assignee: Hitachi, Ltd.
    Inventors: Shinichirou Hanawa, Isao Nakamura, Akiko Tadokoro, Atsunori Hotehama, Yukiko Yamamoto, Haruo Umeki, Akihiro Kondo, Youichi Hamamoto, Kouichi Hiraoka
  • Publication number: 20110071955
    Abstract: A transportation schedule planning support system receives an order of one or more types of products which requires a use-by date control, and transports the products from one or more stock-carrying bases to one or more delivery destinations. In the system, a user previously registers a transportation route candidate from a stock-carrying base to each delivery destination adoptable as a solution, as a base group. A necessary use-by date for a product to be delivered next is determined based on an actual delivery to each delivery destination. The number of vehicles allocatable to a transportation at each base according to a vehicle type, and a vehicle type not used in each base group are added to a restriction condition. A mixed integer programming is applied using an expected obtainable profit obtained by delivering each product as an objective function.
    Type: Application
    Filed: March 18, 2010
    Publication date: March 24, 2011
    Inventors: Isao Nakamura, Jun Tateishi, Katsunari Ikezawa, Takeshi Kurata, Yasuhiro Nemoto, Shinichirou Hanawa
  • Publication number: 20090292384
    Abstract: A manufacturing instruction evaluation support system includes a data reading part that reads a manufacturing instruction parameter group and manufacturing performance data corresponding thereto, a parameter sorting part that calculates a risk rate for each manufacturing instruction parameter configuring the manufacturing instruction parameter group and an average value of risk rates among the manufacturing instruction parameters to identify as available choices the manufacturing instruction parameters having the risk rates no greater than the average value, a parameter identifying part that calculates an explanatory variable selection reference value for the manufacturing instruction parameter group and the manufacturing instruction parameters of the available choices with the multiple regression analysis program to identify the manufacturing instruction parameter group or the manufacturing instruction parameters of the available choices having the greater calculated explanatory variable selection reference
    Type: Application
    Filed: February 25, 2009
    Publication date: November 26, 2009
    Inventors: Shinichirou Hanawa, Isao Nakamura, Akiko Tadokoro, Atsunori Hotehama, Yukiko Yamamoto, Haruo Umeki, Akihiro Kondo, Youichi Hamamoto, Kouichi Hiraoka