Patents by Inventor Shinji Badono

Shinji Badono has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20170184522
    Abstract: A stability evaluation test device includes: an operation/test control unit that sets an SOC of a test electric storage device to an established value, and sets an SOC of a thermal standard electric storage device to a value lower than that of the SOC of the test electric storage device; a test data collection unit that measures a temperature of the test electric storage device and the thermal standard electric storage device; and an evaluation and analysis unit that calculates respective self-generated heat amounts of the test electric storage device and the thermal standard electric storage device on the basis of the temperatures of the electric storage devices, and evaluates the stability of the test electric storage device on the basis of a ratio of the self-generated heat amounts of the test electric storage device and of the thermal standard electric storage device.
    Type: Application
    Filed: September 3, 2014
    Publication date: June 29, 2017
    Applicant: Mitsubishi Electric Corporation
    Inventors: Makiko KISE, Shinji BADONO, Shoji YOSHIOKA
  • Patent number: 7619326
    Abstract: A satellite equipment panel on which may be mounted an installation equipment of a predetermined function, connectable by an interface, constitutes an artificial satellite. The satellite equipment panel includes a panel body, at least two interfaces for an interconnection to another satellite equipment panel, a line transfer switch disposed within the panel body for line transferring of the interconnection between the interfaces, wiring disposed within the panel body and connected at one end to one of the interfaces and at the other end to the line transfer switch for interconnecting the interfaces on that panel body. The interfaces and the wiring, in cooperation with a support structure, constitute a wiring module disposed within the panel body. The interface may comprise at least one of interfaces of electric communication, optical communication, and optical sensor.
    Type: Grant
    Filed: September 25, 2006
    Date of Patent: November 17, 2009
    Assignee: Mitsubishi Electric Corporation
    Inventors: Hajime Takeya, Tsuyoshi Ozaki, Hirotsugu Morinaga, Shinji Badono
  • Publication number: 20070221786
    Abstract: A satellite equipment panel on which may be mounted an installation equipment of a predetermined function, connectable by an interface, constitutes an artificial satellite. The satellite equipment panel includes a panel body, at least two interfaces for an interconnection to another satellite equipment panel, a line transfer switch disposed within the panel body for line transferring of the interconnection between the interfaces, a wiring disposed within the panel body and connected at one end to one of the interfaces and at the other end to the line transfer switch for interconnecting the interfaces on that panel body. The interfaces and the wiring, in cooperation with a support structure, constitute a wiring module disposed within the panel body. The interface may comprise at least one of interfaces of electric communication, optical communication, and optical sensor.
    Type: Application
    Filed: September 25, 2006
    Publication date: September 27, 2007
    Applicant: MITSUBISHI ELECTRIC CORPORATION
    Inventors: Hajime TAKEYA, Tsuyoshi OZAKI, Hirotsugu MORINAGA, Shinji BADONO
  • Patent number: 4885759
    Abstract: A measuring apparatus for measuring a physical property of a substance using radiation has a source of radiation for irradiating the substance, a radiation detector which is disposed on the opposite side of the substance from the radiation source, a mask for allowing radiaton to enter the radiation detector only along n prescribed pathways, and a signal processing and calculating device for calculating the physical property of the substance based on the radiation which is incident upon the radiation detector. The mask has n different mask patterns each comprising a plurality of pattern elements which allow the passage of radiation and which can be positioned between the substance and the radiation detector in alignment with the radiation pathways.
    Type: Grant
    Filed: November 24, 1987
    Date of Patent: December 5, 1989
    Assignees: Mitsubishi Denki Kabushiki Kaisha, Petro-Canada, Inc.
    Inventors: Toshimasa Tomoda, Shinji Badono, Masaki Komaru
  • Patent number: 4817122
    Abstract: An apparatus for determining the mass of each of the constituents of a substance to be measured, per unit volume of the same, is disclosed. The apparatus includes a detector disposed at the position to receive energy of back scattered photons produced by a radiation directed on a substance to be measured and systems of measurement, which are smaller in number by one than the kinds of the constituents under investigation, and the signal from the detector is processed for measuring intensity of the energy components unique to each of the constituents.
    Type: Grant
    Filed: February 21, 1986
    Date of Patent: March 28, 1989
    Assignee: Mitsubishi Denki Kabushiki Kaisha
    Inventors: Shinji Badono, Masaki Komaru, Toshimasa Tomoda
  • Patent number: 4788852
    Abstract: The gas and water content of crude oil flowing through a pipeline is measured using a flow restriction in the pipeline, a radioactive source for providing separate radiation energies for each component to be measured, a detector for detecting the radiation transmitted by the various components to generate a first set of signals, pressure gauges upstream of and in the flow restriction for providing a second set of signals, and a signal processor for correlating the signals to provide mass flowrate values indicative of the relative proportions of the components of the mixture. The temperature of the mixture in the flow restriction can also be measured and fed to the signal processor for ensuring that accurate values of flowrate are obtained when temperatures vary.
    Type: Grant
    Filed: November 28, 1986
    Date of Patent: December 6, 1988
    Assignees: Petro-Canada Inc., Mitsubishi Electric Corp.
    Inventors: Wallace W. Martin, Douglas I. Exall, Toshimasa Tomoda, Shinji Badono
  • Patent number: 4785409
    Abstract: A loop is constructed in which an output of a two-dimensional integrator is fed back through an exponential function unit for each pixel of a picture signal, a difference between the output and an input picture signal of the corresponding pixel of a next frame is taken and the difference is input to the corresponding element of the two-dimensional integrator, whereby relative standard deviations of quantum noise of an output picture are made constant at all positions of a screen.
    Type: Grant
    Filed: January 28, 1986
    Date of Patent: November 15, 1988
    Assignee: Mitsubishi Denki Kabushiki Kaisha
    Inventors: Shinji Badono, Toshimasa Tomoda
  • Patent number: 4618969
    Abstract: The invention is concerned with a digital ratemeter comprising a count difference circuit for adding input pulse signals and subtracting the frequency of the divider pulse, an integrator for integrating positive or negative count values from the count difference circuit, a feedback unit for receiving an integral count value from the integrator as input, thus generating a divider pulse frequency, and performing exponential transformation of the divider pulse frequency, whereby the integral count value is a count rate output and a fixed measurement accuracy in the overall range is attained.
    Type: Grant
    Filed: March 26, 1985
    Date of Patent: October 21, 1986
    Assignee: Mitsubishi Denki Kabushiki Kaisha
    Inventors: Shinji Badono, Yoshikazu Tsutaka
  • Patent number: 4037099
    Abstract: A fluorescent X-ray sulfur analyzer is disclosed and includes a radiation source for irradiating a sample with X-rays or .gamma.-rays, a radiation detector for detecting the radiation generated from the sample irradiated by the X-rays or .gamma.-rays and a first analyzer for selecting only fluorescent X-ray pulses from the output of the detector. The analyzer further includes a first pulse rate measuring device for measuring the pulse rate of the pulses selected by the first analyzer, a second analyzer for selecting only pulses of compton scattered rays from the output of the detector and a second pulse rate measuring device for measuring the pulse rate of the pulses selected by the second analyzer. An operational circuit is provided for operating the outputs of the first and second pulse rate measuring devices and is calibrated to compensate for the error caused by the variation of the carbon-hydrogen ratio to realize an accurate weight content of the sulfur in the sample.
    Type: Grant
    Filed: November 13, 1975
    Date of Patent: July 19, 1977
    Assignee: Mitsubishi Denki Kabushiki Kaisha
    Inventors: Minoru Oda, Shinji Badono