Patents by Inventor Shinji Mizuhata

Shinji Mizuhata has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7289233
    Abstract: Light emitted from a light source (22) is used through a light projection optical system (23) to perform coaxial down-emission lighting on a measurement target (36). Light reflected by the measurement target (36) is formed on a photo-detector (26) through an image formation optical system (24). Along its optical path, a spectroscope (25) is provided for converting an image impinging on the photo-detector (26) into a spectroscopic image having a predetermined wavelength band. A measurement point extraction portion (32) in a signal processing portion (28) determines a predeterm film thickness measurement point from an image picked up by the photo-detector (26), extracts an image signal at the film thickness measurement point, and transmits t to film thickness operation portion (33). The film thickness operation portion (33) measured film thickness of a thin film, which is the measurement target (36), from this signal.
    Type: Grant
    Filed: March 12, 2004
    Date of Patent: October 30, 2007
    Assignee: Omron Corporation
    Inventors: Masahiro Kurokawa, Takeshi Takakura, Shinji Mizuhata
  • Publication number: 20040223165
    Abstract: Light emitted from a light source 22 is used through a light projection optical system 23 to perform coaxial down-emission lighting on a measurement target 36. Light reflected by the measurement target 36 is formed on a photo-detector 26 through an image formation optical system 24. Along its optical path, a spectroscope 25 is provided for converting an image impinging on the photo-detector 26 into a spectroscopic image having a predetermined wavelength band. A measurement point extraction portion 32 in a signal processing portion 28 determines a predetermined film thickness measurement point from an image picked up by the photo-detector 26, extracts an image signal at the film thickness measurement point, and transmits t to film thickness operation portion 33. The film thickness operation portion 33 measured film thickness of a thin film, which is the measurement target 36, from this signal.
    Type: Application
    Filed: March 12, 2004
    Publication date: November 11, 2004
    Applicant: Omron Corporation
    Inventors: Masahiro Kurokawa, Takeshi Takakura, Shinji Mizuhata
  • Patent number: 5790259
    Abstract: Each of a detection sample object and a non-detection sample object is illuminated with S-polarization light, for instance. S-polarization light and P-polarization light reflected from each sample object are detected by different photodetecting elements. Glossiness values and light quantities of the detection and non-detection sample objects are judged based on detection outputs of the photodetecting elements, and a glossiness difference and a light quantity difference are calculated. An evaluation function having at least one of the glossiness and the light quantity as a variable is determined by using the glossiness difference and the light quantity difference. Thresholds for object discrimination are calculated based on evaluation function values of the detection and non-detection sample objects.
    Type: Grant
    Filed: April 5, 1996
    Date of Patent: August 4, 1998
    Assignee: Omron Corporation
    Inventors: Shinji Mizuhata, Hayami Hosokawa, Arata Nakamura, Nobuharu Ishikawa, Hiroyuki Inoue, Satoru Shimokawa, Masahiro Kurokawa, Kohei Tomita, Norimasa Yamanaka