Patents by Inventor Shinji Homma

Shinji Homma has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8787134
    Abstract: In a method and an apparatus for inspecting a thermally assisted magnetic recording head element, a specimen is mounted on a table movable in a plane of a scanning probe microscope device, evanescent light is generated from a portion of light emission of evanescent light of the specimen, scattered light of the evanescent light is detected by moving the table in the plane while a cantilever of the scanning probe microscope having a probe is vertically vibrated in the vicinity of a surface of the specimen, and an intensity distribution of the evanescent light emitted from the portion of light emission of evanescent light or a surface profile of the portion of light emission of evanescent light of the specimen is inspected using position information of generation of the evanescent light based on the detected scattered light.
    Type: Grant
    Filed: June 4, 2013
    Date of Patent: July 22, 2014
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Kaifeng Zhang, Takenori Hirose, Masahiro Watanabe, Shinji Homma, Tsuneo Nakagomi, Teruaki Tokutomi, Toshihiko Nakata, Takehiro Tachizaki
  • Publication number: 20130265863
    Abstract: In a method and an apparatus for inspecting a thermally assisted magnetic recording head element, a specimen is mounted on a table movable in a plane of a scanning probe microscope device, evanescent light is generated from a portion of light emission of evanescent light of the specimen, scattered light of the evanescent light is detected by moving the table in the plane while a cantilever of the scanning probe microscope having a probe is vertically vibrated in the vicinity of a surface of the specimen, and an intensity distribution of the evanescent light emitted from the portion of light emission of evanescent light or a surface profile of the portion of light emission of evanescent light of the specimen is inspected using position information of generation of the evanescent light based on the detected scattered light.
    Type: Application
    Filed: June 4, 2013
    Publication date: October 10, 2013
    Inventors: Kaifeng Zhang, Takenori Hirose, Masahiro Watanabe, Shinji Homma, Tsuneo Nakagomi, Teruaki Tokutomi, Toshihiko Nakata, Takehiro Tachizaki
  • Patent number: 8483035
    Abstract: In a method and an apparatus for inspecting a thermally assisted magnetic recording head element, a specimen is mounted on a table movable in a plane of a scanning probe microscope device, evanescent light is generated from a portion of light emission of evanescent light of the specimen, scattered light of the evanescent light is detected by moving the table in the plane while a cantilever of the scanning probe microscope having a probe is vertically vibrated in the vicinity of a surface of the specimen, and an intensity distribution of the evanescent light emitted from the portion of light emission of evanescent light or a surface profile of the portion of light emission of evanescent light of the specimen is inspected using position information of generation of the evanescent light based on the detected scattered light.
    Type: Grant
    Filed: May 29, 2012
    Date of Patent: July 9, 2013
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Kaifeng Zhang, Takenori Hirose, Masahiro Watanabe, Shinji Homma, Tsuneo Nakagomi, Teruaki Tokutomi, Toshihiko Nakata, Takehiro Tachizaki
  • Publication number: 20120307605
    Abstract: In a method and an apparatus for inspecting a thermally assisted magnetic recording head element, a specimen is mounted on a table movable in a plane of a scanning probe microscope device, evanescent light is generated from a portion of light emission of evanescent light of the specimen, scattered light of the evanescent light is detected by moving the table in the plane while a cantilever of the scanning probe microscope having a probe is vertically vibrated in the vicinity of a surface of the specimen, and an intensity distribution of the evanescent light emitted from the portion of light emission of evanescent light or a surface profile of the portion of light emission of evanescent light of the specimen is inspected using position information of generation of the evanescent light based on the detected scattered light.
    Type: Application
    Filed: May 29, 2012
    Publication date: December 6, 2012
    Applicant: Hitachi High-Technologies Corporation
    Inventors: Kaifeng Zhang, Takenori Hirose, Masahiro Watanabe, Shinji Homma, Tsuneo Nakagomi, Teruaki Tokutomi, Toshihiko Nakata, Takehiro Tachizaki
  • Patent number: 8000047
    Abstract: The present invention provides a technique for converting burst data to digital data, applying FFT operation to 2n (n is an integer) pieces of digital data in response to any start signal synchronized with a sector signal, applying a window function centered around data corresponding to a frequency of a burst data signal component before the FFT operation, and performing head positioning based on a result as the detected value of the burst data.
    Type: Grant
    Filed: July 16, 2009
    Date of Patent: August 16, 2011
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Masayoshi Takahashi, Masami Makuuchi, Shinji Homma, Yoshihiro Sakurai
  • Patent number: 7817362
    Abstract: An inspection apparatus and method are disclosed for inspecting a magnetic disk or a magnetic head. A first reference signal generating source generates reference signals of a controllable oscillating frequency, and a signal switching means selects either a reference signal or test data reproduced by the magnetic head. Factors such as offsets and gain differentials among signal distribution paths, phase shifts of sampling clocks supplied to a plurality of AID converters, and frequency-dependence of the transfer function and phase response of signal paths are identified so that errors due to these factors can be detected. Based on the detected values of these factors and errors, reference signals are utilized to compensate test data errors.
    Type: Grant
    Filed: January 21, 2003
    Date of Patent: October 19, 2010
    Inventors: Masayoshi Takahashi, Ritsuro Orihashi, Wen Li, Shinji Homma
  • Publication number: 20100033862
    Abstract: The present invention provides a technique for converting burst data to digital data, applying FFT operation to 2n (n is an integer) pieces of digital data in response to any start signal synchronized with a sector signal, applying a window function centered around data corresponding to a frequency of a burst data signal component before the FFT operation, and performing head positioning based on a result as the detected value of the burst data.
    Type: Application
    Filed: July 16, 2009
    Publication date: February 11, 2010
    Inventors: Masayoshi TAKAHASHI, Masami Makuuchi, Shinji Homma, Yoshihiro Sakurai
  • Patent number: 7276900
    Abstract: A magnetic characteristic inspecting apparatus including a plurality of disk rotating devices or a plurality of magnetic heads include a unit for switching output signals of write signal production units or allocating the output signals to the magnetic heads, a unit for switching signals read from the magnetic heads or allocating the read signals to measurement resources, and a unit for selecting any of the disk rotating devices synchronously with which the measurement resources will perform measurement. The write signal production units and measurement resources are shared among inspections of the plurality of disk rotating devices or the plurality of heads.
    Type: Grant
    Filed: November 15, 2005
    Date of Patent: October 2, 2007
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Masayoshi Takahashi, Masami Makuuchi, Ritsuro Orihashi, Shinji Homma
  • Publication number: 20060132122
    Abstract: A magnetic characteristic inspecting apparatus including a plurality of disk rotating devices or a plurality of magnetic heads include a unit for switching output signals of write signal production units or allocating the output signals to the magnetic heads, a unit for switching signals read from the magnetic heads or allocating the read signals to measurement resources, and a unit for selecting any of the disk rotating devices synchronously with which the measurement resources will perform measurement. The write signal production units and measurement resources are shared among inspections of the plurality of disk rotating devices or the plurality of heads.
    Type: Application
    Filed: November 15, 2005
    Publication date: June 22, 2006
    Inventors: Masayoshi Takahashi, Masami Makuuchi, Ritsuro Orihashi, Shinji Homma
  • Patent number: 6894489
    Abstract: A testing apparatus of a magnetic recording medium for conducting a test on the magnetic recording medium by using reproduced data obtained through reproduction of the magnetic medium, including a plurality of conversion means for converting the reproduced data into digital data, holding means for holding the digital data converted by the plurality of conversion means, data processing means for performing a calculation process on the digital data held by the holding means in relation to a magnetic characteristic of the magnetic recording medium, and analysis processing means for performing an analysis to determine whether or not information obtained by the data processing means satisfies a certain condition.
    Type: Grant
    Filed: December 16, 2003
    Date of Patent: May 17, 2005
    Assignees: Hitachi, Ltd., Hitachi High-Tech Electronics Engineering Co., Ltd.
    Inventors: Masami Makuuchi, Ritsurou Orihashi, Norio Chujo, Masayoshi Takahashi, Yoshihiko Hayashi, Shinji Homma
  • Publication number: 20040124832
    Abstract: A testing apparatus of a magnetic recording medium for conducting a test on the magnetic recording medium by using reproduced data obtained through reproduction of the magnetic medium, including a plurality of conversion means for converting the reproduced data into digital data, holding means for holding the digital data converted by the plurality of conversion means, data processing means for performing a calculation process on the digital data held by the holding means in relation to a magnetic characteristic of the magnetic recording medium, and analysis processing means for performing an analysis to determine whether or not information obtained by the data processing means satisfies a certain condition.
    Type: Application
    Filed: December 16, 2003
    Publication date: July 1, 2004
    Inventors: Masami Makuuchi, Ritsurou Orihashi, Norio Chujo, Masayoshi Takahashi, Yoshihiko Hayashi, Shinji Homma
  • Publication number: 20040078703
    Abstract: By means for detecting offsets and gain differentials among signal distribution paths, phase shifts of sampling clocks supplied to a plurality of A/D converters, and frequency-dependence of the transfer function and phase response of signal paths, errors due to these factors are detected. Based on the detected values of these factors and errors, using reference signals, test data errors are compensated.
    Type: Application
    Filed: January 21, 2003
    Publication date: April 22, 2004
    Inventors: Masayoshi Takahashi, Ritsuro Orihashi, Wen Li, Shinji Homma
  • Patent number: 6700369
    Abstract: A testing apparatus of a magnetic recording medium for conducting a test on the magnetic recording medium by using reproduced data obtained through reproduction of the magnetic medium, including a plurality of conversion means for converting the reproduced data into digital data, holding means for holding the digital data converted by the plurality of conversion means, data processing means for performing a calculation process on the digital data held by the holding means in relation to a magnetic characteristic of the magnetic recording medium, and analysis processing means for performing an analysis to determine whether or not information obtained by the data processing means satisfies a certain condition.
    Type: Grant
    Filed: November 28, 2000
    Date of Patent: March 2, 2004
    Assignees: Hitachi, Ltd., Hitachi Electronics Engineering Co., Ltd.
    Inventors: Masami Makuuchi, Ritsurou Orihashi, Norio Chujo, Masayoshi Takahashi, Yoshihiko Hayashi, Shinji Homma
  • Patent number: 5557554
    Abstract: A calibration method for protrusion detection head units including steps of selecting as a master head unit a protrusion detection head unit of which lifting characteristic is known, further selecting one of any protrusion detection head units which is used for protrusion inspection as a measurement head unit, determining a disk having a predetermined surface roughness as a reference disk, successively loading the head of the master head unit and the head of the measurement head unit on the face of the reference disk which is rotated and causing to lift the same, measuring output voltages em of the master head unit and output voltages es of the measurement head unit while varying the circumferential speed of the track on the reference disk to determine as a function respective output voltage characteristics using the circumferential speed and linear-approximating the respective output voltage characteristics on a rectangular coordinate system of output voltage-circumferential speed to determine linear equatio
    Type: Grant
    Filed: April 5, 1994
    Date of Patent: September 17, 1996
    Assignee: Hitachi Electronics Engineering Co., Ltd.
    Inventors: Hiroshi Kawaguchi, Takashi Nakakita, Shinji Homma
  • Patent number: 5488857
    Abstract: A protrusion sensor according to the present invention comprises a protrusion sensing head, a suspension spring having a front end portion fixedly mounting the protrusion sensing head and a rear end portion fixedly secured to one surface of a support arm, a carriage for supporting the support arm and a vibration sensor of piezo-electric ceramics fixedly mounted on the other surface of the support arm. A protrusion is detected by the collision of the protrusion sensing head flying by air flow on a surface of a rotary disc caused by rotation thereof with a protrusion.
    Type: Grant
    Filed: November 29, 1994
    Date of Patent: February 6, 1996
    Assignee: Hitachi Electronic Engineering Co., Ltd.
    Inventors: Shinji Homma, Kyoichi Mori, Takashi Nakakita