Patents by Inventor Shinji Enoshima

Shinji Enoshima has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method of testing semiconductor device and test apparatus for the same
    Patent number: 5578919
    Abstract: A tape carrier includes an elongated electrically insulating tape divided into a plurality of separable tape sections. A semiconductor chip is mounted at each of a plurality of semiconductor device mounting portions having a plurality of leads on each of the tape sections. The semiconductor chips are connected to the respective leads. A plurality of testing connection terminals on each of the tape sections are connected to respective testing connection terminals by testing wires.
    Type: Grant
    Filed: March 20, 1995
    Date of Patent: November 26, 1996
    Assignee: Mitsubishi Denki Kabushiki Kaisha
    Inventors: Shinji Semba, Shinji Enoshima, Kunio Kobayashi, Isamu Yamamoto
  • Tape carrier, and test apparatus for the same
    Patent number: 5517036
    Abstract: A tape carrier includes an elongated electrically insulating tape divided into a plurality of separable tape sections. A semiconductor chip is mounted at each of a plurality of semiconductor device mounting portions having a plurality of leads on each of the tape sections. The semiconductor chips are connected to the respective leads. A plurality of testing connection terminals on each of the tape sections are connected to respective testing connection terminals by testing wires.
    Type: Grant
    Filed: April 20, 1995
    Date of Patent: May 14, 1996
    Assignee: Mitsubishi Denki Kabushiki Kaisha
    Inventors: Shinji Semba, Shinji Enoshima, Kunio Kobayashi, Isamu Yamamoto